{"id":"https://openalex.org/W4283757815","doi":"https://doi.org/10.1109/i2mtc48687.2022.9806610","title":"Simulation and Reduction of Speckle-induced Uncertainty in Laser Triangulation Sensors","display_name":"Simulation and Reduction of Speckle-induced Uncertainty in Laser Triangulation Sensors","publication_year":2022,"publication_date":"2022-05-16","ids":{"openalex":"https://openalex.org/W4283757815","doi":"https://doi.org/10.1109/i2mtc48687.2022.9806610"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc48687.2022.9806610","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc48687.2022.9806610","pdf_url":null,"source":{"id":"https://openalex.org/S4363607934","display_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048523710","display_name":"Ernst Csencsics","orcid":"https://orcid.org/0000-0002-0896-1928"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Ernst Csencsics","raw_affiliation_strings":["Technische Universitt Wien,Automation and Control Institute (ACIN),Vienna,Austria","Automation and Control Institute (ACIN), Technische Universitt Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Technische Universitt Wien,Automation and Control Institute (ACIN),Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Automation and Control Institute (ACIN), Technische Universitt Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048673060","display_name":"Johannes Schlarp","orcid":"https://orcid.org/0000-0002-1157-5462"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Johannes Schlarp","raw_affiliation_strings":["Technische Universitt Wien,Automation and Control Institute (ACIN),Vienna,Austria","Automation and Control Institute (ACIN), Technische Universitt Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Technische Universitt Wien,Automation and Control Institute (ACIN),Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Automation and Control Institute (ACIN), Technische Universitt Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021520258","display_name":"Tobias Glaser","orcid":"https://orcid.org/0000-0003-0254-7600"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Tobias Glaser","raw_affiliation_strings":["Technische Universitt Wien,Automation and Control Institute (ACIN),Vienna,Austria","Automation and Control Institute (ACIN), Technische Universitt Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Technische Universitt Wien,Automation and Control Institute (ACIN),Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Automation and Control Institute (ACIN), Technische Universitt Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080458657","display_name":"Tobias Wolf","orcid":"https://orcid.org/0000-0001-6832-2186"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Tobias Wolf","raw_affiliation_strings":["Technische Universitt Wien,Automation and Control Institute (ACIN),Vienna,Austria","Automation and Control Institute (ACIN), Technische Universitt Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Technische Universitt Wien,Automation and Control Institute (ACIN),Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Automation and Control Institute (ACIN), Technische Universitt Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085447908","display_name":"Georg Schitter","orcid":"https://orcid.org/0000-0002-8746-5892"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Georg Schitter","raw_affiliation_strings":["Technische Universitt Wien,Automation and Control Institute (ACIN),Vienna,Austria","Automation and Control Institute (ACIN), Technische Universitt Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Technische Universitt Wien,Automation and Control Institute (ACIN),Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Automation and Control Institute (ACIN), Technische Universitt Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5048523710"],"corresponding_institution_ids":["https://openalex.org/I145847075"],"apc_list":null,"apc_paid":null,"fwci":3.2436,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.92343298,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/speckle-pattern","display_name":"Speckle pattern","score":0.9470377564430237},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.7020829916000366},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.6953780055046082},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6350858807563782},{"id":"https://openalex.org/keywords/triangulation","display_name":"Triangulation","score":0.5503970980644226},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.5349290370941162},{"id":"https://openalex.org/keywords/speckle-noise","display_name":"Speckle noise","score":0.4954768419265747},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.43147704005241394},{"id":"https://openalex.org/keywords/optical-path","display_name":"Optical path","score":0.42609351873397827},{"id":"https://openalex.org/keywords/diffuser","display_name":"Diffuser (optics)","score":0.42224591970443726},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4109705090522766},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20173364877700806},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18699780106544495}],"concepts":[{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.9470377564430237},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7020829916000366},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.6953780055046082},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6350858807563782},{"id":"https://openalex.org/C135981907","wikidata":"https://www.wikidata.org/wiki/Q188056","display_name":"Triangulation","level":2,"score":0.5503970980644226},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5349290370941162},{"id":"https://openalex.org/C180940675","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle noise","level":3,"score":0.4954768419265747},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.43147704005241394},{"id":"https://openalex.org/C31872934","wikidata":"https://www.wikidata.org/wiki/Q1417028","display_name":"Optical path","level":2,"score":0.42609351873397827},{"id":"https://openalex.org/C2780565730","wikidata":"https://www.wikidata.org/wiki/Q5275430","display_name":"Diffuser (optics)","level":3,"score":0.42224591970443726},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4109705090522766},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20173364877700806},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18699780106544495},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C2982854487","wikidata":"https://www.wikidata.org/wiki/Q9128","display_name":"Light source","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc48687.2022.9806610","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc48687.2022.9806610","pdf_url":null,"source":{"id":"https://openalex.org/S4363607934","display_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1551071722","https://openalex.org/W1889821550","https://openalex.org/W1969883785","https://openalex.org/W2043339279","https://openalex.org/W2068317148","https://openalex.org/W2074319623","https://openalex.org/W2344976165","https://openalex.org/W2476760014","https://openalex.org/W2584508145","https://openalex.org/W2601276919","https://openalex.org/W2896107321","https://openalex.org/W2951215190","https://openalex.org/W3004986231","https://openalex.org/W3020867216","https://openalex.org/W3094861556","https://openalex.org/W3173060994","https://openalex.org/W4246237178"],"related_works":["https://openalex.org/W2067842556","https://openalex.org/W2360194796","https://openalex.org/W4389387680","https://openalex.org/W4240053032","https://openalex.org/W2062704067","https://openalex.org/W1982144905","https://openalex.org/W2979948619","https://openalex.org/W1598715577","https://openalex.org/W2014869164","https://openalex.org/W2040346774"],"abstract_inverted_index":{"Laser":[0],"triangulation":[1,58],"sensors":[2,11],"are":[3,66],"one":[4],"of":[5,35,47,91,100,127],"the":[6,25,45,50,55,61,101,117,125,130,139,143],"most":[7],"commonly":[8],"used":[9],"optical":[10,140],"in":[12,80,87],"dimensional":[13],"metrology":[14],"and":[15,60,94,119],"quality":[16],"control.":[17],"This":[18],"paper":[19],"presents":[20],"a":[21,31,41,74,81,88,95,133],"method":[22,42,103],"for":[23,43,68],"simulating":[24],"laser":[26,92],"speckle-induced":[27,63,145],"measurement":[28,83,131,146],"uncertainty,":[29,64],"representing":[30],"major":[32],"performance":[33],"limitation":[34],"these":[36],"sensors,":[37],"as":[38,40],"well":[39],"reducing":[44,142],"influence":[46,90],"speckle":[48],"on":[49,129],"achievable":[51],"accuracy.":[52],"To":[53,123],"investigate":[54],"relation":[56],"between":[57,116],"angle":[59,76],"resulting":[62,144],"simulations":[65],"performed":[67],"three":[69],"sensor":[70],"geometries,":[71],"revealing":[72],"that":[73],"larger":[75],"results":[77],"not":[78],"only":[79],"smaller":[82,96],"range":[84],"but":[85],"also":[86],"reduced":[89],"speckles":[93,128],"uncertainty.":[97],"The":[98],"accuracy":[99],"simulation":[102],"is":[104,136],"validated":[105],"by":[106,148],"measurements":[107],"conducted":[108],"with":[109],"an":[110],"experimental":[111],"setup,":[112],"demonstrating":[113],"good":[114],"agreement":[115],"measured":[118],"simulated":[120],"uncertainty":[121,147],"values.":[122],"reduce":[124],"impact":[126],"accuracy,":[132],"diffuser":[134],"mechanism":[135],"integrated":[137],"into":[138],"path,":[141],"up":[149],"to":[150],"63%.":[151]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}