{"id":"https://openalex.org/W3038746972","doi":"https://doi.org/10.1109/i2mtc43012.2020.9128518","title":"Optical Instrument for Thickness Measurement","display_name":"Optical Instrument for Thickness Measurement","publication_year":2020,"publication_date":"2020-05-01","ids":{"openalex":"https://openalex.org/W3038746972","doi":"https://doi.org/10.1109/i2mtc43012.2020.9128518","mag":"3038746972"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc43012.2020.9128518","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc43012.2020.9128518","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/11311/1150480","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030649050","display_name":"Alessandro Pesatori","orcid":"https://orcid.org/0000-0002-6751-5709"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Alessandro Pesatori","raw_affiliation_strings":["Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058571469","display_name":"Michele Norgia","orcid":"https://orcid.org/0000-0002-8571-1527"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Michele Norgia","raw_affiliation_strings":["Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075592918","display_name":"Federico Cavedo","orcid":"https://orcid.org/0000-0001-5639-3825"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Federico Cavedo","raw_affiliation_strings":["Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5030649050"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":0.2055,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.50158821,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"1","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.7128912210464478},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.7090942859649658},{"id":"https://openalex.org/keywords/measuring-instrument","display_name":"Measuring instrument","score":0.5631895661354065},{"id":"https://openalex.org/keywords/metre","display_name":"Metre","score":0.5604695081710815},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.5396838784217834},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5052328705787659},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.49081000685691833},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4656420946121216},{"id":"https://openalex.org/keywords/natural-rubber","display_name":"Natural rubber","score":0.43849027156829834},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.41305628418922424},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.38950276374816895},{"id":"https://openalex.org/keywords/process-engineering","display_name":"Process engineering","score":0.37140601873397827},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3379281759262085},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3355432450771332},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.3338378071784973},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.24800968170166016},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.22335755825042725},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08402004837989807}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7128912210464478},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.7090942859649658},{"id":"https://openalex.org/C62646347","wikidata":"https://www.wikidata.org/wiki/Q2041172","display_name":"Measuring instrument","level":2,"score":0.5631895661354065},{"id":"https://openalex.org/C151011524","wikidata":"https://www.wikidata.org/wiki/Q11573","display_name":"Metre","level":2,"score":0.5604695081710815},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.5396838784217834},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5052328705787659},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.49081000685691833},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4656420946121216},{"id":"https://openalex.org/C176933379","wikidata":"https://www.wikidata.org/wiki/Q131877","display_name":"Natural rubber","level":2,"score":0.43849027156829834},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.41305628418922424},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.38950276374816895},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.37140601873397827},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3379281759262085},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3355432450771332},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.3338378071784973},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.24800968170166016},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.22335755825042725},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08402004837989807},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/i2mtc43012.2020.9128518","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc43012.2020.9128518","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1150480","is_oa":true,"landing_page_url":"http://hdl.handle.net/11311/1150480","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:re.public.polimi.it:11311/1150480","is_oa":true,"landing_page_url":"http://hdl.handle.net/11311/1150480","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1502863503","https://openalex.org/W1574975037","https://openalex.org/W2046966625","https://openalex.org/W2051594734","https://openalex.org/W2081704179","https://openalex.org/W2096119105","https://openalex.org/W2118161426","https://openalex.org/W2130994354","https://openalex.org/W2473671994","https://openalex.org/W3146433764","https://openalex.org/W4241214195","https://openalex.org/W4297678441"],"related_works":["https://openalex.org/W3015838480","https://openalex.org/W2071668446","https://openalex.org/W1980429525","https://openalex.org/W2361031271","https://openalex.org/W3049121420","https://openalex.org/W2085930114","https://openalex.org/W2326770010","https://openalex.org/W2133600276","https://openalex.org/W2374263760","https://openalex.org/W2386418312"],"abstract_inverted_index":{"In":[0],"modern":[1],"metrology":[2],"it":[3,68],"is":[4,31,69],"increasingly":[5],"common":[6],"to":[7,49,80,119],"find":[8],"the":[9,15,41,51,56,61,76,83,96,113,124],"importance":[10,84],"of":[11,18,39,60,63,66,85,108,115],"thickness":[12],"measurements":[13],"in":[14,33,44,47,93,123],"production":[16,42],"processes":[17,37],"compact":[19],"materials":[20],"(metals,":[21],"plastics,":[22],"paper,":[23],"rubber,":[24],"etc.).":[25],"A":[26],"quick":[27],"and":[28,99],"timely":[29],"measurement":[30,117],"indispensable":[32],"those":[34],"automated":[35],"industrial":[36],"capable":[38],"modifying":[40],"parameters":[43],"real":[45],"time":[46],"order":[48],"have":[50,79],"characteristics":[52],"exactly":[53],"suitable":[54],"for":[55],"needs.":[57],"The":[58,73],"idea":[59],"development":[62],"this":[64],"kind":[65],"instrumentation":[67],"starting":[70],"from":[71],"this.":[72],"requirements":[74],"that":[75,89,100],"system":[77],"will":[78],"respect,":[81],"including":[82],"having":[86],"a":[87,116],"meter":[88],"must":[90],"not":[91],"be":[92,103,120],"contact":[94],"with":[95],"plastic":[97],"film":[98],"can":[101],"only":[102],"positioned":[104],"on":[105],"one":[106],"side":[107],"it.":[109],"These":[110],"restrictions":[111],"require":[112],"choice":[114],"methodology":[118],"sought":[121],"mainly":[122],"optical":[125],"field.":[126]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}