{"id":"https://openalex.org/W2871035070","doi":"https://doi.org/10.1109/i2mtc.2018.8409877","title":"Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME)","display_name":"Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME)","publication_year":2018,"publication_date":"2018-05-01","ids":{"openalex":"https://openalex.org/W2871035070","doi":"https://doi.org/10.1109/i2mtc.2018.8409877","mag":"2871035070"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2018.8409877","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2018.8409877","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023673688","display_name":"Shravan K. Chaganti","orcid":"https://orcid.org/0000-0001-5930-5894"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Shravan K Chaganti","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100357750","display_name":"Tao Chen","orcid":"https://orcid.org/0000-0002-4980-6836"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tao Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016130371","display_name":"Yuming Zhuang","orcid":"https://orcid.org/0000-0001-7744-5268"},"institutions":[{"id":"https://openalex.org/I4210111675","display_name":"Market Matters","ror":"https://ror.org/021yan307","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210111675"]},{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuming Zhuang","raw_affiliation_strings":["Qualcomm Inc., San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Qualcomm Inc., San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596","https://openalex.org/I4210111675"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5023673688"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":0.6438,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.707277,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.911552906036377},{"id":"https://openalex.org/keywords/voltmeter","display_name":"Voltmeter","score":0.5414348840713501},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5190432667732239},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5126494765281677},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.4853416979312897},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.46753236651420593},{"id":"https://openalex.org/keywords/digital-to-analog-converter","display_name":"Digital-to-analog converter","score":0.4494214355945587},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3581761121749878},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2390645444393158},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20603129267692566},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.185237854719162},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1463174819946289},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07302603125572205}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.911552906036377},{"id":"https://openalex.org/C165051773","wikidata":"https://www.wikidata.org/wiki/Q179741","display_name":"Voltmeter","level":3,"score":0.5414348840713501},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5190432667732239},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5126494765281677},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.4853416979312897},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.46753236651420593},{"id":"https://openalex.org/C2779879419","wikidata":"https://www.wikidata.org/wiki/Q210863","display_name":"Digital-to-analog converter","level":3,"score":0.4494214355945587},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3581761121749878},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2390645444393158},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20603129267692566},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.185237854719162},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1463174819946289},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07302603125572205}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2018.8409877","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2018.8409877","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1529971285","https://openalex.org/W2006786321","https://openalex.org/W2035839306","https://openalex.org/W2041846279","https://openalex.org/W2084128131","https://openalex.org/W2096636711","https://openalex.org/W2131477866","https://openalex.org/W2148481133","https://openalex.org/W2152310581","https://openalex.org/W2578654221","https://openalex.org/W2770188706","https://openalex.org/W4243270004","https://openalex.org/W6681551440","https://openalex.org/W6746358713"],"related_works":["https://openalex.org/W2899018960","https://openalex.org/W2315631622","https://openalex.org/W2015667454","https://openalex.org/W4385080086","https://openalex.org/W1584919024","https://openalex.org/W4385813579","https://openalex.org/W1842728358","https://openalex.org/W2375192119","https://openalex.org/W987274863","https://openalex.org/W2069230788"],"abstract_inverted_index":{"The":[0,44,105],"Digital-to-Analog-Converter":[1],"(DAC)":[2],"is":[3,29,42,87,98],"one":[4],"of":[5,9,17,39,57,61,82,107],"the":[6,55,58,73,80,84,91,95],"fundamental":[7],"components":[8],"Analog":[10],"and":[11,28,77],"Mixed-signal":[12],"circuits.":[13],"Static":[14],"linearity":[15,92,116],"testing":[16,40],"high":[18,20],"resolution":[19],"performance":[21],"DACs":[22,41],"traditionally":[23],"requires":[24],"a":[25,35,47,62,68],"long":[26],"time":[27,86],"very":[30],"expensive.":[31],"In":[32],"this":[33],"paper,":[34],"low-cost":[36],"ultrafast":[37],"method":[38,45],"presented.":[43],"utilizes":[46],"low":[48],"cost":[49,118],"on-board":[50],"measurement":[51,96],"device":[52,97],"for":[53,72,119],"capturing":[54],"output":[56],"DAC,":[59],"instead":[60],"precise":[63],"digital":[64],"voltmeter.":[65],"By":[66],"using":[67],"segmented":[69],"non-parametric":[70],"model":[71],"DAC's":[74],"INL":[75],"curve":[76],"thus":[78],"reducing":[79],"number":[81],"unknowns,":[83],"test":[85,117],"drastically":[88],"reduced.":[89],"Additionally,":[90],"requirement":[93],"on":[94],"significantly":[99],"relaxed":[100],"by":[101],"removing":[102],"its":[103],"non-linearity.":[104],"combination":[106],"these":[108],"two":[109],"methods":[110],"results":[111],"in":[112,115],"drastic":[113],"reduction":[114],"DACs.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}