{"id":"https://openalex.org/W2734568673","doi":"https://doi.org/10.1109/i2mtc.2017.7969935","title":"Dynamic imaging based on spatio-temporal information for electrical impedance tomography","display_name":"Dynamic imaging based on spatio-temporal information for electrical impedance tomography","publication_year":2017,"publication_date":"2017-05-01","ids":{"openalex":"https://openalex.org/W2734568673","doi":"https://doi.org/10.1109/i2mtc.2017.7969935","mag":"2734568673"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2017.7969935","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2017.7969935","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061867895","display_name":"Qi Wang","orcid":"https://orcid.org/0000-0002-5339-5427"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qi Wang","raw_affiliation_strings":["School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101757280","display_name":"Yuanyuan Peng","orcid":"https://orcid.org/0000-0001-6155-585X"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanyuan Peng","raw_affiliation_strings":["School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100438225","display_name":"Xiaojing Chen","orcid":"https://orcid.org/0000-0002-9380-3149"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaojing Chen","raw_affiliation_strings":["School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081879366","display_name":"Jing He","orcid":"https://orcid.org/0000-0001-6488-1052"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing He","raw_affiliation_strings":["School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101639651","display_name":"Pengcheng Zhang","orcid":"https://orcid.org/0000-0003-4296-9648"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengcheng Zhang","raw_affiliation_strings":["School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100707504","display_name":"Jianming Wang","orcid":"https://orcid.org/0000-0002-6235-1362"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianming Wang","raw_affiliation_strings":["School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100739602","display_name":"Ronghua Zhang","orcid":"https://orcid.org/0000-0002-4758-4061"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ronghua Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin Polytechnic University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060150695","display_name":"Huaxiang Wang","orcid":"https://orcid.org/0000-0003-1584-6925"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tianjin Polytechnic University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaxiang Wang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin Polytechnic University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5061867895"],"corresponding_institution_ids":["https://openalex.org/I198091727"],"apc_list":null,"apc_paid":null,"fwci":0.1433,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.49615553,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"340","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.7823712825775146},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6533206701278687},{"id":"https://openalex.org/keywords/lagrange-multiplier","display_name":"Lagrange multiplier","score":0.5973457098007202},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5940622091293335},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.5915766954421997},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.5158040523529053},{"id":"https://openalex.org/keywords/data-redundancy","display_name":"Data redundancy","score":0.5076278448104858},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4960494935512543},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.49554240703582764},{"id":"https://openalex.org/keywords/microwave-imaging","display_name":"Microwave imaging","score":0.48073697090148926},{"id":"https://openalex.org/keywords/property","display_name":"Property (philosophy)","score":0.44999751448631287},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4258390963077545},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37607765197753906},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18970048427581787},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.18833667039871216}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.7823712825775146},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6533206701278687},{"id":"https://openalex.org/C73684929","wikidata":"https://www.wikidata.org/wiki/Q598870","display_name":"Lagrange multiplier","level":2,"score":0.5973457098007202},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5940622091293335},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.5915766954421997},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.5158040523529053},{"id":"https://openalex.org/C7545210","wikidata":"https://www.wikidata.org/wiki/Q838123","display_name":"Data redundancy","level":2,"score":0.5076278448104858},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4960494935512543},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.49554240703582764},{"id":"https://openalex.org/C2779885931","wikidata":"https://www.wikidata.org/wiki/Q17010029","display_name":"Microwave imaging","level":3,"score":0.48073697090148926},{"id":"https://openalex.org/C189950617","wikidata":"https://www.wikidata.org/wiki/Q937228","display_name":"Property (philosophy)","level":2,"score":0.44999751448631287},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4258390963077545},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37607765197753906},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18970048427581787},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.18833667039871216},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2017.7969935","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2017.7969935","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2009530941","https://openalex.org/W2049895195","https://openalex.org/W2061833623","https://openalex.org/W2073283474","https://openalex.org/W2156739854","https://openalex.org/W2168793364","https://openalex.org/W2180883051","https://openalex.org/W2220809057","https://openalex.org/W2294623389"],"related_works":["https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W2902419700","https://openalex.org/W3160616384","https://openalex.org/W2905540725","https://openalex.org/W4376629886","https://openalex.org/W2000128178","https://openalex.org/W2101428392","https://openalex.org/W2537891456","https://openalex.org/W2752613076"],"abstract_inverted_index":{"Imaging":[0],"objects":[1,24],"in":[2,10],"electrical":[3],"impedance":[4],"tomography":[5],"(EIT)":[6],"measurement":[7],"are":[8],"often":[9],"a":[11,63,68],"dynamic":[12,22,42],"evolution":[13],"process,":[14],"and":[15,55,102],"exploiting":[16],"the":[17,21,28,31,37,52,56,59,87,94],"spatial-temporal":[18],"properties":[19],"for":[20,27,41],"reconstruction":[23,32],"is":[25,44,72,83,97],"crucial":[26],"improvement":[29],"of":[30,62,93],"quality.":[33],"In":[34],"this":[35],"paper,":[36],"linearized":[38],"equation":[39],"system":[40],"EIT":[43],"established":[45],"based":[46],"on":[47,99],"spatio-temporal":[48],"representation.":[49],"Due":[50],"to":[51,74,85],"spatial":[53],"redundancy":[54],"temporal":[57],"correlations,":[58],"low-rank":[60],"property":[61],"two-dimensional":[64],"difference":[65],"image":[66],"at":[67],"specific":[69],"time":[70],"window":[71],"introduced":[73],"objective":[75,89],"functional.":[76,90],"The":[77,91],"Augmented":[78],"Lagrange":[79],"Multiplier":[80],"(ALM)":[81],"method":[82],"applied":[84],"solve":[86],"new":[88],"effectiveness":[92],"proposed":[95],"scheme":[96],"illustrated":[98],"both":[100],"simulation":[101],"experiment":[103],"data":[104],"sets.":[105]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}