{"id":"https://openalex.org/W1601456150","doi":"https://doi.org/10.1109/i2mtc.2015.7151578","title":"A comparison between FFT and MCT for period measurement with an ARM microcontroller","display_name":"A comparison between FFT and MCT for period measurement with an ARM microcontroller","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1601456150","doi":"https://doi.org/10.1109/i2mtc.2015.7151578","mag":"1601456150"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151578","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151578","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047078706","display_name":"S. S. Guia","orcid":null},"institutions":[{"id":"https://openalex.org/I161321875","display_name":"University of Beira Interior","ror":"https://ror.org/03nf36p02","country_code":"PT","type":"education","lineage":["https://openalex.org/I161321875"]}],"countries":["PT"],"is_corresponding":true,"raw_author_name":"S. S. Guia","raw_affiliation_strings":["Electromechanical Engineering Department, University of Beira Interior, Covilh\u00e3, Portugal","Electromechanical Engineering Department, University of Beira Interior, UBI, Covilh\u00e3, Portugal"],"affiliations":[{"raw_affiliation_string":"Electromechanical Engineering Department, University of Beira Interior, Covilh\u00e3, Portugal","institution_ids":["https://openalex.org/I161321875"]},{"raw_affiliation_string":"Electromechanical Engineering Department, University of Beira Interior, UBI, Covilh\u00e3, Portugal","institution_ids":["https://openalex.org/I161321875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040333576","display_name":"Ant\u00f3nio Esp\u00edrito-Santo","orcid":"https://orcid.org/0000-0002-9540-8900"},"institutions":[{"id":"https://openalex.org/I161321875","display_name":"University of Beira Interior","ror":"https://ror.org/03nf36p02","country_code":"PT","type":"education","lineage":["https://openalex.org/I161321875"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"A. Espirito-Santo","raw_affiliation_strings":["Electromechanical Engineering Department, University of Beira Interior, Covilh\u00e3, Portugal","Electromechanical Engineering Department, University of Beira Interior, UBI, Covilh\u00e3, Portugal"],"affiliations":[{"raw_affiliation_string":"Electromechanical Engineering Department, University of Beira Interior, Covilh\u00e3, Portugal","institution_ids":["https://openalex.org/I161321875"]},{"raw_affiliation_string":"Electromechanical Engineering Department, University of Beira Interior, UBI, Covilh\u00e3, Portugal","institution_ids":["https://openalex.org/I161321875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077842218","display_name":"Vincenzo Paciello","orcid":"https://orcid.org/0000-0002-9284-1741"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"V. Paciello","raw_affiliation_strings":["Industrial Engineering Department, University of Salerno, Salerno, Italy","Industrial Engineering Department, University of Salerno, UNISA, Italy"],"affiliations":[{"raw_affiliation_string":"Industrial Engineering Department, University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]},{"raw_affiliation_string":"Industrial Engineering Department, University of Salerno, UNISA, Italy","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002649650","display_name":"Francesco Abate","orcid":"https://orcid.org/0000-0002-5665-1828"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Abate","raw_affiliation_strings":["Industrial Engineering Department, University of Salerno, Salerno, Italy","Industrial Engineering Department, University of Salerno, UNISA, Italy"],"affiliations":[{"raw_affiliation_string":"Industrial Engineering Department, University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]},{"raw_affiliation_string":"Industrial Engineering Department, University of Salerno, UNISA, Italy","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071580146","display_name":"Antonio Pietrosanto","orcid":"https://orcid.org/0000-0001-5593-7325"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Pietrosanto","raw_affiliation_strings":["Industrial Engineering Department, University of Salerno, Salerno, Italy","Industrial Engineering Department, University of Salerno, UNISA, Italy"],"affiliations":[{"raw_affiliation_string":"Industrial Engineering Department, University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]},{"raw_affiliation_string":"Industrial Engineering Department, University of Salerno, UNISA, Italy","institution_ids":["https://openalex.org/I131729948"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5047078706"],"corresponding_institution_ids":["https://openalex.org/I161321875"],"apc_list":null,"apc_paid":null,"fwci":0.5918,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.71145915,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"45","issue":null,"first_page":"1938","last_page":"1942"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fast-fourier-transform","display_name":"Fast Fourier transform","score":0.8734921813011169},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.8001490235328674},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7207164168357849},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5845282673835754},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.4371680021286011},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.43143516778945923},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.41630226373672485},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.41263580322265625},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24015069007873535}],"concepts":[{"id":"https://openalex.org/C75172450","wikidata":"https://www.wikidata.org/wiki/Q623950","display_name":"Fast Fourier transform","level":2,"score":0.8734921813011169},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.8001490235328674},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7207164168357849},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5845282673835754},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.4371680021286011},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43143516778945923},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.41630226373672485},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.41263580322265625},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24015069007873535},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151578","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151578","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4000000059604645,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1766888123","https://openalex.org/W1998760751","https://openalex.org/W2006434287","https://openalex.org/W2022879131","https://openalex.org/W2052009523","https://openalex.org/W2055238920","https://openalex.org/W2077270589","https://openalex.org/W2081259069","https://openalex.org/W2087144930","https://openalex.org/W2098074670","https://openalex.org/W2101417236","https://openalex.org/W2106335692","https://openalex.org/W2111460811","https://openalex.org/W2112747960","https://openalex.org/W2115581651","https://openalex.org/W2132483071","https://openalex.org/W2134572726","https://openalex.org/W2135031801","https://openalex.org/W2152180344","https://openalex.org/W2153994493","https://openalex.org/W2163482416","https://openalex.org/W2168452204","https://openalex.org/W2987055109","https://openalex.org/W6637883433","https://openalex.org/W6669719257","https://openalex.org/W6672441768"],"related_works":["https://openalex.org/W4316095964","https://openalex.org/W2383001583","https://openalex.org/W2771395446","https://openalex.org/W2131084560","https://openalex.org/W2392088491","https://openalex.org/W2089988144","https://openalex.org/W1985703800","https://openalex.org/W2347749188","https://openalex.org/W1972388196","https://openalex.org/W2735419558"],"abstract_inverted_index":{"A":[0],"comparison":[1],"between":[2],"two":[3],"different":[4],"algorithms":[5,21,45,65],"to":[6],"measure":[7],"the":[8,20,25,33,38,64,75],"period":[9],"of":[10,19,60,63,77],"a":[11,52],"signal":[12,85],"is":[13,22,35,66],"performed":[14],"on":[15,24,37],"this":[16],"work.":[17],"One":[18],"based":[23,36],"Fast":[26],"Fourier":[27],"Transformation":[28],"(FFT)":[29],"measurement":[30,58],"procedure,":[31],"whereas":[32],"other":[34],"Segmentation":[39],"and":[40,81],"Labeling":[41],"algorithm":[42],"(MCT).":[43],"Both":[44],"have":[46],"been":[47],"prepared":[48],"for":[49,84],"implementation":[50],"in":[51,68],"microcontroller":[53],"with":[54,74],"ARM":[55],"architecture.":[56],"The":[57],"operation":[59],"each":[61],"one":[62],"described":[67],"detail.":[69],"Experimental":[70],"results":[71],"are":[72],"reported,":[73],"purpose":[76],"demonstrating":[78],"both":[79],"performance":[80],"output":[82],"format":[83],"analysis.":[86]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2015,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}