{"id":"https://openalex.org/W1515439600","doi":"https://doi.org/10.1109/i2mtc.2015.7151527","title":"Enhanced ADC sine wave histogram test","display_name":"Enhanced ADC sine wave histogram test","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1515439600","doi":"https://doi.org/10.1109/i2mtc.2015.7151527","mag":"1515439600"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151527","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151527","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053602421","display_name":"S. Max","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Solomon Max","raw_affiliation_strings":["LTX-Credence Corporation, Norwood, MA","LTX-Credence Corporation, Norwood, MA, USA"],"affiliations":[{"raw_affiliation_string":"LTX-Credence Corporation, Norwood, MA","institution_ids":[]},{"raw_affiliation_string":"LTX-Credence Corporation, Norwood, MA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043489699","display_name":"Richard Liggiero","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Richard Liggiero","raw_affiliation_strings":["LTX-Credence Corporation, Norwood, MA","LTX-Credence Corporation, Norwood, MA, USA"],"affiliations":[{"raw_affiliation_string":"LTX-Credence Corporation, Norwood, MA","institution_ids":[]},{"raw_affiliation_string":"LTX-Credence Corporation, Norwood, MA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5053602421"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3946,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.64838619,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1652","last_page":"1657"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.7852508425712585},{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.6497646570205688},{"id":"https://openalex.org/keywords/sine","display_name":"Sine","score":0.5443408489227295},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.48182788491249084},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4711189270019531},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.45701485872268677},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4277772009372711},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3058742880821228},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.26604750752449036},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1787729561328888},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12048625946044922},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.07090216875076294},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06343501806259155}],"concepts":[{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.7852508425712585},{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.6497646570205688},{"id":"https://openalex.org/C186661526","wikidata":"https://www.wikidata.org/wiki/Q13647261","display_name":"Sine","level":2,"score":0.5443408489227295},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.48182788491249084},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4711189270019531},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.45701485872268677},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4277772009372711},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3058742880821228},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.26604750752449036},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1787729561328888},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12048625946044922},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.07090216875076294},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06343501806259155},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151527","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151527","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7599999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2006786321","https://openalex.org/W2062003791","https://openalex.org/W2113796007","https://openalex.org/W2187548090"],"related_works":["https://openalex.org/W2886467464","https://openalex.org/W2379854577","https://openalex.org/W3174698889","https://openalex.org/W2362063739","https://openalex.org/W2351293857","https://openalex.org/W2424761688","https://openalex.org/W3044335280","https://openalex.org/W2487672730","https://openalex.org/W2409813437","https://openalex.org/W1997184869"],"abstract_inverted_index":{"An":[0],"improved":[1,15],"method":[2,57,69],"of":[3,25,29,42,49,70],"testing":[4],"ADCs":[5],"with":[6,13,35],"a":[7,68],"sine":[8],"wave":[9],"histogram":[10],"is":[11,33,52,65],"combined":[12],"an":[14,62],"compression":[16,31],"algorithm":[17,32],"to":[18],"accurately":[19],"test":[20],"the":[21,30,47,50],"INL":[22],"and":[23,37,44],"DNL":[24],"ADCs.":[26],"The":[27,40],"accuracy":[28,48],"demonstrated":[34],"actual":[36],"simulated":[38],"results.":[39],"role":[41],"THD":[43,60],"noise":[45],"in":[46,61],"measurements":[51],"demonstrated.":[53],"A":[54],"previously":[55],"reported":[56],"for":[58],"reducing":[59],"ac":[63],"source":[64],"introduced":[66],"as":[67],"improving":[71],"ADC":[72],"measurement":[73],"accuracy.":[74]},"counts_by_year":[{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}