{"id":"https://openalex.org/W1523234441","doi":"https://doi.org/10.1109/i2mtc.2015.7151484","title":"Impact of sampling frequency on accuracy of unbalance factor measurement by DFT","display_name":"Impact of sampling frequency on accuracy of unbalance factor measurement by DFT","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1523234441","doi":"https://doi.org/10.1109/i2mtc.2015.7151484","mag":"1523234441"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2015.7151484","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151484","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034806120","display_name":"Tomasz Tarasiuk","orcid":"https://orcid.org/0000-0001-7042-1503"},"institutions":[{"id":"https://openalex.org/I4210125238","display_name":"Gdynia Maritime University","ror":"https://ror.org/02vscf791","country_code":"PL","type":"education","lineage":["https://openalex.org/I4210125238"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Tomasz Tarasiuk","raw_affiliation_strings":["Department of Marine Electrical Power Engineering, Gdynia Maritime University, Gdynia, Poland","Department of Marine Electrical Power Engineering, Gdynia Maritime University, Poland"],"affiliations":[{"raw_affiliation_string":"Department of Marine Electrical Power Engineering, Gdynia Maritime University, Gdynia, Poland","institution_ids":["https://openalex.org/I4210125238"]},{"raw_affiliation_string":"Department of Marine Electrical Power Engineering, Gdynia Maritime University, Poland","institution_ids":["https://openalex.org/I4210125238"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008040725","display_name":"Andrzej Pi\u0142at","orcid":"https://orcid.org/0000-0002-4481-9574"},"institutions":[{"id":"https://openalex.org/I4210125238","display_name":"Gdynia Maritime University","ror":"https://ror.org/02vscf791","country_code":"PL","type":"education","lineage":["https://openalex.org/I4210125238"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Andrzej Pilat","raw_affiliation_strings":["Department of Marine Electrical Power Engineering, Gdynia Maritime University, Gdynia, Poland","Department of Marine Electrical Power Engineering, Gdynia Maritime University, Poland"],"affiliations":[{"raw_affiliation_string":"Department of Marine Electrical Power Engineering, Gdynia Maritime University, Gdynia, Poland","institution_ids":["https://openalex.org/I4210125238"]},{"raw_affiliation_string":"Department of Marine Electrical Power Engineering, Gdynia Maritime University, Poland","institution_ids":["https://openalex.org/I4210125238"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5034806120"],"corresponding_institution_ids":["https://openalex.org/I4210125238"],"apc_list":null,"apc_paid":null,"fwci":0.5919,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.70752701,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1420","last_page":"1424"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discrete-fourier-transform","display_name":"Discrete Fourier transform (general)","score":0.767073392868042},{"id":"https://openalex.org/keywords/coherent-sampling","display_name":"Coherent sampling","score":0.6621633172035217},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.6372582912445068},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5530090928077698},{"id":"https://openalex.org/keywords/fourier-transform","display_name":"Fourier transform","score":0.5403532981872559},{"id":"https://openalex.org/keywords/time\u2013frequency-analysis","display_name":"Time\u2013frequency analysis","score":0.48880788683891296},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.45747682452201843},{"id":"https://openalex.org/keywords/factor","display_name":"Factor (programming language)","score":0.44982144236564636},{"id":"https://openalex.org/keywords/window","display_name":"Window (computing)","score":0.43603262305259705},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4194384813308716},{"id":"https://openalex.org/keywords/short-time-fourier-transform","display_name":"Short-time Fourier transform","score":0.33716094493865967},{"id":"https://openalex.org/keywords/fourier-analysis","display_name":"Fourier analysis","score":0.2705419659614563},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.269569456577301},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2083047330379486},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.11606308817863464},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1157408356666565}],"concepts":[{"id":"https://openalex.org/C57733114","wikidata":"https://www.wikidata.org/wiki/Q1006032","display_name":"Discrete Fourier transform (general)","level":5,"score":0.767073392868042},{"id":"https://openalex.org/C31942786","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Coherent sampling","level":4,"score":0.6621633172035217},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6372582912445068},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5530090928077698},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.5403532981872559},{"id":"https://openalex.org/C142433447","wikidata":"https://www.wikidata.org/wiki/Q7806653","display_name":"Time\u2013frequency analysis","level":3,"score":0.48880788683891296},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.45747682452201843},{"id":"https://openalex.org/C2781039887","wikidata":"https://www.wikidata.org/wiki/Q1391724","display_name":"Factor (programming language)","level":2,"score":0.44982144236564636},{"id":"https://openalex.org/C2778751112","wikidata":"https://www.wikidata.org/wiki/Q835016","display_name":"Window (computing)","level":2,"score":0.43603262305259705},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4194384813308716},{"id":"https://openalex.org/C166386157","wikidata":"https://www.wikidata.org/wiki/Q1477735","display_name":"Short-time Fourier transform","level":4,"score":0.33716094493865967},{"id":"https://openalex.org/C203024314","wikidata":"https://www.wikidata.org/wiki/Q1365258","display_name":"Fourier analysis","level":3,"score":0.2705419659614563},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.269569456577301},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2083047330379486},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.11606308817863464},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1157408356666565},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2015.7151484","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2015.7151484","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2055967972","https://openalex.org/W2140136851","https://openalex.org/W4231796025"],"related_works":["https://openalex.org/W2326454079","https://openalex.org/W564939545","https://openalex.org/W2533590149","https://openalex.org/W4293267999","https://openalex.org/W2560154230","https://openalex.org/W2964898233","https://openalex.org/W2029494570","https://openalex.org/W2129331087","https://openalex.org/W2539126704","https://openalex.org/W2380313808"],"abstract_inverted_index":{"The":[0,33],"proposed":[1],"paper":[2],"is":[3,26],"to":[4],"discuss":[5],"the":[6],"problem":[7,21],"of":[8,10,22],"accuracy":[9],"unbalance":[11],"factor":[12],"measurement":[13,34],"by":[14],"discrete":[15],"Fourier":[16],"transform":[17],"(DFT).":[18],"Particularly,":[19],"a":[20],"inappropriate":[23],"sampling":[24],"frequency":[25],"considered,":[27],"when":[28],"signals":[29],"are":[30,40,46],"sampled":[31],"non-coherently.":[32],"window":[35],"width":[36],"and":[37,55],"its":[38],"shape":[39],"considered":[41],"as":[42,51,53],"well.":[43],"All":[44],"analyses":[45],"based":[47],"on":[48],"analytical":[49],"solutions":[50],"well":[52],"simulation":[54],"experimental":[56],"research.":[57]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}