{"id":"https://openalex.org/W2117732750","doi":"https://doi.org/10.1109/i2mtc.2013.6555669","title":"ADC spectral testing allowing amplitude clipping","display_name":"ADC spectral testing allowing amplitude clipping","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W2117732750","doi":"https://doi.org/10.1109/i2mtc.2013.6555669","mag":"2117732750"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555669","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555669","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112316572","display_name":"Li Xu","orcid":"https://orcid.org/0009-0008-9363-7575"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Li Xu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA#TAB#","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA#TAB#","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5112316572"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":0.9458,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.79373199,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1526","last_page":"1529"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.835077166557312},{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.8115577697753906},{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.7859972715377808},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.6855567097663879},{"id":"https://openalex.org/keywords/clipping","display_name":"Clipping (morphology)","score":0.6347372531890869},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.592517614364624},{"id":"https://openalex.org/keywords/sine","display_name":"Sine","score":0.5759726166725159},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46442854404449463},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.401134192943573},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23310691118240356},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2158132791519165},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17924851179122925},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16098439693450928},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15524795651435852},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.13070353865623474},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.0854729413986206}],"concepts":[{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.835077166557312},{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.8115577697753906},{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.7859972715377808},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.6855567097663879},{"id":"https://openalex.org/C2776848632","wikidata":"https://www.wikidata.org/wiki/Q853463","display_name":"Clipping (morphology)","level":2,"score":0.6347372531890869},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.592517614364624},{"id":"https://openalex.org/C186661526","wikidata":"https://www.wikidata.org/wiki/Q13647261","display_name":"Sine","level":2,"score":0.5759726166725159},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46442854404449463},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.401134192943573},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23310691118240356},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2158132791519165},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17924851179122925},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16098439693450928},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15524795651435852},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.13070353865623474},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.0854729413986206},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555669","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555669","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4699999988079071}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2074480906","https://openalex.org/W2115867061","https://openalex.org/W2142104140","https://openalex.org/W2148612098","https://openalex.org/W2152697693","https://openalex.org/W2157683703","https://openalex.org/W2168912491","https://openalex.org/W2187548090"],"related_works":["https://openalex.org/W2054489929","https://openalex.org/W2021405064","https://openalex.org/W2341231357","https://openalex.org/W1496095114","https://openalex.org/W2759515872","https://openalex.org/W3082766528","https://openalex.org/W2765332907","https://openalex.org/W2744643448","https://openalex.org/W4376139100","https://openalex.org/W2024969921"],"abstract_inverted_index":{"In":[0],"Built-In":[1],"Self-Test,":[2],"it":[3],"is":[4,55],"hard":[5],"to":[6],"control":[7],"the":[8,11,21,25,51,58,62,72,75,103],"amplitude":[9,73],"of":[10,24,61,74,81,98],"input":[12,52,76],"sine":[13,53,77],"wave":[14,54],"approximately":[15],"equal":[16],"but":[17],"slightly":[18],"less":[19],"than":[20,57],"full":[22,59],"scale":[23,60],"ADC":[26,101],"under":[27,29],"test,":[28],"which":[30,44],"condition":[31],"correct":[32],"spectral":[33,88],"performance":[34,89],"can":[35,45],"be":[36],"obtained.":[37],"This":[38],"paper":[39],"proposes":[40],"a":[41,99],"new":[42],"algorithm":[43],"achieve":[46],"accurate":[47,87],"testing":[48],"result":[49,97],"when":[50],"larger":[56],"ADC.":[63],"It":[64],"also":[65],"relaxes":[66],"an":[67],"IEEE":[68],"standard":[69],"requirement":[70],"on":[71,90],"wave.":[78],"Simulation":[79],"results":[80],"4":[82],"different":[83],"resolution":[84],"ADCs":[85],"show":[86],"THD,":[91],"SFDR,":[92],"ENOB":[93],"and":[94],"SNR.":[95],"Measurement":[96],"16-bit":[100],"validated":[102],"algorithm.":[104]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}