{"id":"https://openalex.org/W2007689732","doi":"https://doi.org/10.1109/i2mtc.2013.6555552","title":"Velocity induced eddy currents technique to inspect cracks in moving conducting media","display_name":"Velocity induced eddy currents technique to inspect cracks in moving conducting media","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W2007689732","doi":"https://doi.org/10.1109/i2mtc.2013.6555552","mag":"2007689732"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555552","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555552","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014802131","display_name":"Helena G. Ramos","orcid":"https://orcid.org/0000-0002-4931-7960"},"institutions":[{"id":"https://openalex.org/I4387152517","display_name":"Instituto Superior T\u00e9cnico","ror":"https://ror.org/03db2by73","country_code":null,"type":"education","lineage":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]},{"id":"https://openalex.org/I4210120471","display_name":"Instituto de Telecomunica\u00e7\u00f5es","ror":"https://ror.org/02ht4fk33","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I4210120471"]}],"countries":["PT"],"is_corresponding":true,"raw_author_name":"H. M. Geirinhas Ramos","raw_affiliation_strings":["Instituto de Telecomunica\u00e7\u00f5es, Instituto Superior T\u00e9cnico, Universidade T\u00e9cnica de Lisboa, Lisbon, Portugal","Inst. de Telecomun., Univ. Tec. de Lisboa, Lisbon, Portugal"],"affiliations":[{"raw_affiliation_string":"Instituto de Telecomunica\u00e7\u00f5es, Instituto Superior T\u00e9cnico, Universidade T\u00e9cnica de Lisboa, Lisbon, Portugal","institution_ids":["https://openalex.org/I4210120471","https://openalex.org/I4387152517"]},{"raw_affiliation_string":"Inst. de Telecomun., Univ. Tec. de Lisboa, Lisbon, Portugal","institution_ids":["https://openalex.org/I4210120471"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080174622","display_name":"T. Rocha","orcid":"https://orcid.org/0000-0003-0399-1930"},"institutions":[{"id":"https://openalex.org/I4210120471","display_name":"Instituto de Telecomunica\u00e7\u00f5es","ror":"https://ror.org/02ht4fk33","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I4210120471"]},{"id":"https://openalex.org/I4387152517","display_name":"Instituto Superior T\u00e9cnico","ror":"https://ror.org/03db2by73","country_code":null,"type":"education","lineage":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"T. Rocha","raw_affiliation_strings":["Instituto de Telecomunica\u00e7\u00f5es, Instituto Superior T\u00e9cnico, Universidade T\u00e9cnica de Lisboa, Lisbon, Portugal","Inst. de Telecomun., Univ. Tec. de Lisboa, Lisbon, Portugal"],"affiliations":[{"raw_affiliation_string":"Instituto de Telecomunica\u00e7\u00f5es, Instituto Superior T\u00e9cnico, Universidade T\u00e9cnica de Lisboa, Lisbon, Portugal","institution_ids":["https://openalex.org/I4210120471","https://openalex.org/I4387152517"]},{"raw_affiliation_string":"Inst. de Telecomun., Univ. Tec. de Lisboa, Lisbon, Portugal","institution_ids":["https://openalex.org/I4210120471"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032533444","display_name":"D\u00e1rio J. Pasadas","orcid":"https://orcid.org/0000-0002-2935-043X"},"institutions":[{"id":"https://openalex.org/I4210120471","display_name":"Instituto de Telecomunica\u00e7\u00f5es","ror":"https://ror.org/02ht4fk33","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I4210120471"]},{"id":"https://openalex.org/I4387152517","display_name":"Instituto Superior T\u00e9cnico","ror":"https://ror.org/03db2by73","country_code":null,"type":"education","lineage":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Dario Pasadas","raw_affiliation_strings":["Instituto de Telecomunica\u00e7\u00f5es, Instituto Superior T\u00e9cnico, Universidade T\u00e9cnica de Lisboa, Lisbon, Portugal","Inst. de Telecomun., Univ. Tec. de Lisboa, Lisbon, Portugal"],"affiliations":[{"raw_affiliation_string":"Instituto de Telecomunica\u00e7\u00f5es, Instituto Superior T\u00e9cnico, Universidade T\u00e9cnica de Lisboa, Lisbon, Portugal","institution_ids":["https://openalex.org/I4210120471","https://openalex.org/I4387152517"]},{"raw_affiliation_string":"Inst. de Telecomun., Univ. Tec. de Lisboa, Lisbon, Portugal","institution_ids":["https://openalex.org/I4210120471"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065915895","display_name":"A. Lopes Ribeiro","orcid":"https://orcid.org/0000-0002-7475-3422"},"institutions":[{"id":"https://openalex.org/I4387152517","display_name":"Instituto Superior T\u00e9cnico","ror":"https://ror.org/03db2by73","country_code":null,"type":"education","lineage":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]},{"id":"https://openalex.org/I4210120471","display_name":"Instituto de Telecomunica\u00e7\u00f5es","ror":"https://ror.org/02ht4fk33","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I4210120471"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"A.Lopes Ribeiro","raw_affiliation_strings":["Instituto de Telecomunica\u00e7\u00f5es, Instituto Superior T\u00e9cnico, Universidade T\u00e9cnica de Lisboa, Lisbon, Portugal","Inst. de Telecomun., Univ. Tec. de Lisboa, Lisbon, Portugal"],"affiliations":[{"raw_affiliation_string":"Instituto de Telecomunica\u00e7\u00f5es, Instituto Superior T\u00e9cnico, Universidade T\u00e9cnica de Lisboa, Lisbon, Portugal","institution_ids":["https://openalex.org/I4210120471","https://openalex.org/I4387152517"]},{"raw_affiliation_string":"Inst. de Telecomun., Univ. Tec. de Lisboa, Lisbon, Portugal","institution_ids":["https://openalex.org/I4210120471"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5014802131"],"corresponding_institution_ids":["https://openalex.org/I4210120471","https://openalex.org/I4387152517"],"apc_list":null,"apc_paid":null,"fwci":3.3036,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.90929003,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"931","last_page":"934"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.9205948114395142},{"id":"https://openalex.org/keywords/eddy-current-brake","display_name":"Eddy current brake","score":0.7516566514968872},{"id":"https://openalex.org/keywords/bogie","display_name":"Bogie","score":0.6788134574890137},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.6477999687194824},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.6185851097106934},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.5907259583473206},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5817535519599915},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.5810695290565491},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.5262417197227478},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.464002788066864},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.44745391607284546},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.4214848577976227},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3601248264312744},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3461112678050995},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.34067434072494507},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3204426169395447},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31693387031555176},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.313254177570343},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.25583937764167786}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.9205948114395142},{"id":"https://openalex.org/C54855816","wikidata":"https://www.wikidata.org/wiki/Q2585557","display_name":"Eddy current brake","level":3,"score":0.7516566514968872},{"id":"https://openalex.org/C123045823","wikidata":"https://www.wikidata.org/wiki/Q217421","display_name":"Bogie","level":2,"score":0.6788134574890137},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.6477999687194824},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.6185851097106934},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.5907259583473206},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5817535519599915},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.5810695290565491},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.5262417197227478},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.464002788066864},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.44745391607284546},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.4214848577976227},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3601248264312744},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3461112678050995},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.34067434072494507},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3204426169395447},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31693387031555176},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.313254177570343},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.25583937764167786},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555552","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555552","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1141687566","https://openalex.org/W1146228325","https://openalex.org/W2001936499","https://openalex.org/W2012022391","https://openalex.org/W2029414476","https://openalex.org/W2040356629","https://openalex.org/W2055945408","https://openalex.org/W2096595882","https://openalex.org/W2106816479","https://openalex.org/W2124970851","https://openalex.org/W2148770102","https://openalex.org/W2167969071","https://openalex.org/W2172225531","https://openalex.org/W2308929066","https://openalex.org/W4252474971","https://openalex.org/W6627573556","https://openalex.org/W6698461812"],"related_works":["https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W2333795440","https://openalex.org/W2369672268","https://openalex.org/W1680801918","https://openalex.org/W2102849516","https://openalex.org/W1972402538","https://openalex.org/W4230069654","https://openalex.org/W1970681872","https://openalex.org/W4250219913"],"abstract_inverted_index":{"This":[0,80],"paper":[1,91],"presents":[2,123],"a":[3,15,22,76,143,147,172],"new":[4],"nondestructive":[5],"testing":[6,52,166],"technique":[7,35],"based":[8],"on":[9],"velocity":[10,25],"induced":[11,26],"eddy":[12,27,42,50],"currents.":[13],"When":[14],"time":[16],"constant":[17],"magnetic":[18,69,77,81,93],"field":[19,70,78,82,94],"moves":[20],"along":[21],"conductive":[23],"material":[24,128],"currents":[28,43],"are":[29,96,168],"generated":[30],"in":[31,44,119,133],"the":[32,45,55,60,67,84,87,92,105,120,127,137,150,153,160,164],"media.":[33],"The":[34],"developed":[36],"within":[37],"this":[38,90,108],"work":[39],"uses":[40],"these":[41],"same":[46],"way":[47],"as":[48,104],"any":[49],"current":[51],"method":[53,154],"where":[54],"flow":[56],"pattern":[57],"disturbed":[58],"by":[59,75],"existence":[61],"of":[62,66,152,163],"defects":[63],"creates":[64],"variations":[65],"secondary":[68],"that":[71,113],"can":[72],"be":[73,130],"assessed":[74],"sensor.":[79],"provides":[83],"information":[85],"about":[86],"defects.":[88],"Within":[89],"parameters":[95],"measured":[97],"using":[98,171],"\u201cgiant\u201d":[99],"magnetoresistors":[100],"(GMR).":[101],"As":[102],"far":[103],"authors":[106],"know":[107],"is":[109,132],"an":[110],"original":[111],"method,":[112],"has":[114],"not":[115],"yet":[116],"been":[117],"reported":[118],"literature,":[121],"and":[122],"undoubted":[124],"advantages":[125],"when":[126,141],"to":[129,136],"tested":[131],"motion":[134],"relative":[135],"test":[138],"sensor":[139],"(like":[140],"inspecting":[142],"rail":[144],"track":[145],"with":[146,156],"bogie)":[148],"because":[149],"sensitivity":[151],"increases":[155],"speed.":[157],"To":[158],"validate":[159],"results":[161],"simulations":[162],"actual":[165],"conditions":[167],"also":[169],"presented":[170],"commercial":[173],"finite":[174],"element":[175],"model.":[176]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2}],"updated_date":"2026-03-12T08:34:05.389933","created_date":"2025-10-10T00:00:00"}