{"id":"https://openalex.org/W1992992763","doi":"https://doi.org/10.1109/i2mtc.2013.6555507","title":"High resolution imaging for inspection of laser beam melting systems","display_name":"High resolution imaging for inspection of laser beam melting systems","publication_year":2013,"publication_date":"2013-05-01","ids":{"openalex":"https://openalex.org/W1992992763","doi":"https://doi.org/10.1109/i2mtc.2013.6555507","mag":"1992992763"},"language":"en","primary_location":{"id":"doi:10.1109/i2mtc.2013.6555507","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555507","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073198674","display_name":"Joschka zur Jacobsm\u00fchlen","orcid":"https://orcid.org/0000-0003-4183-360X"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Joschka zur Jacobsmuhlen","raw_affiliation_strings":["Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","Institute of Imaging & Computer Vision, RWTH Aachen University, Aachen, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"Institute of Imaging & Computer Vision, RWTH Aachen University, Aachen, Germany#TAB#","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084028900","display_name":"Stefan Kleszczynski","orcid":"https://orcid.org/0000-0001-6870-0423"},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stefan Kleszczynski","raw_affiliation_strings":["Institute for Product Engineering, University of Duisburg-Essen, Duisburg, Germany"],"affiliations":[{"raw_affiliation_string":"Institute for Product Engineering, University of Duisburg-Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091429665","display_name":"Dorian Schneider","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dorian Schneider","raw_affiliation_strings":["Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","Institute of Imaging & Computer Vision, RWTH Aachen University, Aachen, Germany#TAB#"],"affiliations":[{"raw_affiliation_string":"Institute of Imaging and Computer Vision, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"Institute of Imaging & Computer Vision, RWTH Aachen University, Aachen, Germany#TAB#","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003188843","display_name":"Gerd Witt","orcid":null},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Gerd Witt","raw_affiliation_strings":["Institute for Product Engineering, University of Duisburg-Essen, Duisburg, Germany"],"affiliations":[{"raw_affiliation_string":"Institute for Product Engineering, University of Duisburg-Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5073198674"],"corresponding_institution_ids":["https://openalex.org/I887968799"],"apc_list":null,"apc_paid":null,"fwci":4.1341,"has_fulltext":false,"cited_by_count":91,"citation_normalized_percentile":{"value":0.92893145,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"707","last_page":"712"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10705","display_name":"Additive Manufacturing Materials and Processes","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10705","display_name":"Additive Manufacturing Materials and Processes","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/container","display_name":"Container (type theory)","score":0.608096182346344},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6017626523971558},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5168962478637695},{"id":"https://openalex.org/keywords/beam","display_name":"Beam (structure)","score":0.5045844316482544},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.49959540367126465},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.49756744503974915},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.4921974241733551},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.4825108051300049},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.4797459840774536},{"id":"https://openalex.org/keywords/metadata","display_name":"Metadata","score":0.4731403589248657},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.4537102282047272},{"id":"https://openalex.org/keywords/selective-laser-melting","display_name":"Selective laser melting","score":0.4470151662826538},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.4466556906700134},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.3337813913822174},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.26575934886932373},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15667447447776794},{"id":"https://openalex.org/keywords/microstructure","display_name":"Microstructure","score":0.14730677008628845},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.14414048194885254},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1260177493095398},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.11493617296218872},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.11361318826675415}],"concepts":[{"id":"https://openalex.org/C2781018962","wikidata":"https://www.wikidata.org/wiki/Q5164884","display_name":"Container (type theory)","level":2,"score":0.608096182346344},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6017626523971558},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5168962478637695},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.5045844316482544},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.49959540367126465},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49756744503974915},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.4921974241733551},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4825108051300049},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.4797459840774536},{"id":"https://openalex.org/C93518851","wikidata":"https://www.wikidata.org/wiki/Q180160","display_name":"Metadata","level":2,"score":0.4731403589248657},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.4537102282047272},{"id":"https://openalex.org/C26796778","wikidata":"https://www.wikidata.org/wiki/Q2267983","display_name":"Selective laser melting","level":3,"score":0.4470151662826538},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.4466556906700134},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3337813913822174},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.26575934886932373},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15667447447776794},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.14730677008628845},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.14414048194885254},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1260177493095398},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.11493617296218872},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.11361318826675415},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/i2mtc.2013.6555507","is_oa":false,"landing_page_url":"https://doi.org/10.1109/i2mtc.2013.6555507","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321429","display_name":"Allianz Industrie Forschung","ror":"https://ror.org/05vmfpy67"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1191485324","https://openalex.org/W1952878045","https://openalex.org/W1963661623","https://openalex.org/W1971941250","https://openalex.org/W2033819227","https://openalex.org/W2068611955","https://openalex.org/W2118572717","https://openalex.org/W2128458895","https://openalex.org/W2160970646","https://openalex.org/W2519063865","https://openalex.org/W2519982275","https://openalex.org/W2522795694","https://openalex.org/W4249678223","https://openalex.org/W6627961696","https://openalex.org/W6726739689","https://openalex.org/W6727328129"],"related_works":["https://openalex.org/W3117076848","https://openalex.org/W2889937250","https://openalex.org/W3061217114","https://openalex.org/W2058118494","https://openalex.org/W2392768766","https://openalex.org/W2523501139","https://openalex.org/W4376117233","https://openalex.org/W2382021449","https://openalex.org/W4225795411","https://openalex.org/W3015949216"],"abstract_inverted_index":{"Laser":[0],"Beam":[1],"Melting":[2],"(LBM)":[3],"allows":[4],"the":[5,33,45,50,69,132,147,180],"fabrication":[6],"of":[7,52,71,89,110,135,156,183],"three-dimensional":[8],"parts":[9],"from":[10],"metallic":[11],"powder":[12,28],"with":[13,118,160],"almost":[14],"unlimited":[15],"geometrical":[16],"complexity":[17],"and":[18,74,106,115,122,127,139,175,194],"very":[19],"good":[20],"mechanical":[21],"properties.":[22],"LBM":[23,53,90],"works":[24],"iteratively:":[25],"a":[26,41,82,151,157],"thin":[27],"layer":[29,108],"is":[30,37,143,176],"deposited":[31],"onto":[32],"build":[34,112],"platform":[35],"which":[36,92,166],"then":[38],"melted":[39],"by":[40],"laser":[42],"according":[43],"to":[44,68,145,178],"desired":[46],"part":[47,158],"geometry.":[48],"Today,":[49],"potential":[51],"in":[54,199],"application":[55],"areas":[56],"such":[57],"as":[58],"aerospace":[59],"or":[60],"medicine":[61],"has":[62],"not":[63],"yet":[64],"been":[65],"exploited":[66],"due":[67],"lack":[70],"process":[72,113,123,148,162],"stability":[73],"quality":[75,182],"management.":[76],"For":[77],"that":[78,141,168],"reason,":[79],"we":[80],"present":[81],"high":[83],"resolution":[84],"imaging":[85,137],"system":[86,138,170],"for":[87,125,191,197],"inspection":[88],"systems":[91],"can":[93,171,188],"be":[94,189],"easily":[95],"integrated":[96],"into":[97],"existing":[98],"machines.":[99],"A":[100],"container":[101],"file":[102],"stores":[103],"calibration":[104],"images":[105,109,155],"all":[107],"one":[111],"(powder":[114],"melt":[116],"result)":[117],"corresponding":[119],"metadata":[120],"(acquisition":[121],"parameters)":[124],"documentation":[126],"further":[128],"analysis.":[129],"We":[130],"evaluate":[131],"resolving":[133],"power":[134],"our":[136,169],"show":[140,167],"it":[142],"able":[144,177],"inspect":[146,179],"result":[149],"on":[150],"microscopic":[152],"scale.":[153],"Sample":[154],"built":[159,184],"varied":[161],"parameters":[163],"are":[164],"provided,":[165],"detect":[172],"topological":[173],"flaws":[174],"surface":[181],"layers.":[185],"The":[186],"results":[187],"used":[190],"flaw":[192],"detection":[193],"parameter":[195],"optimization,":[196],"example":[198],"material":[200],"qualification.":[201]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":11},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":13},{"year":2017,"cited_by_count":14},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}