{"id":"https://openalex.org/W7133553559","doi":"https://doi.org/10.1109/hpca68181.2026.11408597","title":"Exploration of LLM Workload Reliability Based on di/dt Effects and Voltage Droops","display_name":"Exploration of LLM Workload Reliability Based on di/dt Effects and Voltage Droops","publication_year":2026,"publication_date":"2026-01-31","ids":{"openalex":"https://openalex.org/W7133553559","doi":"https://doi.org/10.1109/hpca68181.2026.11408597"},"language":null,"primary_location":{"id":"doi:10.1109/hpca68181.2026.11408597","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hpca68181.2026.11408597","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Symposium on High Performance Computer Architecture (HPCA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5107935939","display_name":"Zhixing Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Zhixing Jiang","raw_affiliation_strings":["University of Texas-Austin"],"affiliations":[{"raw_affiliation_string":"University of Texas-Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5092254691","display_name":"Justin Garrigus","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Justin Garrigus","raw_affiliation_strings":["University of Texas-Austin"],"affiliations":[{"raw_affiliation_string":"University of Texas-Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5096171706","display_name":"Allison Seigler","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Allison Seigler","raw_affiliation_strings":["University of Texas-Austin"],"affiliations":[{"raw_affiliation_string":"University of Texas-Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128074642","display_name":"Ethan Syed","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ethan Syed","raw_affiliation_strings":["University of Texas-Austin"],"affiliations":[{"raw_affiliation_string":"University of Texas-Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128081490","display_name":"Yan-Lun Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yan-Lun Huang","raw_affiliation_strings":["University of Texas-Austin"],"affiliations":[{"raw_affiliation_string":"University of Texas-Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036369307","display_name":"Mehdi Sadi","orcid":"https://orcid.org/0000-0002-0468-7810"},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mehdi Sadi","raw_affiliation_strings":["Advanced Micro Devices, Inc"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114732504","display_name":"Tawfik Rahal-Arabi","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Tawfik Rahal-Arabi","raw_affiliation_strings":["Advanced Micro Devices, Inc"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068885069","display_name":"Lizy K. John","orcid":"https://orcid.org/0000-0002-8747-5214"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lizy Kurian John","raw_affiliation_strings":["University of Texas-Austin"],"affiliations":[{"raw_affiliation_string":"University of Texas-Austin","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5107935939"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.55583728,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"15"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.19480000436306,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.19480000436306,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.13099999725818634,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.11020000278949738,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6894000172615051},{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.49219998717308044},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3425999879837036},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2890999913215637},{"id":"https://openalex.org/keywords/downtime","display_name":"Downtime","score":0.24770000576972961}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6894000172615051},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6489999890327454},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5612000226974487},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.49219998717308044},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3425999879837036},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32910001277923584},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2890999913215637},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2612000107765198},{"id":"https://openalex.org/C180591934","wikidata":"https://www.wikidata.org/wiki/Q1253369","display_name":"Downtime","level":2,"score":0.24770000576972961},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.23680000007152557}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/hpca68181.2026.11408597","is_oa":false,"landing_page_url":"https://doi.org/10.1109/hpca68181.2026.11408597","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Symposium on High Performance Computer Architecture (HPCA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7414139737","display_name":null,"funder_award_id":"3281.001","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"}],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1972489788","https://openalex.org/W1977476862","https://openalex.org/W1994172067","https://openalex.org/W2017099699","https://openalex.org/W2023304380","https://openalex.org/W2023571465","https://openalex.org/W2034117033","https://openalex.org/W2068766249","https://openalex.org/W2070015279","https://openalex.org/W2085503707","https://openalex.org/W2093985935","https://openalex.org/W2114937530","https://openalex.org/W2130720335","https://openalex.org/W2148952606","https://openalex.org/W2157722621","https://openalex.org/W2235375535","https://openalex.org/W2322662801","https://openalex.org/W2418749065","https://openalex.org/W2507985825","https://openalex.org/W2529252381","https://openalex.org/W2588191434","https://openalex.org/W2788706082","https://openalex.org/W2904147273","https://openalex.org/W3005780259","https://openalex.org/W3102510044","https://openalex.org/W3129927603","https://openalex.org/W3143229551","https://openalex.org/W3149198689","https://openalex.org/W3171842021","https://openalex.org/W3190774216","https://openalex.org/W3206857466","https://openalex.org/W4237720872","https://openalex.org/W4247985497","https://openalex.org/W4249633267","https://openalex.org/W4254048799","https://openalex.org/W4312425733","https://openalex.org/W4377710643","https://openalex.org/W4387321084","https://openalex.org/W4389476192","https://openalex.org/W4393591574","https://openalex.org/W4405846648"],"related_works":[],"abstract_inverted_index":{"Large":[0],"language":[1],"model":[2],"(LLM)":[3],"inference":[4],"workloads":[5,74,108,149],"have":[6],"emerged":[7],"as":[8],"a":[9,33,44,102,123,169,206],"critical":[10,140],"reliability":[11,192,212],"challenge":[12],"for":[13],"cloud":[14,215],"GPU":[15,85,211],"systems.":[16],"Unlike":[17],"traditional":[18],"workloads,":[19,138],"the":[20,40,63,79,197],"highly":[21],"structured":[22],"execution":[23],"of":[24,43,67,201],"LLMs":[25],"creates":[26],"large":[27],"power":[28,46,69,112,179],"oscillations.":[29],"These":[30],"oscillations":[31,113],"become":[32],"vulnerability":[34],"when":[35],"their":[36],"frequency":[37,125],"aligns":[38],"with":[39,83,109],"resonant":[41,87,124],"modes":[42],"GPU's":[45],"delivery":[47],"network":[48],"(PDN),":[49],"leading":[50,90],"to":[51,91,130,209],"excessive":[52,92],"voltage":[53,93,115,127,157,188],"droops":[54,128,158,189],"and":[55,89,114,190,204],"unreliable":[56],"operation.":[57],"In":[58],"this":[59,98,175],"work,":[60],"we":[61,100,144,167],"present":[62],"first":[64,198],"comprehensive":[65],"profiling":[66],"LLM-induced":[68],"oscillations,":[70],"revealing":[71],"that":[72,106,120,146,173],"many":[73],"generate":[75,155],"oscillatory":[76],"patterns":[77],"in":[78,213],"MHz":[80],"range-critically":[81],"aligning":[82],"typical":[84],"PDN":[86],"frequencies":[88,154,181],"droops.":[94,116],"To":[95],"systematically":[96],"investigate":[97],"phenomenon,":[99],"developed":[101],"novel":[103],"stressmark":[104],"framework":[105],"generates":[107],"controllable,":[110],"high-frequency":[111],"Our":[117],"evaluation":[118],"shows":[119],"operating":[121,150],"at":[122],"induces":[126],"up":[129],"<tex":[131],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[132],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$2":[133],"\\times$</tex>":[134],"larger":[135],"than":[136,160],"conventional":[137],"exceeding":[139],"noise":[141],"margins.":[142],"Critically,":[143],"find":[145],"real":[147],"LLM":[148],"even":[151],"near":[152],"these":[153,165],"significant":[156],"greater":[159],"100":[161],"mV.":[162],"Based":[163],"on":[164],"findings,":[166],"propose":[168],"kernel":[170],"staggering":[171],"technique":[172],"mitigates":[174],"threat":[176],"by":[177],"shifting":[178],"oscillation":[180],"away":[182],"from":[183],"resonance":[184,203],"frequency,":[185],"successfully":[186],"reducing":[187,191],"concerns.":[193],"This":[194],"work":[195],"provides":[196],"systematic":[199],"understanding":[200],"LLM-PDN":[202],"offers":[205],"practical":[207],"solution":[208],"improve":[210],"AI":[214],"environments.":[216]},"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2026-03-05T00:00:00"}