{"id":"https://openalex.org/W1485942900","doi":"https://doi.org/10.1109/ets.2015.7138764","title":"A fault tolerant response analyzer with self-error-correction capability","display_name":"A fault tolerant response analyzer with self-error-correction capability","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1485942900","doi":"https://doi.org/10.1109/ets.2015.7138764","mag":"1485942900"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2015.7138764","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2015.7138764","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 20th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112415279","display_name":"Yuki Fukazawa","orcid":null},"institutions":[{"id":"https://openalex.org/I178574317","display_name":"Mie University","ror":"https://ror.org/01529vy56","country_code":"JP","type":"education","lineage":["https://openalex.org/I178574317"]},{"id":"https://openalex.org/I57930482","display_name":"Hiroshima City University","ror":"https://ror.org/001et4e78","country_code":"JP","type":"education","lineage":["https://openalex.org/I57930482"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuki Fukazawa","raw_affiliation_strings":["Graduate School of Engineering, Mie University, Tsu City, Japan","Graduate School of Information Sciences, Hiroshima City University, Hiroshima City, Hiroshima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Mie University, Tsu City, Japan","institution_ids":["https://openalex.org/I178574317"]},{"raw_affiliation_string":"Graduate School of Information Sciences, Hiroshima City University, Hiroshima City, Hiroshima, Japan","institution_ids":["https://openalex.org/I57930482"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011082635","display_name":"Hideyuki Ichihara","orcid":"https://orcid.org/0000-0002-2363-1636"},"institutions":[{"id":"https://openalex.org/I178574317","display_name":"Mie University","ror":"https://ror.org/01529vy56","country_code":"JP","type":"education","lineage":["https://openalex.org/I178574317"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideyuki Ichihara","raw_affiliation_strings":["Graduate School of Engineering, Mie University, Tsu City, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Mie University, Tsu City, Japan","institution_ids":["https://openalex.org/I178574317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058536471","display_name":"Tomoo Inoue","orcid":"https://orcid.org/0000-0003-3600-214X"},"institutions":[{"id":"https://openalex.org/I178574317","display_name":"Mie University","ror":"https://ror.org/01529vy56","country_code":"JP","type":"education","lineage":["https://openalex.org/I178574317"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomoo Inoue","raw_affiliation_strings":["Graduate School of Engineering, Mie University, Tsu City, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Mie University, Tsu City, Japan","institution_ids":["https://openalex.org/I178574317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.01899827,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.9078467488288879},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.670635461807251},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.6468946933746338},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6077870726585388},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5944585800170898},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5736975073814392},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.5581545829772949},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5514758229255676},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5423775911331177},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.49927639961242676},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.454550176858902},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.43967944383621216},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.428505003452301},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.42813044786453247},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.41348177194595337},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34266436100006104},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3338800072669983},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22933006286621094},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.15734991431236267},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.15210095047950745},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11581540107727051},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07574361562728882},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06522434949874878}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.9078467488288879},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.670635461807251},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.6468946933746338},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6077870726585388},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5944585800170898},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5736975073814392},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.5581545829772949},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5514758229255676},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5423775911331177},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.49927639961242676},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.454550176858902},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.43967944383621216},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.428505003452301},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.42813044786453247},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.41348177194595337},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34266436100006104},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3338800072669983},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22933006286621094},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.15734991431236267},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.15210095047950745},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11581540107727051},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07574361562728882},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06522434949874878},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2015.7138764","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2015.7138764","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 20th IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1534925464","https://openalex.org/W2012783077","https://openalex.org/W2145136265","https://openalex.org/W2169213530"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2078707653","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2782341877","https://openalex.org/W2593605297","https://openalex.org/W2969553121","https://openalex.org/W2989159162","https://openalex.org/W1553526993"],"abstract_inverted_index":{"Reliable":[0],"built-in":[1],"self-test":[2],"(Reliable":[3],"BIST)":[4],"scheme":[5],"equips":[6],"to":[7,25,60],"be":[8],"tolerant":[9],"of":[10,31,56],"faults,":[11],"which":[12],"occur":[13,69],"in":[14,70],"embedded":[15,33],"BIST":[16,34,49],"circuits.":[17,35],"To":[18],"realize":[19],"reliable":[20,48],"BIST,":[21],"it":[22],"is":[23,58],"required":[24],"recover":[26],"itself":[27],"from":[28],"transient":[29,67],"errors":[30],"its":[32],"In":[36],"this":[37],"paper,":[38],"we":[39],"propose":[40],"a":[41,47],"self-error-correctable":[42],"response":[43],"analyzer":[44],"(RA)":[45],"for":[46],"scheme.":[50],"Experimental":[51],"results":[52],"show":[53],"that":[54,66],"test-reliability":[55],"SECRA":[57],"superior":[59],"TMR":[61],"MISRs":[62],"on":[63],"the":[64],"assumption":[65],"faults":[68],"RA":[71],"during":[72],"testing":[73],"CUTs.":[74]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}