{"id":"https://openalex.org/W2980392321","doi":"https://doi.org/10.1109/etfa.2019.8869514","title":"Anomaly Detection with Root Cause Analysis for Bottling Process","display_name":"Anomaly Detection with Root Cause Analysis for Bottling Process","publication_year":2019,"publication_date":"2019-09-01","ids":{"openalex":"https://openalex.org/W2980392321","doi":"https://doi.org/10.1109/etfa.2019.8869514","mag":"2980392321"},"language":"en","primary_location":{"id":"doi:10.1109/etfa.2019.8869514","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2019.8869514","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038554437","display_name":"Martyna Bator","orcid":null},"institutions":[{"id":"https://openalex.org/I5209920","display_name":"Ostwestfalen-Lippe University of Applied Sciences and Arts","ror":"https://ror.org/04eka8j06","country_code":"DE","type":"education","lineage":["https://openalex.org/I5209920"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Martyna Bator","raw_affiliation_strings":["inIT \u2212 Institute Industrial IT, Technische Hochschule Ostwestfalen-Lippe, Lemgo, Germany"],"affiliations":[{"raw_affiliation_string":"inIT \u2212 Institute Industrial IT, Technische Hochschule Ostwestfalen-Lippe, Lemgo, Germany","institution_ids":["https://openalex.org/I5209920"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067755045","display_name":"Alexander Dicks","orcid":"https://orcid.org/0000-0002-0253-9021"},"institutions":[{"id":"https://openalex.org/I5209920","display_name":"Ostwestfalen-Lippe University of Applied Sciences and Arts","ror":"https://ror.org/04eka8j06","country_code":"DE","type":"education","lineage":["https://openalex.org/I5209920"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Alexander Dicks","raw_affiliation_strings":["inIT \u2212 Institute Industrial IT, Technische Hochschule Ostwestfalen-Lippe, Lemgo, Germany"],"affiliations":[{"raw_affiliation_string":"inIT \u2212 Institute Industrial IT, Technische Hochschule Ostwestfalen-Lippe, Lemgo, Germany","institution_ids":["https://openalex.org/I5209920"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008156697","display_name":"Sahar Deppe","orcid":null},"institutions":[{"id":"https://openalex.org/I5209920","display_name":"Ostwestfalen-Lippe University of Applied Sciences and Arts","ror":"https://ror.org/04eka8j06","country_code":"DE","type":"education","lineage":["https://openalex.org/I5209920"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sahar Deppe","raw_affiliation_strings":["inIT \u2212 Institute Industrial IT, Technische Hochschule Ostwestfalen-Lippe, Lemgo, Germany"],"affiliations":[{"raw_affiliation_string":"inIT \u2212 Institute Industrial IT, Technische Hochschule Ostwestfalen-Lippe, Lemgo, Germany","institution_ids":["https://openalex.org/I5209920"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003230577","display_name":"Volker Lohweg","orcid":"https://orcid.org/0000-0002-3325-7887"},"institutions":[{"id":"https://openalex.org/I5209920","display_name":"Ostwestfalen-Lippe University of Applied Sciences and Arts","ror":"https://ror.org/04eka8j06","country_code":"DE","type":"education","lineage":["https://openalex.org/I5209920"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Volker Lohweg","raw_affiliation_strings":["inIT \u2212 Institute Industrial IT, Technische Hochschule Ostwestfalen-Lippe, Lemgo, Germany"],"affiliations":[{"raw_affiliation_string":"inIT \u2212 Institute Industrial IT, Technische Hochschule Ostwestfalen-Lippe, Lemgo, Germany","institution_ids":["https://openalex.org/I5209920"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5038554437"],"corresponding_institution_ids":["https://openalex.org/I5209920"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.12572776,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1619","last_page":"1622"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.977400004863739,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/root-cause-analysis","display_name":"Root cause analysis","score":0.9022376537322998},{"id":"https://openalex.org/keywords/bottling-line","display_name":"Bottling line","score":0.801597535610199},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.7727923393249512},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.6840280294418335},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6231280565261841},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5861085653305054},{"id":"https://openalex.org/keywords/root","display_name":"Root (linguistics)","score":0.5636845231056213},{"id":"https://openalex.org/keywords/anomaly","display_name":"Anomaly (physics)","score":0.49525919556617737},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3142397999763489},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.28753387928009033},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2703656554222107}],"concepts":[{"id":"https://openalex.org/C130963320","wikidata":"https://www.wikidata.org/wiki/Q1401207","display_name":"Root cause analysis","level":2,"score":0.9022376537322998},{"id":"https://openalex.org/C128058530","wikidata":"https://www.wikidata.org/wiki/Q320096","display_name":"Bottling line","level":3,"score":0.801597535610199},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.7727923393249512},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.6840280294418335},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6231280565261841},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5861085653305054},{"id":"https://openalex.org/C171078966","wikidata":"https://www.wikidata.org/wiki/Q111029","display_name":"Root (linguistics)","level":2,"score":0.5636845231056213},{"id":"https://openalex.org/C12997251","wikidata":"https://www.wikidata.org/wiki/Q567560","display_name":"Anomaly (physics)","level":2,"score":0.49525919556617737},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3142397999763489},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.28753387928009033},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2703656554222107},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C32236832","wikidata":"https://www.wikidata.org/wiki/Q80228","display_name":"Bottle","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etfa.2019.8869514","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etfa.2019.8869514","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6399999856948853}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W207309682","https://openalex.org/W1558748187","https://openalex.org/W1963591630","https://openalex.org/W1989270581","https://openalex.org/W2102605237","https://openalex.org/W2132870739","https://openalex.org/W2488388819","https://openalex.org/W2613480438","https://openalex.org/W2753935149","https://openalex.org/W2760345791","https://openalex.org/W2899355044"],"related_works":["https://openalex.org/W2030594396","https://openalex.org/W2535098331","https://openalex.org/W3045668461","https://openalex.org/W2056250485","https://openalex.org/W2202104725","https://openalex.org/W4255366506","https://openalex.org/W4280640835","https://openalex.org/W2885334669","https://openalex.org/W2111856191","https://openalex.org/W4230518569"],"abstract_inverted_index":{"In":[0,39,70],"the":[1,6,25,36,46,79,87],"filling":[2,37,102],"and":[3,12,24,32,85],"packaging":[4],"industry,":[5],"trend":[7],"is":[8,19,48,76,97],"towards":[9],"self-diagnosis,":[10],"optimization,":[11],"quality":[13],"monitoring":[14,31],"of":[15,35,45,81,90,94],"processes.":[16],"The":[17,92],"aim":[18],"to":[20],"increase":[21],"production":[22],"volumes":[23],"quality.":[26],"These":[27],"concepts":[28],"require":[29],"continuous":[30],"anomaly":[33,61],"detection":[34,62,80],"process.":[38,103],"addition,":[40],"a":[41,73,100],"root":[42,67],"cause":[43,68],"analysis":[44],"failure":[47,53,88],"required":[49],"because":[50],"not":[51],"every":[52],"can":[54],"be":[55],"simulated":[56],"or":[57],"measured":[58],"previously.":[59],"Standard":[60],"methods":[63],"have":[64],"no":[65],"integrated":[66],"analysis.":[69],"this":[71,95],"paper":[72],"fusion":[74],"system":[75],"utilises":[77],"for":[78],"different":[82],"unknown":[83],"anomalies":[84],"also":[86],"source":[89],"them.":[91],"performance":[93],"method":[96],"benchmarked":[98],"with":[99],"real-word":[101]},"counts_by_year":[{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}