{"id":"https://openalex.org/W3204187037","doi":"https://doi.org/10.1109/dtpi52967.2021.9540139","title":"Circuit design and waveform analysis of partial discharge ultrasonic sensor based on parallel systems","display_name":"Circuit design and waveform analysis of partial discharge ultrasonic sensor based on parallel systems","publication_year":2021,"publication_date":"2021-07-15","ids":{"openalex":"https://openalex.org/W3204187037","doi":"https://doi.org/10.1109/dtpi52967.2021.9540139","mag":"3204187037"},"language":"en","primary_location":{"id":"doi:10.1109/dtpi52967.2021.9540139","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dtpi52967.2021.9540139","pdf_url":null,"source":{"id":"https://openalex.org/S4306498799","display_name":"2021 IEEE 1st International Conference on Digital Twins and Parallel Intelligence (DTPI)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 1st International Conference on Digital Twins and Parallel Intelligence (DTPI)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100420969","display_name":"Yuhang Liu","orcid":"https://orcid.org/0009-0001-5380-6927"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhang Liu","raw_affiliation_strings":["Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043336332","display_name":"Yonglin Tian","orcid":"https://orcid.org/0000-0003-1911-5791"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yonglin Tian","raw_affiliation_strings":["University of Science and Technology of China, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113600509","display_name":"Fei\u2013Yue Wang","orcid":"https://orcid.org/0000-0001-9185-3989"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210094879","display_name":"Shandong Institute of Automation","ror":"https://ror.org/00qdtba35","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210094879","https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei-Yue Wang","raw_affiliation_strings":["Institute of Automation, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Automation, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210094879"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8647,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.71464887,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"7","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ultrasonic-sensor","display_name":"Ultrasonic sensor","score":0.8272410035133362},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.8239315748214722},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.663465142250061},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5951635241508484},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47436556220054626},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3275824189186096},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3252456784248352},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2911481261253357},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23699843883514404}],"concepts":[{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.8272410035133362},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.8239315748214722},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.663465142250061},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5951635241508484},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47436556220054626},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3275824189186096},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3252456784248352},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2911481261253357},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23699843883514404},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dtpi52967.2021.9540139","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dtpi52967.2021.9540139","pdf_url":null,"source":{"id":"https://openalex.org/S4306498799","display_name":"2021 IEEE 1st International Conference on Digital Twins and Parallel Intelligence (DTPI)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE 1st International Conference on Digital Twins and Parallel Intelligence (DTPI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6499999761581421}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2002610002","https://openalex.org/W2111396747","https://openalex.org/W2133747588","https://openalex.org/W2324071574","https://openalex.org/W2361439446","https://openalex.org/W2385410907","https://openalex.org/W2550169503"],"related_works":["https://openalex.org/W2391920328","https://openalex.org/W3061051060","https://openalex.org/W2364758274","https://openalex.org/W2383478010","https://openalex.org/W2369232117","https://openalex.org/W1980801786","https://openalex.org/W2606267229","https://openalex.org/W2362171953","https://openalex.org/W4312344449","https://openalex.org/W1978065794"],"abstract_inverted_index":{"Partial":[0],"discharge":[1],"is":[2,10,45,55],"a":[3,14],"common":[4],"harmful":[5],"phenomenon":[6],"in":[7,48],"industry,":[8],"it":[9],"necessary":[11],"to":[12,31,60],"establish":[13],"distributed":[15],"low-cost":[16],"online":[17],"monitoring":[18],"system.":[19,51],"In":[20],"this":[21],"essay,":[22],"we":[23],"use":[24],"ACP":[25],"theory":[26],"of":[27],"parallel":[28],"systems":[29],"[1]":[30],"design":[32],"the":[33,38,42,49,53,58,62],"measurement":[34],"conversion":[35],"circuit":[36],"for":[37],"ultrasonic":[39],"sensor,":[40],"moreover,":[41],"experimental":[43],"verification":[44],"carried":[46],"out":[47],"actual":[50],"Finally,":[52],"algorithm":[54],"designed":[56],"on":[57],"PC":[59],"extract":[61],"characteristic":[63],"parameters":[64],"effectively,":[65],"which":[66],"has":[67],"obtained":[68],"good":[69],"results.":[70]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}
