{"id":"https://openalex.org/W4401071728","doi":"https://doi.org/10.1109/drc61706.2024.10605539","title":"Improved Mobility Extraction for Transistors with Gated Contacts","display_name":"Improved Mobility Extraction for Transistors with Gated Contacts","publication_year":2024,"publication_date":"2024-06-24","ids":{"openalex":"https://openalex.org/W4401071728","doi":"https://doi.org/10.1109/drc61706.2024.10605539"},"language":"en","primary_location":{"id":"doi:10.1109/drc61706.2024.10605539","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/drc61706.2024.10605539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 Device Research Conference (DRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084302737","display_name":"Robert K. A. Bennett","orcid":"https://orcid.org/0000-0001-7427-8724"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Robert K.A. Bennett","raw_affiliation_strings":["Stanford University,Electrical Eng.,Stanford,CA,USA,94305"],"affiliations":[{"raw_affiliation_string":"Stanford University,Electrical Eng.,Stanford,CA,USA,94305","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018354165","display_name":"Lauren Hoang","orcid":"https://orcid.org/0009-0001-7556-8560"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lauren Hoang","raw_affiliation_strings":["Stanford University,Electrical Eng.,Stanford,CA,USA,94305"],"affiliations":[{"raw_affiliation_string":"Stanford University,Electrical Eng.,Stanford,CA,USA,94305","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102663302","display_name":"Connor Cremers","orcid":null},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Connor Cremers","raw_affiliation_strings":["Stanford University,Electrical Eng.,Stanford,CA,USA,94305"],"affiliations":[{"raw_affiliation_string":"Stanford University,Electrical Eng.,Stanford,CA,USA,94305","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055435906","display_name":"Andrew J. Mannix","orcid":"https://orcid.org/0000-0003-4788-1506"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew J. Mannix","raw_affiliation_strings":["Stanford University,Mat. Sci. Eng.,Stanford,CA,USA,94305"],"affiliations":[{"raw_affiliation_string":"Stanford University,Mat. Sci. Eng.,Stanford,CA,USA,94305","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051662579","display_name":"Eric Pop","orcid":"https://orcid.org/0000-0003-0436-8534"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eric Pop","raw_affiliation_strings":["Stanford University,Electrical Eng.,Stanford,CA,USA,94305"],"affiliations":[{"raw_affiliation_string":"Stanford University,Electrical Eng.,Stanford,CA,USA,94305","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5084302737"],"corresponding_institution_ids":["https://openalex.org/I97018004"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11038795,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9829000234603882,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6338534355163574},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.5536679029464722},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.520232081413269},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5123952031135559},{"id":"https://openalex.org/keywords/electron-mobility","display_name":"Electron mobility","score":0.4327971935272217},{"id":"https://openalex.org/keywords/electrical-mobility","display_name":"Electrical mobility","score":0.414014995098114},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3958970904350281},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34435582160949707},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34285467863082886},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11556476354598999},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10467004776000977},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.07253801822662354},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07206684350967407}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6338534355163574},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.5536679029464722},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.520232081413269},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5123952031135559},{"id":"https://openalex.org/C106782819","wikidata":"https://www.wikidata.org/wiki/Q6501076","display_name":"Electron mobility","level":2,"score":0.4327971935272217},{"id":"https://openalex.org/C50067584","wikidata":"https://www.wikidata.org/wiki/Q900648","display_name":"Electrical mobility","level":3,"score":0.414014995098114},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3958970904350281},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34435582160949707},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34285467863082886},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11556476354598999},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10467004776000977},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.07253801822662354},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07206684350967407},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/drc61706.2024.10605539","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/drc61706.2024.10605539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 Device Research Conference (DRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1977488080","https://openalex.org/W2902506738","https://openalex.org/W2090311027","https://openalex.org/W1654810322","https://openalex.org/W2492706295","https://openalex.org/W2086984145","https://openalex.org/W2542848973","https://openalex.org/W2108830266","https://openalex.org/W2332233475","https://openalex.org/W2091475318"],"abstract_inverted_index":{"Researchers":[0],"often":[1],"estimate":[2],"charge":[3],"carrier":[4,37],"mobilities":[5],"(":[6,51,91],"\u03bc":[7,66,145,165],")":[8,54],"of":[9,67,143],"emerging":[10],"semiconductors":[11],"(e.g.,":[12],"2D,":[13],"oxide,":[14],"organic":[15],"semiconductors)":[16],"by":[17,70],"measuring":[18],"back-gated":[19,68],"field-effect":[20],"transistors":[21],"(FETs).":[22],"However,":[23],"such":[24],"devices":[25],"experience":[26],"contact":[27,45,170],"gating:":[28],"the":[29,33,36,40,44],"electric":[30],"field":[31],"from":[32],"back-gate":[34],"modulates":[35],"density":[38],"at":[39,85,157],"contacts,":[41],"dynamically":[42],"changing":[43],"resistance":[46],"R":[47,122,150],"C":[48,123,151],"during":[49],"measurements":[50],"Fig.":[52,92],"1":[53,56,74,93],"[":[55,73],"\u2013":[57,75],"5":[58],"]":[59,77],".":[60,78,136],"Consequently,":[61],"various":[62],"techniques":[63],"can":[64,82,119],"overestimate":[65],"FETs":[69,107,147],"even":[71,167],"2\u201310\u00d7":[72],"3":[76],"Though":[79],"this":[80,101],"effect":[81],"be":[83,104],"minimized":[84],"high":[86,158],"|":[87,90,159],"V":[88,160],"gs":[89,161],",":[94,98,100],"Region":[95],"III)":[96],"[2":[97],"3]":[99],"regime":[102],"may":[103],"inaccessible":[105],"for":[106,121],"with":[108,148,168],"large":[109],"Schottky":[110],"barrier":[111],"contacts":[112],"or":[113,132],"early":[114],"dielectric":[115],"breakdown.":[116],"Four-terminal":[117],"geometries":[118],"correct":[120],"gating":[124],"[6]":[125],"but":[126],"require":[127,155],"care":[128],"to":[129],"avoid":[130],"shunting":[131],"invasive":[133],"probes":[134],"[7]":[135],"Thus,":[137],"here":[138],"we":[139],"propose":[140],"a":[141],"method":[142],"extracting":[144],"in":[146],"gate-dependent":[149],"that":[152],"does":[153],"not":[154],"operation":[156],"|,":[162],"enabling":[163],"accurate":[164],"extraction":[166],"strong":[169],"gating.":[171]},"counts_by_year":[],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}