{"id":"https://openalex.org/W2134887864","doi":"https://doi.org/10.1109/dftvs.2003.1250156","title":"Fault tolerant design of combinational and sequential logic based on a parity check code","display_name":"Fault tolerant design of combinational and sequential logic based on a parity check code","publication_year":2004,"publication_date":"2004-03-01","ids":{"openalex":"https://openalex.org/W2134887864","doi":"https://doi.org/10.1109/dftvs.2003.1250156","mag":"2134887864"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2003.1250156","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250156","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067901099","display_name":"Sobeeh Almukhaizim","orcid":null},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. Almukhaizim","raw_affiliation_strings":["Electrical Engineering Department, Yale University, USA","[Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA]"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Yale University, USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA]","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078818440","display_name":"Yiorgos Makris","orcid":"https://orcid.org/0000-0002-4322-0068"},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Makris","raw_affiliation_strings":["Electrical Engineering Department, Yale University, USA","[Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA]"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Yale University, USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA]","institution_ids":["https://openalex.org/I32971472"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5067901099"],"corresponding_institution_ids":["https://openalex.org/I32971472"],"apc_list":null,"apc_paid":null,"fwci":2.6333,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.89875997,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"563","last_page":"570"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6942797899246216},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.6920669078826904},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6237950325012207},{"id":"https://openalex.org/keywords/parity-bit","display_name":"Parity bit","score":0.5792614221572876},{"id":"https://openalex.org/keywords/extension","display_name":"Extension (predicate logic)","score":0.5383909940719604},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5211508274078369},{"id":"https://openalex.org/keywords/parity","display_name":"Parity (physics)","score":0.4936619699001312},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4580309987068176},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.454842209815979},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4480571448802948},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4341789484024048},{"id":"https://openalex.org/keywords/low-density-parity-check-code","display_name":"Low-density parity-check code","score":0.4251052141189575},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.42049407958984375},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.37793341279029846},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.3556859493255615},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3360539674758911},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.19643980264663696},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1609085500240326},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.1461467444896698},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14390850067138672},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08730477094650269}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6942797899246216},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.6920669078826904},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6237950325012207},{"id":"https://openalex.org/C131521367","wikidata":"https://www.wikidata.org/wiki/Q625502","display_name":"Parity bit","level":2,"score":0.5792614221572876},{"id":"https://openalex.org/C2778029271","wikidata":"https://www.wikidata.org/wiki/Q5421931","display_name":"Extension (predicate logic)","level":2,"score":0.5383909940719604},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5211508274078369},{"id":"https://openalex.org/C2777151079","wikidata":"https://www.wikidata.org/wiki/Q141160","display_name":"Parity (physics)","level":2,"score":0.4936619699001312},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4580309987068176},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.454842209815979},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4480571448802948},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4341789484024048},{"id":"https://openalex.org/C67692717","wikidata":"https://www.wikidata.org/wiki/Q187444","display_name":"Low-density parity-check code","level":3,"score":0.4251052141189575},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.42049407958984375},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.37793341279029846},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3556859493255615},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3360539674758911},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.19643980264663696},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1609085500240326},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.1461467444896698},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14390850067138672},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08730477094650269},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C109214941","wikidata":"https://www.wikidata.org/wiki/Q18334","display_name":"Particle physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dftvs.2003.1250156","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250156","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1511688816","https://openalex.org/W2044618379","https://openalex.org/W2116587035","https://openalex.org/W2118133071","https://openalex.org/W2120185818","https://openalex.org/W2122819799","https://openalex.org/W2130969484","https://openalex.org/W2133687702","https://openalex.org/W2162874773","https://openalex.org/W2971174528","https://openalex.org/W6630623413","https://openalex.org/W6679753974"],"related_works":["https://openalex.org/W10879606","https://openalex.org/W1995335316","https://openalex.org/W2306469233","https://openalex.org/W2142519941","https://openalex.org/W2065356549","https://openalex.org/W4246237793","https://openalex.org/W2118844295","https://openalex.org/W4400983058","https://openalex.org/W2181665053","https://openalex.org/W2124455219"],"abstract_inverted_index":{"We":[0],"describe":[1],"a":[2,14,58,67,82],"method":[3,80],"for":[4,85],"designing":[5,86],"fault":[6,69,87],"tolerant":[7,70,88],"circuits":[8],"based":[9],"on":[10],"an":[11],"extension":[12,22],"of":[13,49,57,77],"concurrent":[15],"error":[16,35],"detection":[17,36],"(CED)":[18],"technique.":[19],"The":[20],"proposed":[21,79],"combines":[23],"parity":[24,63],"check":[25,64],"codes":[26,65],"and":[27,41,54],"duplication":[28],"in":[29],"order":[30],"to":[31],"not":[32],"only":[33],"perform":[34],"but":[37],"also":[38],"provide":[39],"diagnosis":[40],"correction":[42],"capabilities.":[43],"Informed":[44],"selection":[45],"among":[46],"the":[47,50,55,75,78],"outputs":[48,56],"original":[51],"synthesized":[52],"circuit":[53],"constrained-sharing":[59],"resynthesized":[60],"duplicate":[61],"with":[62],"renders":[66],"low-cost":[68],"design.":[71],"Experimental":[72],"results":[73],"confirm":[74],"efficacy":[76],"as":[81],"general":[83],"solution":[84],"circuits.":[89]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}