{"id":"https://openalex.org/W1539888992","doi":"https://doi.org/10.1109/dftvs.2003.1250147","title":"Dependability analysis using a fault injection tool based on synthesizability of HDL models","display_name":"Dependability analysis using a fault injection tool based on synthesizability of HDL models","publication_year":2004,"publication_date":"2004-03-02","ids":{"openalex":"https://openalex.org/W1539888992","doi":"https://doi.org/10.1109/dftvs.2003.1250147","mag":"1539888992"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2003.1250147","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250147","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000749075","display_name":"Hamid R. Zarandi","orcid":"https://orcid.org/0000-0003-1385-4171"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"H.R. Zarandi","raw_affiliation_strings":["Department of Computer Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065918596","display_name":"Seyed Ghassem Miremadi","orcid":"https://orcid.org/0000-0003-4347-4380"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"S.G. Miremadi","raw_affiliation_strings":["Department of Computer Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005928293","display_name":"Alireza Ejlali","orcid":"https://orcid.org/0000-0002-5661-3629"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"A. Ejlali","raw_affiliation_strings":["Department of Computer Engineering, Sharif University of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5000749075"],"corresponding_institution_ids":["https://openalex.org/I133529467"],"apc_list":null,"apc_paid":null,"fwci":2.6332,"has_fulltext":false,"cited_by_count":65,"citation_normalized_percentile":{"value":0.88901746,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"485","last_page":"492"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.8558236956596375},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.8270201683044434},{"id":"https://openalex.org/keywords/verilog","display_name":"Verilog","score":0.789736270904541},{"id":"https://openalex.org/keywords/vhdl","display_name":"VHDL","score":0.7686418294906616},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7036713361740112},{"id":"https://openalex.org/keywords/hardware-description-language","display_name":"Hardware description language","score":0.6552190184593201},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5981776118278503},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5292619466781616},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5266663432121277},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41014426946640015},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.3287697434425354},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17762413620948792},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.0950024425983429},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.08115509152412415},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.08042415976524353}],"concepts":[{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.8558236956596375},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.8270201683044434},{"id":"https://openalex.org/C2779030575","wikidata":"https://www.wikidata.org/wiki/Q827773","display_name":"Verilog","level":3,"score":0.789736270904541},{"id":"https://openalex.org/C36941000","wikidata":"https://www.wikidata.org/wiki/Q209455","display_name":"VHDL","level":3,"score":0.7686418294906616},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7036713361740112},{"id":"https://openalex.org/C42143788","wikidata":"https://www.wikidata.org/wiki/Q173341","display_name":"Hardware description language","level":3,"score":0.6552190184593201},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5981776118278503},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5292619466781616},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5266663432121277},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41014426946640015},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.3287697434425354},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17762413620948792},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.0950024425983429},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.08115509152412415},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.08042415976524353},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dftvs.2003.1250147","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250147","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1529638834","https://openalex.org/W1619529175","https://openalex.org/W1892111635","https://openalex.org/W1922936492","https://openalex.org/W1994648587","https://openalex.org/W2009194836","https://openalex.org/W2059454390","https://openalex.org/W2072194206","https://openalex.org/W2098513789","https://openalex.org/W2104400227","https://openalex.org/W2120860555","https://openalex.org/W2121655299","https://openalex.org/W2127894564","https://openalex.org/W2133029931","https://openalex.org/W2133692466","https://openalex.org/W2135254996","https://openalex.org/W2135577965","https://openalex.org/W2146579060","https://openalex.org/W2147732182","https://openalex.org/W2159677757","https://openalex.org/W2312852230","https://openalex.org/W4234609313","https://openalex.org/W4235799760","https://openalex.org/W4249274623","https://openalex.org/W6636765528"],"related_works":["https://openalex.org/W2011289549","https://openalex.org/W2107240870","https://openalex.org/W2136295006","https://openalex.org/W2186173565","https://openalex.org/W2130922779","https://openalex.org/W2121043529","https://openalex.org/W2742111403","https://openalex.org/W2185394135","https://openalex.org/W2082366402","https://openalex.org/W2083209667"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,45,65,79,108,116,123],"fault":[4,15,51,53,56,67,70,135,155],"injection":[5,30,71,136],"tool":[6,28],"called":[7,112,126],"SINJECT":[8,63],"that":[9,131],"supports":[10],"several":[11],"synthesizable":[12,124],"and":[13,33,55,75,88,114],"non-synthesizable":[14,109],"models":[16,43],"for":[17],"dependability":[18],"analysis":[19],"of":[20,31,44,78,119,143,152,163],"digital":[21,46],"systems":[22],"modeled":[23],"by":[24,86,92],"popular":[25],"HDLs.":[26],"The":[27,128],"provides":[29,64],"transient":[32],"permanent":[34],"faults":[35,144,165],"into":[36,72],"the":[37,50,62,96,134,139,141,150,154],"Verilog":[38,74,87,110],"as":[39,41],"well":[40],"VHDL":[42,76,117],"circuit":[47],"to":[48,81,160],"study":[49],"behavior,":[52],"propagation":[54],"coverage.":[57],"Moreover,":[58],"using":[59],"specific":[60],"simulators,":[61],"mixed-mode":[66],"injection,":[68],"i.e.,":[69],"both":[73],"parts":[77],"model,":[80,111],"achieve":[82],"high":[83,89],"description":[84],"reality":[85],"capability":[90],"modeling":[91],"VHDL.":[93],"To":[94],"demonstrate":[95],"tool,":[97],"two":[98],"case":[99,151],"studies":[100],"are":[101],"evaluated:":[102],"(1)":[103],"an":[104],"arithmetic":[105],"processor":[106,121],"with":[107,122],"ARP;":[113],"(2)":[115],"model":[118],"32-bit":[120],"ALU,":[125],"DP32.":[127],"results":[129],"show":[130],"depending":[132],"on":[133],"points":[137],"in":[138,149],"ARP,":[140],"effects":[142],"were":[145],"significantly":[146],"different,":[147],"while":[148],"DP32,":[153],"coverage":[156],"varied":[157],"between":[158],"51":[159],"56":[161],"percent":[162],"total":[164],"injected.":[166]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}