{"id":"https://openalex.org/W2118733164","doi":"https://doi.org/10.1109/dftvs.2003.1250144","title":"A memory built-in self-repair for high defect densities based on error polarities","display_name":"A memory built-in self-repair for high defect densities based on error polarities","publication_year":2004,"publication_date":"2004-03-01","ids":{"openalex":"https://openalex.org/W2118733164","doi":"https://doi.org/10.1109/dftvs.2003.1250144","mag":"2118733164"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2003.1250144","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250144","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039513293","display_name":"M. Nicolaidis","orcid":"https://orcid.org/0000-0003-1091-9339"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"M. Nicolaidis","raw_affiliation_strings":["IRoC Technologies","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","IROC TECHNOLOGIES - iROc Technologies (WTC Po Box 1510 Grenoble - France)"],"affiliations":[{"raw_affiliation_string":"IRoC Technologies","institution_ids":[]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"IROC TECHNOLOGIES - iROc Technologies (WTC Po Box 1510 Grenoble - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007621819","display_name":"N. Achouri","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"N. Achouri","raw_affiliation_strings":["IRoC Technologies","IROC TECHNOLOGIES - iROc Technologies (WTC Po Box 1510 Grenoble - France)"],"affiliations":[{"raw_affiliation_string":"IRoC Technologies","institution_ids":[]},{"raw_affiliation_string":"IROC TECHNOLOGIES - iROc Technologies (WTC Po Box 1510 Grenoble - France)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053835664","display_name":"Lorena Anghel","orcid":"https://orcid.org/0000-0001-9569-0072"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Anghel","raw_affiliation_strings":["TIMA laboratory, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"TIMA laboratory, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5039513293"],"corresponding_institution_ids":["https://openalex.org/I4210087012"],"apc_list":null,"apc_paid":null,"fwci":1.6848,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.84632854,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"280","issue":null,"first_page":"459","last_page":"466"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6784781813621521},{"id":"https://openalex.org/keywords/polarity","display_name":"Polarity (international relations)","score":0.6509824991226196},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47530895471572876},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.42111608386039734},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.41141220927238464},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39426088333129883},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.30401766300201416},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14681130647659302}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6784781813621521},{"id":"https://openalex.org/C2777361361","wikidata":"https://www.wikidata.org/wiki/Q1112585","display_name":"Polarity (international relations)","level":3,"score":0.6509824991226196},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47530895471572876},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.42111608386039734},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.41141220927238464},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39426088333129883},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.30401766300201416},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14681130647659302},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C1491633281","wikidata":"https://www.wikidata.org/wiki/Q7868","display_name":"Cell","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dftvs.2003.1250144","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250144","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00005830v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00005830","pdf_url":null,"source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003, Boston, Cambridge, Ma,, United States. pp.459, ⟨10.1109/DFTVS.2003.1250144⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1597839486","https://openalex.org/W1792362277","https://openalex.org/W2022829874","https://openalex.org/W2119239540","https://openalex.org/W2129780639","https://openalex.org/W2134822007","https://openalex.org/W2146295584","https://openalex.org/W2146986220","https://openalex.org/W2162925991","https://openalex.org/W2163439504","https://openalex.org/W2171019527","https://openalex.org/W4229821096","https://openalex.org/W6679523228","https://openalex.org/W6684139715"],"related_works":["https://openalex.org/W2354902965","https://openalex.org/W2400337198","https://openalex.org/W4253101056","https://openalex.org/W4297338612","https://openalex.org/W2294500472","https://openalex.org/W2391994898","https://openalex.org/W2765361972","https://openalex.org/W4210941144","https://openalex.org/W2520716302","https://openalex.org/W1985851087"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,65,68,71,75,79,85,99],"architecture":[4],"of":[5,21,70,78,95,101],"a":[6,29,57,102],"new":[7,48],"memory":[8],"built-in":[9],"self-repair":[10],"approach":[11,49,66],"targeting":[12],"memories":[13,36],"affected":[14],"by":[15,74,93],"high":[16,44],"defect":[17,45],"densities":[18],"(several":[19],"orders":[20],"magnitude":[22],"higher":[23],"than":[24],"in":[25,37],"current":[26],"technologies).":[27],"Such":[28],"repair":[30],"scheme":[31],"is":[32,91],"suitable":[33],"for":[34],"building":[35],"nano-technologies,":[38],"which":[39],"are":[40],"subject":[41],"to":[42,55],"very":[43],"densities.":[46],"The":[47,89],"allows":[50],"combining":[51],"two":[52],"defective":[53],"units":[54,77,83],"create":[56],"fault-free":[58],"unit.":[59],"For":[60],"making":[61],"this":[62],"combination":[63,90],"possible,":[64],"analyses":[67],"polarities":[69],"errors":[72,100],"produced":[73],"faulty":[76],"memory,":[80],"and":[81],"combines":[82],"producing":[84],"same":[86],"error":[87],"polarities.":[88],"done":[92],"means":[94],"functions":[96],"that":[97],"mask":[98],"particular":[103],"polarity.":[104]},"counts_by_year":[],"updated_date":"2026-03-28T08:17:26.163206","created_date":"2025-10-10T00:00:00"}