{"id":"https://openalex.org/W1870528983","doi":"https://doi.org/10.1109/dftvs.2003.1250141","title":"Partial error masking to reduce soft error failure rate in logic circuits","display_name":"Partial error masking to reduce soft error failure rate in logic circuits","publication_year":2004,"publication_date":"2004-03-01","ids":{"openalex":"https://openalex.org/W1870528983","doi":"https://doi.org/10.1109/dftvs.2003.1250141","mag":"1870528983"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2003.1250141","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250141","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021693439","display_name":"Kartik Mohanram","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]},{"id":"https://openalex.org/I74775410","display_name":"Rice University","ror":"https://ror.org/008zs3103","country_code":"US","type":"education","lineage":["https://openalex.org/I74775410"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"K. Mohanram","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rice University, USA","Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rice University, USA","institution_ids":["https://openalex.org/I74775410"]},{"raw_affiliation_string":"Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012356472","display_name":"Nur A. Touba","orcid":"https://orcid.org/0000-0001-5083-6701"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N.A. Touba","raw_affiliation_strings":["Computer Engineering Research Center, University of Technology, Austin, TX, USA","Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Technology, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5021693439"],"corresponding_institution_ids":["https://openalex.org/I74775410","https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":4.4042,"has_fulltext":false,"cited_by_count":97,"citation_normalized_percentile":{"value":0.94142019,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"433","last_page":"440"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8430050611495972},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6817097663879395},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.653510332107544},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.6007761359214783},{"id":"https://openalex.org/keywords/heuristics","display_name":"Heuristics","score":0.576387345790863},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5445674657821655},{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.5435043573379517},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.5045837163925171},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5022120475769043},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.47280898690223694},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36909255385398865},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3163298964500427},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2961391806602478},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17594215273857117},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12696409225463867},{"id":"https://openalex.org/keywords/speech-recognition","display_name":"Speech recognition","score":0.07886180281639099},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0699479877948761}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8430050611495972},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6817097663879395},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.653510332107544},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.6007761359214783},{"id":"https://openalex.org/C127705205","wikidata":"https://www.wikidata.org/wiki/Q5748245","display_name":"Heuristics","level":2,"score":0.576387345790863},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5445674657821655},{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.5435043573379517},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.5045837163925171},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5022120475769043},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47280898690223694},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36909255385398865},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3163298964500427},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2961391806602478},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17594215273857117},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12696409225463867},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.07886180281639099},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0699479877948761},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/dftvs.2003.1250141","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250141","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.136.158","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.136.158","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ece.rice.edu/~kmram/publications/dft03.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.80.4618","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.80.4618","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ece.utexas.edu/~touba/research/dfts03a.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1539124848","https://openalex.org/W1566296806","https://openalex.org/W1585307141","https://openalex.org/W1906369229","https://openalex.org/W1935014183","https://openalex.org/W1965983053","https://openalex.org/W1967835393","https://openalex.org/W2044444099","https://openalex.org/W2104122494","https://openalex.org/W2129009228","https://openalex.org/W2142358791","https://openalex.org/W2144371588","https://openalex.org/W2169213530","https://openalex.org/W2971174528","https://openalex.org/W4231340621","https://openalex.org/W6679315509"],"related_works":["https://openalex.org/W975040225","https://openalex.org/W2041615232","https://openalex.org/W3081694532","https://openalex.org/W2110991008","https://openalex.org/W2000201823","https://openalex.org/W2061536619","https://openalex.org/W2149051075","https://openalex.org/W2394408226","https://openalex.org/W2141072664","https://openalex.org/W168676510"],"abstract_inverted_index":{"A":[0],"new":[1],"methodology":[2],"for":[3,107],"designing":[4],"logic":[5,28],"circuits":[6],"with":[7,39,100],"partial":[8],"error":[9,22,33,43,56,73,96],"masking":[10,34],"is":[11,16],"described.":[12],"The":[13],"key":[14],"idea":[15],"to":[17,45,70,92],"exploit":[18],"the":[19,32,37,40,54,94,104],"asymmetric":[20],"soft":[21,42,55,72,95],"susceptibility":[23,44],"of":[24,103],"nodes":[25,38],"in":[26,53,64],"a":[27,101],"circuit":[29],"by":[30],"targeting":[31],"capability":[35],"towards":[36],"highest":[41],"achieve":[46],"cost-effective":[47],"tradeoffs":[48],"between":[49],"overhead":[50,105],"and":[51,86],"reduction":[52,81,85],"failure":[57,74,97],"rate.":[58],"Such":[59],"techniques":[60],"can":[61],"be":[62],"used":[63,91],"cost-sensitive":[65],"high":[66],"volume":[67],"mainstream":[68],"applications":[69],"satisfy":[71],"rate":[75,98],"requirements":[76],"at":[77],"minimum":[78],"cost.":[79],"Two":[80],"heuristics,":[82],"cluster":[83],"sharing":[84],"dominant":[87],"value":[88],"reduction,":[89],"are":[90],"reduce":[93],"significantly":[99],"fraction":[102],"required":[106],"conventional":[108],"TMR.":[109]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":9},{"year":2012,"cited_by_count":9}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}