{"id":"https://openalex.org/W2126009472","doi":"https://doi.org/10.1109/dftvs.2003.1250111","title":"Test compaction by using linear-matrix driven scan chains","display_name":"Test compaction by using linear-matrix driven scan chains","publication_year":2004,"publication_date":"2004-03-02","ids":{"openalex":"https://openalex.org/W2126009472","doi":"https://doi.org/10.1109/dftvs.2003.1250111","mag":"2126009472"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2003.1250111","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250111","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026839856","display_name":"S. Bhatia","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. Bhatia","raw_affiliation_strings":["Cadence Design Systems, Inc","Cadence Design Systems, Inc.,San Jose,CA,USA"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Inc","institution_ids":["https://openalex.org/I66217453"]},{"raw_affiliation_string":"Cadence Design Systems, Inc.,San Jose,CA,USA","institution_ids":["https://openalex.org/I66217453"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5026839856"],"corresponding_institution_ids":["https://openalex.org/I66217453"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15698812,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"185","last_page":"190"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.8421399593353271},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.7905381917953491},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6568540930747986},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6504822373390198},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.5842952728271484},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5740401148796082},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5356833934783936},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4936422109603882},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.4915638864040375},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4615177810192108},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.45841073989868164},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.4371316432952881},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4219669699668884},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.4199199676513672},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34743595123291016},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.28143495321273804},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.14463168382644653},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13428431749343872},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11552417278289795}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.8421399593353271},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.7905381917953491},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6568540930747986},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6504822373390198},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.5842952728271484},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5740401148796082},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5356833934783936},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4936422109603882},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.4915638864040375},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4615177810192108},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.45841073989868164},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.4371316432952881},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4219669699668884},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.4199199676513672},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34743595123291016},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.28143495321273804},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.14463168382644653},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13428431749343872},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11552417278289795},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dftvs.2003.1250111","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250111","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W126716156","https://openalex.org/W199354597","https://openalex.org/W1528634425","https://openalex.org/W1530901360","https://openalex.org/W1536291488","https://openalex.org/W1561137028","https://openalex.org/W1584905380","https://openalex.org/W1592515516","https://openalex.org/W1842772659","https://openalex.org/W1897664708","https://openalex.org/W1940914607","https://openalex.org/W2046314918","https://openalex.org/W2087289986","https://openalex.org/W2097973512","https://openalex.org/W2104107023","https://openalex.org/W2134803195","https://openalex.org/W2134998505","https://openalex.org/W2168755502","https://openalex.org/W2224822217","https://openalex.org/W2243624201","https://openalex.org/W2275780757","https://openalex.org/W2277945880","https://openalex.org/W2398304387","https://openalex.org/W2419037249","https://openalex.org/W2876337417"],"related_works":["https://openalex.org/W2117171289","https://openalex.org/W1852363244","https://openalex.org/W1501621551","https://openalex.org/W2888456858","https://openalex.org/W2001654810","https://openalex.org/W2172250424","https://openalex.org/W2127184179","https://openalex.org/W2049913894","https://openalex.org/W2080818541","https://openalex.org/W2537616607"],"abstract_inverted_index":{"This":[0,117],"paper":[1],"presents":[2],"a":[3,51,56,64],"linear":[4,52],"matrix":[5,53],"driven":[6],"scan":[7,18,61,92,132],"based":[8],"test":[9,22,33,44,48,83,107,112,124,138,152],"methodology":[10,49],"for":[11,128],"ASIC":[12],"designs":[13],"which,":[14],"compared":[15],"to":[16,54,80,110,120,141],"conventional":[17],"methodology,":[19],"reduces":[20,136],"the":[21,28,43,76,82,88,94,97,104,115,123,137,150,156],"application":[23,125],"time":[24,126],"as":[25,27],"well":[26],"required":[29,109,127,140],"tester":[30,145],"memory":[31],"and":[32,154],"data":[34,113,130,139],"by":[35],"an":[36],"order":[37],"of":[38,59,67,78,90,96,106,158,161],"magnitude":[39],"-":[40],"without":[41],"deteriorating":[42],"quality.":[45],"The":[46],"proposed":[47],"uses":[50],"drive":[55],"large":[57],"number":[58,89,105],"parallel":[60,91],"chains":[62,79,98],"from":[63],"small":[65],"set":[66],"chip":[68],"pins.":[69],"A":[70],"multi-input-signature-register":[71],"(MISR)":[72],"is":[73,99],"used":[74],"at":[75],"output":[77,84],"compress":[81],"response.":[85],"By":[86],"increasing":[87],"chains,":[93],"length":[95],"reduced,":[100],"which":[101],"directly":[102],"impacts":[103],"cycles":[108],"shift":[111],"through":[114,131],"chains.":[116,133],"allows":[118],"one":[119],"considerably":[121,148],"reduce":[122],"shifting":[129],"It":[134],"also":[135],"be":[142],"stored":[143],"in":[144],"memory,":[146],"thus":[147],"reducing":[149],"manufacturing":[151],"cost,":[153],"allowing":[155],"reuse":[157],"older":[159],"generations":[160],"less":[162],"expensive":[163],"testers":[164],"with":[165],"smaller":[166],"memory.":[167]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}