{"id":"https://openalex.org/W4416726047","doi":"https://doi.org/10.1109/dft66274.2025.11257441","title":"Reliability Assessment of AMD MicroBlaze-V TMR Architecture Using Fault Injection","display_name":"Reliability Assessment of AMD MicroBlaze-V TMR Architecture Using Fault Injection","publication_year":2025,"publication_date":"2025-10-21","ids":{"openalex":"https://openalex.org/W4416726047","doi":"https://doi.org/10.1109/dft66274.2025.11257441"},"language":null,"primary_location":{"id":"doi:10.1109/dft66274.2025.11257441","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft66274.2025.11257441","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5116046277","display_name":"Jorge Cano-P\u00e1ez","orcid":null},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Jorge Cano-P\u00e1ez","raw_affiliation_strings":["Universidad Carlos III de Madrid,Dept. of Electronic Technology,Leganés,Spain"],"affiliations":[{"raw_affiliation_string":"Universidad Carlos III de Madrid,Dept. of Electronic Technology,Leganés,Spain","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022411878","display_name":"Luis Entrena","orcid":"https://orcid.org/0000-0001-6021-165X"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Luis Entrena","raw_affiliation_strings":["Universidad Carlos III de Madrid,Dept. of Electronic Technology,Leganés,Spain"],"affiliations":[{"raw_affiliation_string":"Universidad Carlos III de Madrid,Dept. of Electronic Technology,Leganés,Spain","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073896117","display_name":"Almudena Lindoso","orcid":"https://orcid.org/0000-0001-5870-6493"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Almudena Lindoso","raw_affiliation_strings":["Universidad Carlos III de Madrid,Dept. of Electronic Technology,Leganés,Spain"],"affiliations":[{"raw_affiliation_string":"Universidad Carlos III de Madrid,Dept. of Electronic Technology,Leganés,Spain","institution_ids":["https://openalex.org/I50357001"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5116046277"],"corresponding_institution_ids":["https://openalex.org/I50357001"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.39185752,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6887999773025513},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.5537999868392944},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.542900025844574},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5210000276565552},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4348999857902527},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.42100000381469727},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4072999954223633}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6887999773025513},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6589999794960022},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.5537999868392944},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.542900025844574},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5210000276565552},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4528000056743622},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4348999857902527},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.42100000381469727},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4072999954223633},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.391400009393692},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.36800000071525574},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.36739999055862427},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3303999900817871},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.31290000677108765},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.30730000138282776},{"id":"https://openalex.org/C3018824978","wikidata":"https://www.wikidata.org/wiki/Q2894891","display_name":"Error analysis","level":2,"score":0.2705000042915344},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.2662000060081482},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.25769999623298645},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2517000138759613}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft66274.2025.11257441","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft66274.2025.11257441","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2028687031","https://openalex.org/W2043701226","https://openalex.org/W2044069930","https://openalex.org/W2164363068","https://openalex.org/W2944835877","https://openalex.org/W2971478958","https://openalex.org/W3203657088","https://openalex.org/W4200142736","https://openalex.org/W4302577616","https://openalex.org/W4381304562","https://openalex.org/W4396530065","https://openalex.org/W4404103096","https://openalex.org/W4404565098","https://openalex.org/W4404954136"],"related_works":[],"abstract_inverted_index":{"This":[0],"work":[1],"studies":[2],"the":[3,6,13,19,38,69,120],"robustness":[4],"of":[5,18,66,74,77],"recent":[7],"AMD":[8,50],"RISC-V:":[9],"MicroBlaze-V.":[10],"We":[11,116],"study":[12],"TMR":[14,51,122],"fault":[15,34],"tolerant":[16],"version":[17],"MicroBlaze-":[20,52],"V":[21,53],"architecture,":[22],"implemented":[23],"in":[24,68,100],"a":[25,56,80,104,111],"FPGA.":[26],"The":[27,72],"architecture":[28,123],"has":[29],"been":[30],"evaluated":[31],"with":[32,62],"extensive":[33],"injections":[35],"campaigns":[36],"considering":[37],"whole":[39],"configuration":[40,70],"memory":[41],"and":[42,58,107],"only":[43],"essential":[44],"bits.":[45],"Experimental":[46],"results":[47],"show":[48,79,118],"that":[49,119],"proposal":[54],"offers":[55],"fast":[57],"flexible":[59],"design":[60],"process":[61],"good":[63],"error":[64,78,106],"mitigation":[65],"faults":[67,114],"memory.":[71],"distributions":[73],"different":[75],"types":[76],"strong":[81],"correlation":[82],"between":[83],"them,":[84],"which":[85],"may":[86,124],"be":[87],"used":[88],"for":[89,94,103,110],"error-rate":[90],"estimations.":[91],"Data":[92,127],"calculated":[93],"neutrons":[95],"at":[96],"atmospheric":[97],"level,":[98],"result":[99],"9":[101],"FIT":[102,109],"first":[105],"4":[108],"failure":[112],"if":[113],"accumulate.":[115],"also":[117],"MicroBlaze-V":[121],"suffer":[125],"Silent":[126],"Corruption.":[128]},"counts_by_year":[],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-11-25T00:00:00"}