{"id":"https://openalex.org/W4404564278","doi":"https://doi.org/10.1109/dft63277.2024.10753500","title":"Special Session: Enhancing Reliability in Digital Computing-in-Memory Architectures Through Approximation and Fault Tolerance Methods","display_name":"Special Session: Enhancing Reliability in Digital Computing-in-Memory Architectures Through Approximation and Fault Tolerance Methods","publication_year":2024,"publication_date":"2024-10-08","ids":{"openalex":"https://openalex.org/W4404564278","doi":"https://doi.org/10.1109/dft63277.2024.10753500"},"language":"en","primary_location":{"id":"doi:10.1109/dft63277.2024.10753500","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/dft63277.2024.10753500","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060945705","display_name":"Shih-Hsu Huang","orcid":"https://orcid.org/0000-0001-8908-8384"},"institutions":[{"id":"https://openalex.org/I151221077","display_name":"Chung Yuan Christian University","ror":"https://ror.org/02w8ws377","country_code":"TW","type":"education","lineage":["https://openalex.org/I151221077"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Shih-Hsu Huang","raw_affiliation_strings":["Chung Yuan Christian University,Department of Electronic Engineeering,Taoyuan,Taiwan"],"affiliations":[{"raw_affiliation_string":"Chung Yuan Christian University,Department of Electronic Engineeering,Taoyuan,Taiwan","institution_ids":["https://openalex.org/I151221077"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Chih-Li Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I151221077","display_name":"Chung Yuan Christian University","ror":"https://ror.org/02w8ws377","country_code":"TW","type":"education","lineage":["https://openalex.org/I151221077"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Li Hsiao","raw_affiliation_strings":["Chung Yuan Christian University,Department of Electronic Engineeering,Taoyuan,Taiwan"],"affiliations":[{"raw_affiliation_string":"Chung Yuan Christian University,Department of Electronic Engineeering,Taoyuan,Taiwan","institution_ids":["https://openalex.org/I151221077"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111527144","display_name":"Wei-Che Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I151221077","display_name":"Chung Yuan Christian University","ror":"https://ror.org/02w8ws377","country_code":"TW","type":"education","lineage":["https://openalex.org/I151221077"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wei-Che Cheng","raw_affiliation_strings":["Chung Yuan Christian University,Department of Electronic Engineeering,Taoyuan,Taiwan"],"affiliations":[{"raw_affiliation_string":"Chung Yuan Christian University,Department of Electronic Engineeering,Taoyuan,Taiwan","institution_ids":["https://openalex.org/I151221077"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5060945705"],"corresponding_institution_ids":["https://openalex.org/I151221077"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.32075817,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10101","display_name":"Cloud Computing and Resource Management","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10101","display_name":"Cloud Computing and Resource Management","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9790999889373779,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10273","display_name":"IoT and Edge/Fog Computing","score":0.9611999988555908,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.85010826587677},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7880837917327881},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.7203167676925659},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6298559904098511},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.449118435382843},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.44273507595062256},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.4353242814540863},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43149787187576294},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.30015048384666443},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08043655753135681}],"concepts":[{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.85010826587677},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7880837917327881},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.7203167676925659},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6298559904098511},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.449118435382843},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.44273507595062256},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.4353242814540863},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43149787187576294},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.30015048384666443},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08043655753135681},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft63277.2024.10753500","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/dft63277.2024.10753500","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","score":0.4099999964237213,"display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1501047434","https://openalex.org/W1999799697","https://openalex.org/W2057200808","https://openalex.org/W2106635847","https://openalex.org/W2111535934","https://openalex.org/W2163108666","https://openalex.org/W2516832665","https://openalex.org/W2737489920","https://openalex.org/W2737640031","https://openalex.org/W2753050160","https://openalex.org/W2792396453","https://openalex.org/W2904299207","https://openalex.org/W2914348382","https://openalex.org/W3000390348","https://openalex.org/W3006525387","https://openalex.org/W3109312623","https://openalex.org/W3128966520","https://openalex.org/W3133865265","https://openalex.org/W3133874331","https://openalex.org/W3134526034","https://openalex.org/W3162128804","https://openalex.org/W4281667025","https://openalex.org/W4309007171","https://openalex.org/W4313117725","https://openalex.org/W4313123335","https://openalex.org/W4385147023","https://openalex.org/W4385819615","https://openalex.org/W4386323343","https://openalex.org/W4401568122"],"related_works":["https://openalex.org/W2971479921","https://openalex.org/W2106348006","https://openalex.org/W3145923041","https://openalex.org/W2946906624","https://openalex.org/W841176518","https://openalex.org/W1978919910","https://openalex.org/W2024212764","https://openalex.org/W2157727563","https://openalex.org/W2101077206","https://openalex.org/W2470343202"],"abstract_inverted_index":{"In":[0,48],"recent":[1],"years,":[2],"although":[3],"there":[4],"have":[5,14],"been":[6],"many":[7],"works":[8],"on":[9,17],"digital":[10,82],"computing-in-memory":[11],"(DCIM),":[12],"they":[13],"mainly":[15],"focused":[16],"improving":[18],"computational":[19],"efficiency,":[20],"while":[21],"neglecting":[22],"the":[23,44,64],"issue":[24],"of":[25,46,66,121],"reliability":[26,65],"enhancement.":[27],"However,":[28],"during":[29],"circuit":[30,73],"manufacturing":[31],"or":[32],"operation,":[33],"defects":[34,55],"(caused":[35],"for":[36,96,105],"reasons)":[37],"may":[38],"arise":[39],"in":[40,112,127],"DCIM":[41,67,72,113,128],"circuits,":[42],"impacting":[43],"accuracy":[45],"results.":[47],"this":[49,116],"paper,":[50,117],"we":[51,86,100],"explore":[52],"overcoming":[53],"these":[54],"through":[56],"approximation":[57,89,107,122],"and":[58,81,91,108,123,130],"fault":[59,92,109,124],"tolerance":[60,93,110,125],"techniques":[61,90,94,111],"to":[62],"enhance":[63],"circuits.":[68,114],"Given":[69],"that":[70],"a":[71,78],"comprises":[74],"two":[75],"components":[76],"-":[77],"memory":[79],"array":[80],"logic":[83],"(adder":[84],"tree),":[85],"present":[87],"established":[88],"separately":[95],"each":[97],"component.":[98],"Furthermore,":[99],"discuss":[101],"possible":[102],"research":[103],"directions":[104],"designing":[106],"Through":[115],"an":[118],"in-depth":[119],"exploration":[120],"issues":[126],"circuits":[129],"potential":[131],"solutions":[132],"is":[133],"provided.":[134]},"counts_by_year":[],"updated_date":"2026-04-17T18:11:37.981687","created_date":"2025-10-10T00:00:00"}