{"id":"https://openalex.org/W4388674568","doi":"https://doi.org/10.1109/dft59622.2023.10313545","title":"Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches","display_name":"Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches","publication_year":2023,"publication_date":"2023-10-03","ids":{"openalex":"https://openalex.org/W4388674568","doi":"https://doi.org/10.1109/dft59622.2023.10313545"},"language":"en","primary_location":{"id":"doi:10.1109/dft59622.2023.10313545","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/dft59622.2023.10313545","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011277985","display_name":"Yuguang Chen","orcid":"https://orcid.org/0000-0003-4520-5395"},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Guang Chen","raw_affiliation_strings":["National Central University,Department of Electrical Engineering,Taoyuan,Taiwan","Department of Electrical Engineering, National Central University, Taoyuan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Central University,Department of Electrical Engineering,Taoyuan,Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Department of Electrical Engineering, National Central University, Taoyuan, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109789031","display_name":"Ying-Jing Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ying-Jing Tsai","raw_affiliation_strings":["National Central University,Department of Electrical Engineering,Taoyuan,Taiwan","Department of Electrical Engineering, National Central University, Taoyuan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Central University,Department of Electrical Engineering,Taoyuan,Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Department of Electrical Engineering, National Central University, Taoyuan, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2454,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.54430657,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.7891079187393188},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.775973379611969},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7497714757919312},{"id":"https://openalex.org/keywords/von-neumann-architecture","display_name":"Von Neumann architecture","score":0.5595946907997131},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4970586597919464},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.44973766803741455},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.37727445363998413},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3332970142364502},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3256732225418091},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12810012698173523},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12110567092895508}],"concepts":[{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.7891079187393188},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.775973379611969},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7497714757919312},{"id":"https://openalex.org/C80469333","wikidata":"https://www.wikidata.org/wiki/Q189088","display_name":"Von Neumann architecture","level":2,"score":0.5595946907997131},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4970586597919464},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.44973766803741455},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37727445363998413},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3332970142364502},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3256732225418091},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12810012698173523},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12110567092895508},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft59622.2023.10313545","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/dft59622.2023.10313545","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320331164","display_name":"National Science and Technology Council","ror":"https://ror.org/00wnb9798"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":50,"referenced_works":["https://openalex.org/W1663597234","https://openalex.org/W1795116911","https://openalex.org/W2018068167","https://openalex.org/W2066647049","https://openalex.org/W2089272132","https://openalex.org/W2112547256","https://openalex.org/W2124969960","https://openalex.org/W2769168016","https://openalex.org/W2773835648","https://openalex.org/W2775637085","https://openalex.org/W2781857877","https://openalex.org/W2786630036","https://openalex.org/W2805362231","https://openalex.org/W2897706246","https://openalex.org/W2913032416","https://openalex.org/W2940984015","https://openalex.org/W2966878541","https://openalex.org/W2979874885","https://openalex.org/W2980688670","https://openalex.org/W2981912773","https://openalex.org/W3000301330","https://openalex.org/W3009643182","https://openalex.org/W3012508368","https://openalex.org/W3013462594","https://openalex.org/W3013739639","https://openalex.org/W3018877817","https://openalex.org/W3025848775","https://openalex.org/W3028754834","https://openalex.org/W3035937937","https://openalex.org/W3083631135","https://openalex.org/W3097660937","https://openalex.org/W3104353813","https://openalex.org/W3106120796","https://openalex.org/W3109556898","https://openalex.org/W3114380291","https://openalex.org/W3163420603","https://openalex.org/W3164445786","https://openalex.org/W3200807798","https://openalex.org/W3201362361","https://openalex.org/W3209241100","https://openalex.org/W4213079971","https://openalex.org/W4214897846","https://openalex.org/W4224307474","https://openalex.org/W4236126228","https://openalex.org/W4281733335","https://openalex.org/W4310172350","https://openalex.org/W4312611881","https://openalex.org/W4379116041","https://openalex.org/W6798528302","https://openalex.org/W6849307211"],"related_works":["https://openalex.org/W2595172197","https://openalex.org/W2084856301","https://openalex.org/W2127970246","https://openalex.org/W2885125400","https://openalex.org/W1001352512","https://openalex.org/W1989889224","https://openalex.org/W4382618745","https://openalex.org/W2918361313","https://openalex.org/W4200536635","https://openalex.org/W2611005572"],"abstract_inverted_index":{"Computing-in-memory":[0],"(CIM)":[1],"has":[2],"been":[3,33],"considered":[4],"as":[5],"one":[6],"of":[7,19,60],"the":[8,17,35,58,63,79],"promising":[9],"solutions":[10],"to":[11,56],"overcome":[12],"von":[13],"Neumann":[14],"bottleneck":[15],"in":[16],"presence":[18],"data-intensive":[20],"applications.":[21],"Although":[22],"various":[23],"CIM":[24,69],"architectures":[25],"with":[26],"CMOS-based":[27],"and/or":[28],"emerging":[29],"memory":[30],"devices":[31],"have":[32],"proposed,":[34],"device":[36],"and":[37,43,66,74],"circuit":[38],"non-idealities":[39],"introduce":[40,57],"reliability":[41,80],"issues":[42],"cause":[44],"inaccurate":[45],"or":[46],"even":[47],"wrong":[48],"computing":[49],"results.":[50],"In":[51],"this":[52],"tutorial,":[53],"we":[54],"attempt":[55],"source":[59],"unreliability,":[61],"show":[62],"detection":[64],"methods,":[65],"discuss":[67],"reliability-aware":[68],"designs":[70],"from":[71],"both":[72],"hardware":[73],"software":[75],"perspectives":[76],"for":[77],"mitigating":[78],"issues.":[81]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}