{"id":"https://openalex.org/W4310449161","doi":"https://doi.org/10.1109/dft56152.2022.9962337","title":"Evaluation of the Effects of SEUs on Configuration Memories in FPGA Implemented QC-LDPC Decoders","display_name":"Evaluation of the Effects of SEUs on Configuration Memories in FPGA Implemented QC-LDPC Decoders","publication_year":2022,"publication_date":"2022-10-19","ids":{"openalex":"https://openalex.org/W4310449161","doi":"https://doi.org/10.1109/dft56152.2022.9962337"},"language":"en","primary_location":{"id":"doi:10.1109/dft56152.2022.9962337","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft56152.2022.9962337","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079936961","display_name":"Zhen Gao","orcid":"https://orcid.org/0000-0003-3976-2558"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhen Gao","raw_affiliation_strings":["Tianjin University,School of Electrical and Information Engineering,Tianjin,China,300072"],"affiliations":[{"raw_affiliation_string":"Tianjin University,School of Electrical and Information Engineering,Tianjin,China,300072","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088495352","display_name":"Yinghao Cheng","orcid":"https://orcid.org/0009-0001-4734-9264"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinghao Cheng","raw_affiliation_strings":["Tianjin University,School of Electrical and Information Engineering,Tianjin,China,300072"],"affiliations":[{"raw_affiliation_string":"Tianjin University,School of Electrical and Information Engineering,Tianjin,China,300072","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Pedro Reviriego","raw_affiliation_strings":["Universidad Carlos III de Madrid,Leganés,Madrid,Spain,28911"],"affiliations":[{"raw_affiliation_string":"Universidad Carlos III de Madrid,Leganés,Madrid,Spain,28911","institution_ids":["https://openalex.org/I50357001"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5079936961"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10193213,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11321","display_name":"Error Correcting Code Techniques","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10714","display_name":"Software-Defined Networks and 5G","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/low-density-parity-check-code","display_name":"Low-density parity-check code","score":0.8303885459899902},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7813074588775635},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7602319717407227},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5914162993431091},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.5759602785110474},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.45694053173065186},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.45642611384391785},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.45021870732307434},{"id":"https://openalex.org/keywords/forward-error-correction","display_name":"Forward error correction","score":0.4367330074310303},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.43535029888153076},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.41519105434417725},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34843122959136963},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.18320542573928833},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09811219573020935}],"concepts":[{"id":"https://openalex.org/C67692717","wikidata":"https://www.wikidata.org/wiki/Q187444","display_name":"Low-density parity-check code","level":3,"score":0.8303885459899902},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7813074588775635},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7602319717407227},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5914162993431091},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.5759602785110474},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.45694053173065186},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.45642611384391785},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.45021870732307434},{"id":"https://openalex.org/C202932441","wikidata":"https://www.wikidata.org/wiki/Q55611017","display_name":"Forward error correction","level":3,"score":0.4367330074310303},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.43535029888153076},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.41519105434417725},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34843122959136963},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.18320542573928833},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09811219573020935},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft56152.2022.9962337","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft56152.2022.9962337","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2623918504","https://openalex.org/W2957709805","https://openalex.org/W4225319325","https://openalex.org/W2916248738","https://openalex.org/W1968720239","https://openalex.org/W4387475406","https://openalex.org/W2622922565","https://openalex.org/W2100531868","https://openalex.org/W2124455219","https://openalex.org/W2121747124"],"abstract_inverted_index":{"LDPC":[0,29,51,70,94,159,190],"codes":[1],"are":[2,21,115,149],"widely":[3],"used":[4],"in":[5,42],"wireless":[6],"communication":[7],"systems":[8],"for":[9,25,162,189],"reliable":[10],"data":[11],"transmission":[12],"due":[13,31,167],"to":[14,32,72,117,152,168,183],"their":[15,33],"excellent":[16,34],"error":[17],"correction":[18],"capabilities.":[19],"SRAM-FPGAs":[20],"a":[22,180],"popular":[23],"option":[24],"the":[26,48,67,75,83,91,98,102,105,108,119,122,133,140,144,156,169],"implementation":[27],"of":[28,69,85,90,104,121,130,158,165,173],"decoders":[30,52,71,160],"computing":[35],"capabilities":[36],"and":[37,62,143],"re-configurability.":[38],"However,":[39],"when":[40],"applied":[41],"critical":[43],"environments,":[44],"e.g.":[45],"space":[46],"platforms,":[47],"SRAM-FPGA":[49],"based":[50,96],"will":[53,178],"suffer":[54],"single-event":[55],"upsets":[56],"(SEUs)":[57],"that":[58,127],"can":[59,136],"cause":[60],"failures":[61],"disrupt":[63],"communications.":[64],"Therefore,":[65],"analyzing":[66],"reliability":[68,157],"SEUs":[73,86,131],"on":[74,87,97,107,132],"FPGA":[76,92],"is":[77],"important.":[78],"This":[79],"paper":[80],"first":[81],"analyzes":[82],"effects":[84],"different":[88],"parts":[89],"implemented":[93],"decoder":[95,109,141],"module":[99],"functions,":[100],"including":[101],"influence":[103],"parallelism":[106,166],"reliability.":[110],"Then":[111],"fault":[112],"injection":[113],"experiments":[114],"performed":[116],"validate":[118],"conclusions":[120],"analysis.":[123],"Experiment":[124],"results":[125,177],"show":[126],"about":[128],"98%":[129],"configuration":[134],"memories":[135],"be":[137,179],"tolerated":[138],"by":[139],"itself,":[142],"modules":[145],"with":[146],"more":[147],"interconnections":[148],"less":[150],"robust":[151],"SEUs.":[153],"In":[154],"addition,":[155],"decreases":[161],"lower":[163],"levels":[164],"larger":[170],"computation":[171],"load":[172],"each":[174],"unit.":[175],"These":[176],"valuable":[181],"input":[182],"design":[184],"efficient":[185],"SEU":[186],"protection":[187],"schemes":[188],"decoders.":[191]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}