{"id":"https://openalex.org/W2545104369","doi":"https://doi.org/10.1109/dft.2016.7684084","title":"A novel method for SEE validation of complex SoCs using Low-Energy Proton beams","display_name":"A novel method for SEE validation of complex SoCs using Low-Energy Proton beams","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2545104369","doi":"https://doi.org/10.1109/dft.2016.7684084","mag":"2545104369"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2016.7684084","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2016.7684084","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009045604","display_name":"Gianluca Furano","orcid":"https://orcid.org/0000-0001-7624-1415"},"institutions":[{"id":"https://openalex.org/I44377176","display_name":"European Space Research and Technology Centre","ror":"https://ror.org/03h3jqn23","country_code":"NL","type":"government","lineage":["https://openalex.org/I2801994115","https://openalex.org/I44377176"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Gianluca Furano","raw_affiliation_strings":["European Space Agency, European Space Technology Centre, Noordwijk, Netherlands"],"affiliations":[{"raw_affiliation_string":"European Space Agency, European Space Technology Centre, Noordwijk, Netherlands","institution_ids":["https://openalex.org/I44377176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013140373","display_name":"Stefano Di Mascio","orcid":"https://orcid.org/0000-0001-8966-4257"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Stefano Di Mascio","raw_affiliation_strings":["Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy","institution_ids":["https://openalex.org/I116067653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015738944","display_name":"Tomasz Szewczyk","orcid":"https://orcid.org/0000-0002-7424-1283"},"institutions":[{"id":"https://openalex.org/I44377176","display_name":"European Space Research and Technology Centre","ror":"https://ror.org/03h3jqn23","country_code":"NL","type":"government","lineage":["https://openalex.org/I2801994115","https://openalex.org/I44377176"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Tomasz Szewczyk","raw_affiliation_strings":["European Space Agency, European Space Technology Centre, Noordwijk, Netherlands"],"affiliations":[{"raw_affiliation_string":"European Space Agency, European Space Technology Centre, Noordwijk, Netherlands","institution_ids":["https://openalex.org/I44377176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055353423","display_name":"Alessandra Menicucci","orcid":"https://orcid.org/0000-0002-7064-6275"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Alessandra Menicucci","raw_affiliation_strings":["Faculty of Aerospace Engineering, University of Technology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Aerospace Engineering, University of Technology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013749010","display_name":"L. Campajola","orcid":null},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luigi Campajola","raw_affiliation_strings":["Department of Physics, University of Naples Federico II, Naples, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Naples Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032441889","display_name":"F. Di Capua","orcid":"https://orcid.org/0000-0001-9076-5936"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Francesco Di Capua","raw_affiliation_strings":["Department of Physics, University of Naples Federico II, Naples, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Naples Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080882611","display_name":"Andrea Fabbri","orcid":"https://orcid.org/0000-0002-6447-9968"},"institutions":[{"id":"https://openalex.org/I119003972","display_name":"Roma Tre University","ror":"https://ror.org/05vf0dg29","country_code":"IT","type":"education","lineage":["https://openalex.org/I119003972"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Fabbri","raw_affiliation_strings":["INFN, Roma Tre Section, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"INFN, Roma Tre Section, Rome, Italy","institution_ids":["https://openalex.org/I119003972"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048232172","display_name":"Marco Ottavi","orcid":"https://orcid.org/0000-0002-5064-7342"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Ottavi","raw_affiliation_strings":["Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy","institution_ids":["https://openalex.org/I116067653"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5009045604"],"corresponding_institution_ids":["https://openalex.org/I44377176"],"apc_list":null,"apc_paid":null,"fwci":0.7457,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.75853364,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"131","last_page":"134"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13465","display_name":"Graphite, nuclear technology, radiation studies","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6886904835700989},{"id":"https://openalex.org/keywords/avionics","display_name":"Avionics","score":0.6077420711517334},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5529068112373352},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.5503770112991333},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.5494120717048645},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4546899199485779},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4507479965686798},{"id":"https://openalex.org/keywords/embedded-software","display_name":"Embedded software","score":0.42758113145828247},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.41171547770500183},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.35791438817977905},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30550646781921387},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.19574519991874695},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.13343262672424316},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11127638816833496}],"concepts":[{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6886904835700989},{"id":"https://openalex.org/C15792166","wikidata":"https://www.wikidata.org/wiki/Q221329","display_name":"Avionics","level":2,"score":0.6077420711517334},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5529068112373352},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.5503770112991333},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.5494120717048645},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4546899199485779},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4507479965686798},{"id":"https://openalex.org/C154488198","wikidata":"https://www.wikidata.org/wiki/Q1335007","display_name":"Embedded software","level":3,"score":0.42758113145828247},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.41171547770500183},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.35791438817977905},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30550646781921387},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.19574519991874695},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.13343262672424316},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11127638816833496}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/dft.2016.7684084","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2016.7684084","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:art.torvergata.it:2108/166260","is_oa":false,"landing_page_url":"http://hdl.handle.net/2108/166260","pdf_url":null,"source":{"id":"https://openalex.org/S4306400993","display_name":"Cineca Institutional Research Information System (Tor Vergata University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I116067653","host_organization_name":"University of Rome Tor Vergata","host_organization_lineage":["https://openalex.org/I116067653"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:iris.uniroma3.it:11590/398595","is_oa":false,"landing_page_url":"http://hdl.handle.net/11590/398595","pdf_url":null,"source":{"id":"https://openalex.org/S4377196120","display_name":"Iris (Roma Tre University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I119003972","host_organization_name":"Roma Tre University","host_organization_lineage":["https://openalex.org/I119003972"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6700000166893005,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1480907922","https://openalex.org/W2029159365","https://openalex.org/W2118016331","https://openalex.org/W2147483111","https://openalex.org/W2332323252","https://openalex.org/W2419482151","https://openalex.org/W3004695961","https://openalex.org/W6773523348"],"related_works":["https://openalex.org/W1589297475","https://openalex.org/W2330706584","https://openalex.org/W2903497870","https://openalex.org/W2164976164","https://openalex.org/W4389401673","https://openalex.org/W1987259072","https://openalex.org/W1605551782","https://openalex.org/W1563037183","https://openalex.org/W4300414917","https://openalex.org/W1984296692"],"abstract_inverted_index":{"This":[0,79],"paper":[1,80,142],"discusses":[2],"radiation":[3],"tests":[4,105,220],"on":[5],"complex":[6,72],"System-on-Chip":[7],"(SoC)":[8],"controllers":[9],"using":[10,132],"Low-Energy":[11],"Protons":[12],"(LEPs).":[13],"The":[14,178],"aim":[15],"of":[16,20,55,71,111,122,189,206,225],"this":[17,141,144],"novel":[18],"set":[19],"guidelines":[21],"is":[22,155,231],"to":[23,27,40,233],"be":[24,116,182],"also":[25,102],"applicable":[26],"System":[28],"In":[29],"Package":[30],"(SIP)":[31],"or":[32,175,210],"hybrid":[33],"components":[34],"that":[35],"are":[36],"now":[37],"often":[38],"used":[39,183],"overcome":[41],"printed":[42],"circuit":[43],"board's":[44],"real":[45],"estate":[46],"restrictions":[47],"in":[48,58,87,164],"Hi-Rel":[49],"electronics.":[50],"Despite":[51],"the":[52,119,204],"growing":[53],"success":[54],"microcontrollers":[56],"SoC":[57],"HiRel":[59],"applications,":[60],"general":[61,84],"and":[62,97,106,140,149,198,203,227],"standardized":[63],"methods":[64],"for":[65,92,103,108,138,160,184],"Single":[66],"Event":[67],"Effects":[68],"(SEE)":[69],"testing":[70,154,185],"SoCs":[73],"have":[74,221],"not":[75],"been":[76],"widely":[77],"established.":[78],"will":[81,115],"propose":[82],"a":[83,88,123,133,186,192,196,222,228],"methodology,":[85],"structured":[86],"modular":[89],"test":[90,93],"sequence":[91],"definition,":[94],"coding,":[95],"validation":[96],"setup,":[98],"with":[99,136,146,215],"suggestions":[100],"relevant":[101,120],"FPGA":[104],"potentially":[107],"system-level":[109],"characterization":[110],"miniaturized":[112],"assemblies.":[113],"It":[114],"illustrated":[117],"by":[118],"example":[121],"microcontroller":[124],"solution":[125],"including":[126],"lockstep":[127],"options.":[128],"Our":[129],"methodology":[130],"proposes":[131],"first":[134],"step":[135],"LEPs":[137],"irradiation,":[139],"compares":[143],"approach":[145],"current":[147],"techniques":[148],"standards,":[150],"showing":[151],"how":[152],"proton":[153,165],"becoming":[156],"increasingly":[157],"interesting,":[158],"especially":[159],"ultra-deep":[161],"submicron":[162],"processes":[163],"dominated":[166],"environments":[167],"like":[168],"thin-shielded":[169],"Low":[170],"Earth":[171],"Orbit":[172],"(LEO)":[173],"missions":[174],"aircraft":[176],"avionics.":[177],"proposed":[179],"method":[180],"can":[181],"wide":[187],"variety":[188],"SoCs,":[190],"providing":[191],"good":[193],"trade-off":[194],"between":[195],"rigorous":[197],"expensive":[199],"space":[200],"qualification":[201],"process":[202],"usage":[205],"an":[207],"untested":[208],"COTS":[209],"non":[211],"fault":[212],"tolerant":[213],"IPs":[214],"unpredictable":[216],"failure":[217],"modes.":[218],"LEP":[219],"high":[223],"risk":[224],"misinterpretation,":[226],"correct":[229],"guideline":[230],"paramount":[232],"exploit":[234],"their":[235],"value.":[236]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}