{"id":"https://openalex.org/W2546124079","doi":"https://doi.org/10.1109/dft.2016.7684075","title":"Detecting intermittent resistive faults in digital CMOS circuits","display_name":"Detecting intermittent resistive faults in digital CMOS circuits","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2546124079","doi":"https://doi.org/10.1109/dft.2016.7684075","mag":"2546124079"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2016.7684075","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2016.7684075","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049569198","display_name":"Hassan Ebrahimi","orcid":"https://orcid.org/0000-0002-5598-9536"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Hassan Ebrahimi","raw_affiliation_strings":["Testable Design and Test of Integrated Systems (TDT) Group, Centre for Telematics and Information Technology (CTIT), Enschede, Netherlands"],"affiliations":[{"raw_affiliation_string":"Testable Design and Test of Integrated Systems (TDT) Group, Centre for Telematics and Information Technology (CTIT), Enschede, Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037267380","display_name":"Alireza Rohani","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alireza Rohani","raw_affiliation_strings":["Testable Design and Test of Integrated Systems (TDT) Group, Centre for Telematics and Information Technology (CTIT), Enschede, Netherlands"],"affiliations":[{"raw_affiliation_string":"Testable Design and Test of Integrated Systems (TDT) Group, Centre for Telematics and Information Technology (CTIT), Enschede, Netherlands","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063280452","display_name":"Hans G. Kerkhoff","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hans G. Kerkhoff","raw_affiliation_strings":["Testable Design and Test of Integrated Systems (TDT) Group, Centre for Telematics and Information Technology (CTIT), Enschede, Netherlands"],"affiliations":[{"raw_affiliation_string":"Testable Design and Test of Integrated Systems (TDT) Group, Centre for Telematics and Information Technology (CTIT), Enschede, Netherlands","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5049569198"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9296,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.78767708,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"87","last_page":"90"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.7739613652229309},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6635671854019165},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.6425305604934692},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6401915550231934},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5819442868232727},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.535273015499115},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4754328727722168},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43716591596603394},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43313995003700256},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.38829928636550903},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.364113986492157},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2624224126338959},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2590634226799011},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1020936369895935},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.07609003782272339}],"concepts":[{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.7739613652229309},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6635671854019165},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.6425305604934692},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6401915550231934},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5819442868232727},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.535273015499115},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4754328727722168},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43716591596603394},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43313995003700256},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.38829928636550903},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.364113986492157},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2624224126338959},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2590634226799011},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1020936369895935},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07609003782272339},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/dft.2016.7684075","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2016.7684075","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/3f2579cd-a9a0-453f-b177-47f9508a5499","is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/3f2579cd-a9a0-453f-b177-47f9508a5499","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ebrahimi, H, Kerkhoff, H G & Rohani, A 2016, Detecting intermittent resistive faults in digital CMOS circuits. in IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, USA, pp. 87-90, 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, Connecticut, United States, 19/09/16. https://doi.org/10.1109/DFT.2016.7684075","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:ris.utwente.nl:publications/3f2579cd-a9a0-453f-b177-47f9508a5499","is_oa":false,"landing_page_url":"http://eprints.eemcs.utwente.nl/secure2/27610/01/DFT06-published.pdf","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320314237","display_name":"Rijksdienst voor Ondernemend Nederland","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1592930191","https://openalex.org/W1673849634","https://openalex.org/W1767301357","https://openalex.org/W1817508471","https://openalex.org/W1988869129","https://openalex.org/W2005671831","https://openalex.org/W2027845381","https://openalex.org/W2030129724","https://openalex.org/W2061676484","https://openalex.org/W2076406548","https://openalex.org/W2082557039","https://openalex.org/W2083842387","https://openalex.org/W2117352826","https://openalex.org/W2133882165","https://openalex.org/W2147497284","https://openalex.org/W2156667996"],"related_works":["https://openalex.org/W4252527915","https://openalex.org/W2409287660","https://openalex.org/W2233357156","https://openalex.org/W1976489385","https://openalex.org/W4256317220","https://openalex.org/W1506225852","https://openalex.org/W2141414364","https://openalex.org/W4301193134","https://openalex.org/W3111786897","https://openalex.org/W2991739378"],"abstract_inverted_index":{"Interconnection":[0],"reliability":[1,14],"threats":[2,15],"dependability":[3],"of":[4,10,24,27,37],"highly":[5],"critical":[6],"electronic":[7],"systems.":[8,95],"One":[9],"most":[11],"challenging":[12],"interconnection-induced":[13],"are":[16],"intermittent":[17],"resistive":[18],"faults":[19,54],"(IRFs).":[20],"The":[21,96],"occurrence":[22],"rate":[23],"this":[25],"kind":[26],"defects":[28,38],"can":[29,39,60],"take":[30],"e.g.":[31],"one":[32],"month,":[33],"and":[34,51],"the":[35,101],"duration":[36],"be":[40],"as":[41,43],"short":[42],"a":[44,48,56],"few":[45],"nanoseconds.":[46],"As":[47],"result,":[49],"evoking":[50],"detecting":[52,107],"these":[53],"is":[55,83,104],"big":[57],"challenge.":[58],"IRFs":[59,92],"cause":[61],"timing":[62,88],"deviations":[63,89],"in":[64,67,93,106],"data":[65],"paths":[66],"digital":[68,79,94],"systems":[69],"during":[70],"its":[71],"operating":[72],"time.":[73],"This":[74],"paper":[75],"proposes":[76],"an":[77],"online":[78],"slack":[80],"monitor":[81,103],"which":[82],"able":[84],"to":[85],"detect":[86],"small":[87],"caused":[90],"by":[91],"simulation":[97],"results":[98],"show":[99],"that":[100],"proposed":[102],"effective":[105],"IRFs.":[108]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2}],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}