{"id":"https://openalex.org/W2041103479","doi":"https://doi.org/10.1109/dft.2009.36","title":"Software-Based Hardware Fault Tolerance for Many-Core Architectures","display_name":"Software-Based Hardware Fault Tolerance for Many-Core Architectures","publication_year":2009,"publication_date":"2009-10-01","ids":{"openalex":"https://openalex.org/W2041103479","doi":"https://doi.org/10.1109/dft.2009.36","mag":"2041103479"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2009.36","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2009.36","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["Institut f\u00fcr Technische Informatik, Universit\u00e4t Stuttgart, Stuttgart, Germany","Inst. fur Tech. Inf., Univ. Stuttgart, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Technische Informatik, Universit\u00e4t Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Inst. fur Tech. Inf., Univ. Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5008775226"],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09410258,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"223","last_page":"223"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10101","display_name":"Cloud Computing and Resource Management","score":0.9879999756813049,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.7943869829177856},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7415146827697754},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.7275937795639038},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6751395463943481},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6324697136878967},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.6026785373687744},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.5254026055335999},{"id":"https://openalex.org/keywords/many-core","display_name":"Many core","score":0.5103606581687927},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4732782542705536},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4318401515483856},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.38382309675216675},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3439616560935974},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.27422305941581726},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.2102208137512207},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1274704933166504}],"concepts":[{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.7943869829177856},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7415146827697754},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.7275937795639038},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6751395463943481},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6324697136878967},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.6026785373687744},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.5254026055335999},{"id":"https://openalex.org/C3020431745","wikidata":"https://www.wikidata.org/wiki/Q25325220","display_name":"Many core","level":2,"score":0.5103606581687927},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4732782542705536},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4318401515483856},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.38382309675216675},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3439616560935974},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.27422305941581726},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.2102208137512207},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1274704933166504},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2009.36","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2009.36","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1862835629","https://openalex.org/W2136799148","https://openalex.org/W2971479921","https://openalex.org/W2897533804","https://openalex.org/W2106348006","https://openalex.org/W2890506991","https://openalex.org/W3145923041","https://openalex.org/W2946906624","https://openalex.org/W841176518","https://openalex.org/W2098626762"],"abstract_inverted_index":{"This":[0],"presentation":[1],"will":[2,22],"point":[3],"out":[4],"the":[5,24,27,33],"new":[6],"opportunities":[7],"and":[8,32,44],"challenges":[9],"for":[10],"applying":[11],"software-based":[12],"hardware":[13],"fault":[14,36,41],"tolerance":[15,37],"to":[16],"emerging":[17],"many-core":[18],"architectures.":[19],"The":[20],"paper":[21],"discuss":[23],"tradeoff":[25],"between":[26],"application":[28],"of":[29,40],"these":[30],"techniques":[31],"classical":[34],"hardware-based":[35],"in":[38],"terms":[39],"coverage,":[42],"overhead,":[43],"performance.":[45]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}