{"id":"https://openalex.org/W2148518536","doi":"https://doi.org/10.1109/dft.2009.20","title":"Improving Memory Repair by Selective Row Partitioning","display_name":"Improving Memory Repair by Selective Row Partitioning","publication_year":2009,"publication_date":"2009-10-01","ids":{"openalex":"https://openalex.org/W2148518536","doi":"https://doi.org/10.1109/dft.2009.20","mag":"2148518536"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2009.20","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2009.20","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053565418","display_name":"M. Tauseef Rab","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Muhammad Tauseef Rab","raw_affiliation_strings":["Computer Engineering Research Center, Department of Electrical and Computer Engineering, University of Technology, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, Department of Electrical and Computer Engineering, University of Technology, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085071100","display_name":"Asad Amin Bawa","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Asad Amin Bawa","raw_affiliation_strings":["Computer Engineering Research Center, Department of Electrical and Computer Engineering, University of Technology, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, Department of Electrical and Computer Engineering, University of Technology, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012356472","display_name":"Nur A. Touba","orcid":"https://orcid.org/0000-0001-5083-6701"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nur A. Touba","raw_affiliation_strings":["Computer Engineering Research Center, Department of Electrical and Computer Engineering, University of Technology, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, Department of Electrical and Computer Engineering, University of Technology, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5053565418"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":0.2638,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.6024667,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"6","issue":null,"first_page":"211","last_page":"219"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.830417275428772},{"id":"https://openalex.org/keywords/column","display_name":"Column (typography)","score":0.6824735403060913},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6750503778457642},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.6248514652252197},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5692648887634277},{"id":"https://openalex.org/keywords/row-and-column-spaces","display_name":"Row and column spaces","score":0.5451734066009521},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.42115259170532227},{"id":"https://openalex.org/keywords/encoding","display_name":"Encoding (memory)","score":0.41477638483047485},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.40574347972869873},{"id":"https://openalex.org/keywords/row","display_name":"Row","score":0.3658798635005951},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36517366766929626},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.35803452134132385},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2685847580432892},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17753666639328003},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1752282679080963},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08023151755332947}],"concepts":[{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.830417275428772},{"id":"https://openalex.org/C2780551164","wikidata":"https://www.wikidata.org/wiki/Q2306599","display_name":"Column (typography)","level":3,"score":0.6824735403060913},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6750503778457642},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.6248514652252197},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5692648887634277},{"id":"https://openalex.org/C104140500","wikidata":"https://www.wikidata.org/wiki/Q2088159","display_name":"Row and column spaces","level":3,"score":0.5451734066009521},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.42115259170532227},{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.41477638483047485},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.40574347972869873},{"id":"https://openalex.org/C135598885","wikidata":"https://www.wikidata.org/wiki/Q1366302","display_name":"Row","level":2,"score":0.3658798635005951},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36517366766929626},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.35803452134132385},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2685847580432892},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17753666639328003},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1752282679080963},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08023151755332947},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2009.20","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2009.20","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.6399999856948853}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1977723771","https://openalex.org/W2040066907","https://openalex.org/W2044407030","https://openalex.org/W2079486027","https://openalex.org/W2109824347","https://openalex.org/W2125326749","https://openalex.org/W2132621842","https://openalex.org/W2134822007","https://openalex.org/W2150949306","https://openalex.org/W6661400737"],"related_works":["https://openalex.org/W3123744736","https://openalex.org/W3121299875","https://openalex.org/W1566754092","https://openalex.org/W1992086467","https://openalex.org/W2005695153","https://openalex.org/W2011918259","https://openalex.org/W2741429854","https://openalex.org/W4214886263","https://openalex.org/W3007479582","https://openalex.org/W2096502566"],"abstract_inverted_index":{"A":[0],"new":[1],"methodology":[2],"for":[3,74,103,124,136],"improving":[4],"memory":[5,25,167],"repair":[6,17,52],"is":[7,60,100,122],"presented":[8],"which":[9,126],"can":[10,30],"be":[11,49],"applied":[12],"in":[13,56,90,163],"either":[14],"manufacture":[15],"time":[16],"or":[18],"built-in":[19],"self-repair":[20],"(BISR)":[21],"scenarios.":[22],"In":[23],"traditional":[24,166,176],"repair,":[26],"one":[27,33],"spare":[28,46,82],"column":[29,34,47,76,83],"only":[31],"replace":[32,87],"containing":[35],"a":[36,44,117,137,153,185],"defective":[37,54],"cell.":[38],"However,":[39],"the":[40,65,71,75,81,94,101,112,133,149,157,160,181],"proposed":[41,161,182],"method":[42],"allows":[43,145],"single":[45],"to":[48,51,86,110,130,165],"used":[50,109],"multiple":[53,57],"cells":[55],"columns.":[58],"This":[59,78,140],"done":[61],"by":[62],"selectively":[63],"decoding":[64,114],"row":[66,95,113,127],"address":[67,96,128],"bits":[68,129],"when":[69,173],"generating":[70],"control":[72],"signals":[73],"MUXes.":[77],"logically":[79],"segments":[80],"allowing":[84],"it":[85],"different":[88,91],"columns":[89],"partitions":[92],"of":[93,143,152,159,178,188],"space.":[97],"The":[98],"hardware":[99],"same":[102],"all":[104],"chips,":[105],"but":[106],"fuses":[107],"are":[108],"customize":[111],"circuitry":[115],"on":[116,148],"chip-by-chip":[118],"basis.":[119],"An":[120],"algorithm":[121],"described":[123],"choosing":[125],"decode":[131],"given":[132],"defect":[134,150],"map":[135,151],"particular":[138],"chip.":[139],"additional":[141],"degree":[142],"freedom":[144],"customization":[146],"based":[147],"chip":[154],"and":[155],"increases":[156],"effectiveness":[158],"scheme":[162,183],"comparison":[164],"repair.":[168],"Experimental":[169],"results":[170],"show":[171],"that,":[172],"compared":[174],"with":[175],"schemes":[177],"similar":[179],"complexity,":[180],"achieves":[184],"higher":[186],"probability":[187],"repairing":[189],"defects.":[190]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}