{"id":"https://openalex.org/W2165520536","doi":"https://doi.org/10.1109/delta.2004.10056","title":"Microsystem Development Using the TQM Design Methodology","display_name":"Microsystem Development Using the TQM Design Methodology","publication_year":2005,"publication_date":"2005-03-31","ids":{"openalex":"https://openalex.org/W2165520536","doi":"https://doi.org/10.1109/delta.2004.10056","mag":"2165520536"},"language":"en","primary_location":{"id":"doi:10.1109/delta.2004.10056","is_oa":false,"landing_page_url":"https://doi.org/10.1109/delta.2004.10056","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Second IEEE International Workshop on Electronic Design, Test and Applications","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078267731","display_name":"Andrzej Ruci\u0144ski","orcid":"https://orcid.org/0000-0002-0742-7694"},"institutions":[{"id":"https://openalex.org/I161057412","display_name":"University of New Hampshire","ror":"https://ror.org/01rmh9n78","country_code":"US","type":"education","lineage":["https://openalex.org/I161057412"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A. Rucinski","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH, USA","institution_ids":["https://openalex.org/I161057412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013046613","display_name":"A. Skrygulec","orcid":null},"institutions":[{"id":"https://openalex.org/I161057412","display_name":"University of New Hampshire","ror":"https://ror.org/01rmh9n78","country_code":"US","type":"education","lineage":["https://openalex.org/I161057412"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Skrygulec","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH, USA","institution_ids":["https://openalex.org/I161057412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079471546","display_name":"Khrystyna Pysareva","orcid":null},"institutions":[{"id":"https://openalex.org/I161057412","display_name":"University of New Hampshire","ror":"https://ror.org/01rmh9n78","country_code":"US","type":"education","lineage":["https://openalex.org/I161057412"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Pysareva","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH, USA","institution_ids":["https://openalex.org/I161057412"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089653719","display_name":"J. Mocny","orcid":null},"institutions":[{"id":"https://openalex.org/I161057412","display_name":"University of New Hampshire","ror":"https://ror.org/01rmh9n78","country_code":"US","type":"education","lineage":["https://openalex.org/I161057412"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Mocny","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH, USA","institution_ids":["https://openalex.org/I161057412"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5078267731"],"corresponding_institution_ids":["https://openalex.org/I161057412"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.23030525,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"225","last_page":"225"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9728000164031982,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9728000164031982,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12784","display_name":"Modular Robots and Swarm Intelligence","score":0.9550999999046326,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11729","display_name":"Product Development and Customization","score":0.9401000142097473,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microsystem","display_name":"Microsystem","score":0.7711191773414612},{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.7596073150634766},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5529855489730835},{"id":"https://openalex.org/keywords/formalism","display_name":"Formalism (music)","score":0.5504541993141174},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.5194413065910339},{"id":"https://openalex.org/keywords/total-quality-management","display_name":"Total quality management","score":0.43198686838150024},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3476852774620056},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.31043142080307007},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1507466435432434},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11132928729057312}],"concepts":[{"id":"https://openalex.org/C151054161","wikidata":"https://www.wikidata.org/wiki/Q379385","display_name":"Microsystem","level":2,"score":0.7711191773414612},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.7596073150634766},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5529855489730835},{"id":"https://openalex.org/C73301696","wikidata":"https://www.wikidata.org/wiki/Q5469984","display_name":"Formalism (music)","level":3,"score":0.5504541993141174},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.5194413065910339},{"id":"https://openalex.org/C138897024","wikidata":"https://www.wikidata.org/wiki/Q381001","display_name":"Total quality management","level":3,"score":0.43198686838150024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3476852774620056},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.31043142080307007},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1507466435432434},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11132928729057312},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C137335462","wikidata":"https://www.wikidata.org/wiki/Q380772","display_name":"Lean manufacturing","level":2,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C558565934","wikidata":"https://www.wikidata.org/wiki/Q2743","display_name":"Musical","level":2,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/delta.2004.10056","is_oa":false,"landing_page_url":"https://doi.org/10.1109/delta.2004.10056","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Second IEEE International Workshop on Electronic Design, Test and Applications","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1546585099","https://openalex.org/W2162949881"],"related_works":["https://openalex.org/W1988460209","https://openalex.org/W1495423923","https://openalex.org/W2289396372","https://openalex.org/W2884343688","https://openalex.org/W2005078723","https://openalex.org/W2377074248","https://openalex.org/W1981400123","https://openalex.org/W2360146884","https://openalex.org/W2012853879","https://openalex.org/W1986595884"],"abstract_inverted_index":{"Equilibrium":[0],"between":[1],"technology":[2,16],"for":[3,28,74],"microelectronic":[4,32],"systems":[5],"and":[6,39,64],"their":[7,21],"theory":[8],"is":[9,68],"constantly":[10],"sought.":[11],"However,":[12],"it":[13],"appears":[14],"that":[15,42],"advances":[17],"are":[18],"ahead":[19],"of":[20,31,60],"underlying":[22],"theory.":[23],"The":[24,66],"paper":[25],"describes":[26],"formalism":[27],"the":[29,44,58],"development":[30],"systems,":[33],"called":[34],"microsystems,":[35],"to":[36,56],"include":[37],"mechanical":[38],"optoelectronic":[40],"components":[41],"restore":[43],"necessary":[45],"balance.":[46],"Using":[47],"this":[48],"formalism,":[49],"we":[50],"introduce":[51],"a":[52,71],"TQM":[53],"design":[54],"methodology":[55,67],"emphasize":[57],"importance":[59],"integrated":[61],"design,":[62],"test,":[63],"reliability.":[65],"illustrated":[69],"using":[70],"microsystem":[72],"developed":[73],"biometrics":[75],"applications.":[76]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}