{"id":"https://openalex.org/W2108286888","doi":"https://doi.org/10.1109/ddecs.2011.5783067","title":"A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors","display_name":"A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors","publication_year":2011,"publication_date":"2011-04-01","ids":{"openalex":"https://openalex.org/W2108286888","doi":"https://doi.org/10.1109/ddecs.2011.5783067","mag":"2108286888"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2011.5783067","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2011.5783067","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063940342","display_name":"Markus Ulbricht","orcid":"https://orcid.org/0000-0001-9230-640X"},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Markus Ulbricht","raw_affiliation_strings":["Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany","Computer Engineering Group Brandenburg University of Technology Cottbus, Germany"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]},{"raw_affiliation_string":"Computer Engineering Group Brandenburg University of Technology Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084779692","display_name":"Mario Sch\u00f6lzel","orcid":"https://orcid.org/0000-0002-9552-7045"},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mario Scholzel","raw_affiliation_strings":["Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany","Computer Engineering Group Brandenburg University of Technology Cottbus, Germany"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]},{"raw_affiliation_string":"Computer Engineering Group Brandenburg University of Technology Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033964616","display_name":"Tobias Koal","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Tobias Koal","raw_affiliation_strings":["Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany","Computer Engineering Group Brandenburg University of Technology Cottbus, Germany"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]},{"raw_affiliation_string":"Computer Engineering Group Brandenburg University of Technology Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109343429","display_name":"H.T. Vierhaus","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Heinrich Theodor Vierhaus","raw_affiliation_strings":["Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany","Computer Engineering Group Brandenburg University of Technology Cottbus, Germany"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]},{"raw_affiliation_string":"Computer Engineering Group Brandenburg University of Technology Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5063940342"],"corresponding_institution_ids":["https://openalex.org/I51783024"],"apc_list":null,"apc_paid":null,"fwci":3.0224,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.92096974,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"143","last_page":"146"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-long-instruction-word","display_name":"Very long instruction word","score":0.9647222757339478},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8395177125930786},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6206128597259521},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4695611298084259},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.46390292048454285},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4138144254684448},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.40365272760391235},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.38207751512527466},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.06305602192878723}],"concepts":[{"id":"https://openalex.org/C170595534","wikidata":"https://www.wikidata.org/wiki/Q249743","display_name":"Very long instruction word","level":2,"score":0.9647222757339478},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8395177125930786},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6206128597259521},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4695611298084259},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.46390292048454285},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4138144254684448},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40365272760391235},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.38207751512527466},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06305602192878723},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2011.5783067","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2011.5783067","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W53227076","https://openalex.org/W1933555154","https://openalex.org/W1965015817","https://openalex.org/W1973020047","https://openalex.org/W2107874053","https://openalex.org/W2108785072","https://openalex.org/W2132836329","https://openalex.org/W2134205667","https://openalex.org/W2142104628","https://openalex.org/W2154237597","https://openalex.org/W2162696040","https://openalex.org/W3144226148","https://openalex.org/W4244432696","https://openalex.org/W6602153322","https://openalex.org/W6680226055"],"related_works":["https://openalex.org/W1897551170","https://openalex.org/W1991993901","https://openalex.org/W2099025818","https://openalex.org/W183562185","https://openalex.org/W60415921","https://openalex.org/W1991685745","https://openalex.org/W2004452646","https://openalex.org/W2097602901","https://openalex.org/W4248970686","https://openalex.org/W93901327"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,9,41,60,65,83,89,114],"new":[4],"in-the-field":[5,32],"self-test":[6,58],"approach":[7],"for":[8,102],"specific":[10],"VLIW":[11,42,77],"processor":[12,43,78,105],"model":[13,106],"with":[14,107,113],"emphasis":[15],"on":[16],"the":[17,21,53,72,76,98,103],"diagnostic":[18,92,100],"capability":[19,109],"of":[20,55,62,75,119],"test.":[22],"It":[23],"is":[24,68],"intended":[25],"to":[26,35,51],"be":[27,80,111],"used":[28,104],"as":[29],"start-up":[30],"test":[31],"in":[33,40,64],"order":[34,50],"localize":[36],"permanently":[37],"defect":[38],"components":[39],"model,":[44],"which":[45],"provides":[46],"self-repair":[47,108],"capability.":[48],"In":[49],"overcome":[52],"drawbacks":[54],"several":[56],"existing":[57],"techniques,":[59],"combination":[61],"them":[63],"hierarchical":[66],"manner":[67],"provided.":[69],"By":[70],"this,":[71],"data":[73],"path":[74],"can":[79,110],"checked":[81],"within":[82],"very":[84],"short":[85],"time":[86],"and":[87],"at":[88],"fine":[90],"grained":[91],"level.":[93],"The":[94],"results":[95],"show":[96],"that":[97],"required":[99],"resolution":[101],"obtained":[112],"relatively":[115],"small":[116],"hardware":[117],"overhead":[118],"about":[120],"6%.":[121]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":7}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}