{"id":"https://openalex.org/W2165195990","doi":"https://doi.org/10.1109/ddecs.2009.5012088","title":"A scheme of logic self repair including local interconnects","display_name":"A scheme of logic self repair including local interconnects","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2165195990","doi":"https://doi.org/10.1109/ddecs.2009.5012088","mag":"2165195990"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2009.5012088","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2009.5012088","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033964616","display_name":"Tobias Koal","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"T. Koal","raw_affiliation_strings":["Computer Science Institute, Brandenburg University of Technology, Cottbus, Germany"],"affiliations":[{"raw_affiliation_string":"Computer Science Institute, Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001089927","display_name":"Daniel Scheit","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"D. Scheit","raw_affiliation_strings":["Computer Science Institute, Brandenburg University of Technology, Cottbus, Germany"],"affiliations":[{"raw_affiliation_string":"Computer Science Institute, Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109343429","display_name":"H.T. Vierhaus","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H. T. Vierhaus","raw_affiliation_strings":["Computer Science Institute, Brandenburg University of Technology, Cottbus, Germany"],"affiliations":[{"raw_affiliation_string":"Computer Science Institute, Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5033964616"],"corresponding_institution_ids":["https://openalex.org/I51783024"],"apc_list":null,"apc_paid":null,"fwci":0.8972,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.78431223,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"8","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5950785279273987},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5736055970191956},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.540047287940979},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5312072038650513},{"id":"https://openalex.org/keywords/cover","display_name":"Cover (algebra)","score":0.5033134818077087},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.452565461397171},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4482901692390442},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4339723289012909},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4306041896343231},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.4272534251213074},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.4158763885498047},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3514380156993866},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2620919644832611},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08596217632293701},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.08314746618270874}],"concepts":[{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5950785279273987},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5736055970191956},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.540047287940979},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5312072038650513},{"id":"https://openalex.org/C2780428219","wikidata":"https://www.wikidata.org/wiki/Q16952335","display_name":"Cover (algebra)","level":2,"score":0.5033134818077087},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.452565461397171},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4482901692390442},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4339723289012909},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4306041896343231},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.4272534251213074},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.4158763885498047},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3514380156993866},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2620919644832611},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08596217632293701},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.08314746618270874},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2009.5012088","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2009.5012088","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1515138646","https://openalex.org/W1548975601","https://openalex.org/W2099708835","https://openalex.org/W2099971661","https://openalex.org/W2107672210","https://openalex.org/W2112375479","https://openalex.org/W2115554176","https://openalex.org/W2125169487","https://openalex.org/W2134822007","https://openalex.org/W2138586957","https://openalex.org/W2139258857","https://openalex.org/W2150983674","https://openalex.org/W2157843090","https://openalex.org/W2210835679","https://openalex.org/W4239366183","https://openalex.org/W6630868990","https://openalex.org/W6688293643"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W4232403550","https://openalex.org/W623607250","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4245429118","https://openalex.org/W4205110281","https://openalex.org/W4386230336","https://openalex.org/W2170979950","https://openalex.org/W1900707063"],"abstract_inverted_index":{"Technology":[0],"forecasts":[1],"concerning":[2],"the":[3,59],"development":[4],"of":[5,12,24,46,61],"CMOS":[6],"technologies":[7],"predict":[8],"a":[9,21,65],"higher":[10,22,34],"level":[11],"intermittent":[13],"faults":[14],"due":[15,28],"to":[16,29],"radiation":[17],"effects,":[18],"but":[19],"also":[20,81],"density":[23],"permanent":[25],"fault":[26],"effects":[27],"inevitable":[30],"parameter":[31],"shifts":[32],"and":[33,41,57],"stress":[35],"factors.":[36],"For":[37],"high":[38],"production":[39,55],"yield":[40],"long-term":[42],"dependable":[43],"operation,":[44],"mechanisms":[45,74],"built-in":[47],"self":[48,77],"repair":[49,78],"that":[50,79],"can":[51],"be":[52],"used":[53],"after":[54],"test":[56],"in":[58,70],"field":[60],"application":[62],"are":[63],"becoming":[64],"must.":[66],"The":[67],"architecture":[68],"introduced":[69],"this":[71],"paper":[72],"includes":[73],"for":[75],"logic":[76],"may":[80],"cover":[82],"local":[83],"interconnects.":[84]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}