{"id":"https://openalex.org/W4402916256","doi":"https://doi.org/10.1109/cvprw63382.2024.00012","title":"Self-Supervised Learning with Generative Adversarial Networks for Electron Microscopy","display_name":"Self-Supervised Learning with Generative Adversarial Networks for Electron Microscopy","publication_year":2024,"publication_date":"2024-06-17","ids":{"openalex":"https://openalex.org/W4402916256","doi":"https://doi.org/10.1109/cvprw63382.2024.00012"},"language":"en","primary_location":{"id":"doi:10.1109/cvprw63382.2024.00012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cvprw63382.2024.00012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004352063","display_name":"Bashir Kazimi","orcid":"https://orcid.org/0000-0003-1802-7511"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bashir Kazimi","raw_affiliation_strings":["Forschungszentrum Jülich GmbH, Jülich,IAS-9,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Jülich GmbH, Jülich,IAS-9,Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078653027","display_name":"Karina Ruzaeva","orcid":"https://orcid.org/0000-0003-3610-0989"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Karina Ruzaeva","raw_affiliation_strings":["Forschungszentrum Jülich GmbH, Jülich,IAS-9,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Jülich GmbH, Jülich,IAS-9,Germany","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022752212","display_name":"Stefan Sandfeld","orcid":"https://orcid.org/0000-0001-9560-4728"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Stefan Sandfeld","raw_affiliation_strings":["Forschungszentrum Jülich GmbH, Jülich,IAS-9,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum Jülich GmbH, Jülich,IAS-9,Germany","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":27.2158,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.99876999,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"71","last_page":"81"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9786999821662903,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9786999821662903,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9704999923706055,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11948","display_name":"Machine Learning in Materials Science","score":0.967199981212616,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/generative-grammar","display_name":"Generative grammar","score":0.6944781541824341},{"id":"https://openalex.org/keywords/adversarial-system","display_name":"Adversarial system","score":0.6166603565216064},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5791405439376831},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.514323353767395},{"id":"https://openalex.org/keywords/electron-microscope","display_name":"Electron microscope","score":0.414445161819458},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16251307725906372},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1098315417766571}],"concepts":[{"id":"https://openalex.org/C39890363","wikidata":"https://www.wikidata.org/wiki/Q36108","display_name":"Generative grammar","level":2,"score":0.6944781541824341},{"id":"https://openalex.org/C37736160","wikidata":"https://www.wikidata.org/wiki/Q1801315","display_name":"Adversarial system","level":2,"score":0.6166603565216064},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5791405439376831},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.514323353767395},{"id":"https://openalex.org/C93877712","wikidata":"https://www.wikidata.org/wiki/Q132560","display_name":"Electron microscope","level":2,"score":0.414445161819458},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16251307725906372},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1098315417766571}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cvprw63382.2024.00012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cvprw63382.2024.00012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W1554014268","https://openalex.org/W1901129140","https://openalex.org/W2075991527","https://openalex.org/W2248723555","https://openalex.org/W2324717703","https://openalex.org/W2403945241","https://openalex.org/W2502949459","https://openalex.org/W2590915453","https://openalex.org/W2593414223","https://openalex.org/W2749776612","https://openalex.org/W2916798096","https://openalex.org/W2953327099","https://openalex.org/W2963073614","https://openalex.org/W2963420272","https://openalex.org/W2982409629","https://openalex.org/W2990623796","https://openalex.org/W3014641072","https://openalex.org/W3035524453","https://openalex.org/W3045580189","https://openalex.org/W3110318829","https://openalex.org/W3111968824","https://openalex.org/W3118329858","https://openalex.org/W3126990165","https://openalex.org/W3129169341","https://openalex.org/W3133279773","https://openalex.org/W3134276259","https://openalex.org/W3144539868","https://openalex.org/W3159481202","https://openalex.org/W3162481326","https://openalex.org/W3176870472","https://openalex.org/W3201061622","https://openalex.org/W4213003826","https://openalex.org/W4220879402","https://openalex.org/W4225985153","https://openalex.org/W4249260035","https://openalex.org/W4285542095","https://openalex.org/W4295339580","https://openalex.org/W4296380948","https://openalex.org/W4300772814","https://openalex.org/W4306735610","https://openalex.org/W4308493278","https://openalex.org/W4312804044","https://openalex.org/W4313894186","https://openalex.org/W4385605177","https://openalex.org/W4386083047","https://openalex.org/W4386352695","https://openalex.org/W4388928209","https://openalex.org/W4388951848","https://openalex.org/W6772379172","https://openalex.org/W6774314701","https://openalex.org/W6794559225"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2502115930","https://openalex.org/W2482350142","https://openalex.org/W4246396837","https://openalex.org/W3126451824","https://openalex.org/W1561927205","https://openalex.org/W3191453585","https://openalex.org/W4297672492","https://openalex.org/W4310988119"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3],"explore":[4],"the":[5,53,73,83],"potential":[6],"of":[7,30,59,75,85,116],"self-supervised":[8,22,76,97],"learning":[9],"with":[10,44,67],"Generative":[11],"Adversarial":[12],"Networks":[13],"(GANs)":[14],"for":[15,27],"electron":[16,86],"microscopy":[17],"datasets.":[18],"We":[19,71,94],"show":[20],"how":[21],"pretraining":[23,77,98],"facilitates":[24],"efficient":[25,114],"fine-tuning":[26],"a":[28,101],"spectrum":[29],"downstream":[31,80],"tasks,":[32],"including":[33],"semantic":[34],"segmentation,":[35],"denoising,":[36],"noise":[37],"&":[38],"background":[39],"removal,":[40],"and":[41,48,91,113],"super-resolution.":[42],"Experimentation":[43],"varying":[45],"model":[46],"complexities":[47],"receptive":[49],"field":[50],"sizes":[51],"reveals":[52],"remarkable":[54],"phenomenon":[55],"that":[56,96],"fine-tuned":[57],"models":[58,66],"lower":[60],"complexity":[61],"consistently":[62],"outperform":[63],"more":[64],"complex":[65],"random":[68],"weight":[69],"initialization.":[70],"demonstrate":[72],"versatility":[74],"across":[78],"various":[79],"tasks":[81],"in":[82],"context":[84],"microscopy,":[87],"allowing":[88],"faster":[89],"convergence":[90],"better":[92],"performance.":[93],"conclude":[95],"serves":[99],"as":[100],"powerful":[102],"catalyst,":[103],"being":[104],"especially":[105],"advantageous":[106],"when":[107],"limited":[108],"annotated":[109],"data":[110],"are":[111],"available":[112],"scaling":[115],"computational":[117],"cost":[118],"is":[119],"important.":[120]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2}],"updated_date":"2026-08-04T08:18:43.703281","created_date":"2025-10-10T00:00:00"}