{"id":"https://openalex.org/W1897260080","doi":"https://doi.org/10.1109/cvpr.2015.7299053","title":"Integrating parametric and non-parametric models for scene labeling","display_name":"Integrating parametric and non-parametric models for scene labeling","publication_year":2015,"publication_date":"2015-06-01","ids":{"openalex":"https://openalex.org/W1897260080","doi":"https://doi.org/10.1109/cvpr.2015.7299053","mag":"1897260080"},"language":"en","primary_location":{"id":"doi:10.1109/cvpr.2015.7299053","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cvpr.2015.7299053","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048015379","display_name":"Bing Shuai","orcid":"https://orcid.org/0000-0001-5811-9950"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Bing Shuai","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","School of Electrical and Electronic Engineering , Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering , Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100367368","display_name":"Gang Wang","orcid":"https://orcid.org/0000-0002-3359-3565"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Gang Wang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","School of Electrical and Electronic Engineering , Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering , Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006662591","display_name":"Zhen Zuo","orcid":"https://orcid.org/0000-0003-1555-1756"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Zhen Zuo","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","School of Electrical and Electronic Engineering , Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering , Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100382568","display_name":"Bing Wang","orcid":"https://orcid.org/0000-0003-4945-7725"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Bing Wang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","School of Electrical and Electronic Engineering , Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering , Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081053261","display_name":"Lifan Zhao","orcid":"https://orcid.org/0000-0001-9107-570X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Lifan Zhao","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","School of Electrical and Electronic Engineering , Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering , Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5048015379"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":8.7911,"has_fulltext":false,"cited_by_count":53,"citation_normalized_percentile":{"value":0.98510526,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"4249","last_page":"4258"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.780173659324646},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7419322729110718},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.7404382228851318},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7399362325668335},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7127484679222107},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6804418563842773},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6790949106216431},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.670250654220581},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6051340699195862},{"id":"https://openalex.org/keywords/ambiguity","display_name":"Ambiguity","score":0.5847047567367554},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5485265851020813},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5382447242736816},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.4417188763618469},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.40509337186813354},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14574506878852844},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07243615388870239}],"concepts":[{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.780173659324646},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7419322729110718},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.7404382228851318},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7399362325668335},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7127484679222107},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6804418563842773},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6790949106216431},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.670250654220581},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6051340699195862},{"id":"https://openalex.org/C2780522230","wikidata":"https://www.wikidata.org/wiki/Q1140419","display_name":"Ambiguity","level":2,"score":0.5847047567367554},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5485265851020813},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5382447242736816},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.4417188763618469},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.40509337186813354},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14574506878852844},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07243615388870239},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cvpr.2015.7299053","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cvpr.2015.7299053","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10","score":0.800000011920929}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321026","display_name":"Ministry of Earth Sciences","ror":"https://ror.org/013cf5k59"},{"id":"https://openalex.org/F4320322724","display_name":"Ministry of Education, India","ror":"https://ror.org/048xjjh50"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":50,"referenced_works":["https://openalex.org/W38955421","https://openalex.org/W182048296","https://openalex.org/W190007845","https://openalex.org/W315880484","https://openalex.org/W1528789833","https://openalex.org/W1532257412","https://openalex.org/W1542723449","https://openalex.org/W1546771929","https://openalex.org/W1597779259","https://openalex.org/W1849277567","https://openalex.org/W1963882359","https://openalex.org/W1968752118","https://openalex.org/W2022508996","https://openalex.org/W2027327099","https://openalex.org/W2047226863","https://openalex.org/W2050159143","https://openalex.org/W2051179318","https://openalex.org/W2051458493","https://openalex.org/W2053973158","https://openalex.org/W2059424674","https://openalex.org/W2066757459","https://openalex.org/W2076434944","https://openalex.org/W2095844239","https://openalex.org/W2112796928","https://openalex.org/W2113325037","https://openalex.org/W2116877738","https://openalex.org/W2125849446","https://openalex.org/W2136391815","https://openalex.org/W2145287260","https://openalex.org/W2147414309","https://openalex.org/W2151103935","https://openalex.org/W2154083146","https://openalex.org/W2154644822","https://openalex.org/W2155541015","https://openalex.org/W2161381512","https://openalex.org/W2162915993","https://openalex.org/W2163605009","https://openalex.org/W2252984343","https://openalex.org/W2504108613","https://openalex.org/W2536208356","https://openalex.org/W2953066166","https://openalex.org/W4294375521","https://openalex.org/W6632360823","https://openalex.org/W6674793120","https://openalex.org/W6676698716","https://openalex.org/W6680285999","https://openalex.org/W6681853784","https://openalex.org/W6682778277","https://openalex.org/W6684191040","https://openalex.org/W6764750447"],"related_works":["https://openalex.org/W2965546495","https://openalex.org/W4389116644","https://openalex.org/W2353179089","https://openalex.org/W2153315159","https://openalex.org/W3103844505","https://openalex.org/W259157601","https://openalex.org/W4205463238","https://openalex.org/W2110523656","https://openalex.org/W2997457842","https://openalex.org/W1997431798"],"abstract_inverted_index":{"We":[0,39],"adopt":[1],"Convolutional":[2],"Neural":[3],"Networks":[4],"(CNN)":[5],"as":[6],"our":[7],"parametric":[8],"model":[9],"to":[10],"learn":[11],"discriminative":[12],"features":[13],"and":[14,74,87],"classifiers":[15],"for":[16,59],"local":[17,27,73],"patch":[18],"classification.":[19],"As":[20],"visually":[21],"similar":[22],"pixels":[23],"are":[24],"indistinguishable":[25],"from":[26],"context,":[28],"we":[29,81],"alleviate":[30],"such":[31],"ambiguity":[32],"by":[33,71],"introducing":[34],"a":[35,45,49],"global":[36,42,61,75],"scene":[37],"constraint.":[38],"estimate":[40],"the":[41],"potential":[43,62],"in":[44],"non-parametric":[46],"framework.":[47],"Furthermore,":[48],"large":[50],"margin":[51],"based":[52],"CNN":[53],"metric":[54],"learning":[55],"method":[56],"is":[57,69],"proposed":[58],"better":[60],"estimation.":[63],"The":[64],"final":[65],"pixel":[66],"class":[67],"prediction":[68],"performed":[70],"integrating":[72],"beliefs.":[76],"Even":[77],"without":[78],"any":[79],"post-processing,":[80],"achieve":[82],"state-of-the-art":[83],"performance":[84],"on":[85,90],"SiftFlow":[86],"competitive":[88],"results":[89],"Stanford":[91],"Background":[92],"benchmark.":[93]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":13},{"year":2016,"cited_by_count":16},{"year":2015,"cited_by_count":10}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}