{"id":"https://openalex.org/W1921947585","doi":"https://doi.org/10.1109/cvpr.2015.7298728","title":"Line-sweep: Cross-ratio for wide-baseline matching and 3D reconstruction","display_name":"Line-sweep: Cross-ratio for wide-baseline matching and 3D reconstruction","publication_year":2015,"publication_date":"2015-06-01","ids":{"openalex":"https://openalex.org/W1921947585","doi":"https://doi.org/10.1109/cvpr.2015.7298728","mag":"1921947585"},"language":"en","primary_location":{"id":"doi:10.1109/cvpr.2015.7298728","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cvpr.2015.7298728","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://orbilu.uni.lu/handle/10993/20806","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101811303","display_name":"Srikumar Ramalingam","orcid":"https://orcid.org/0000-0002-2844-4119"},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Srikumar Ramalingam","raw_affiliation_strings":["Mitsubishi Electric Research Laboratories (MERL), Cambridge, USA","Mitsubishi Electric Research Labs (MERL),Cambridge,USA"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Research Laboratories (MERL), Cambridge, USA","institution_ids":["https://openalex.org/I4210159266"]},{"raw_affiliation_string":"Mitsubishi Electric Research Labs (MERL),Cambridge,USA","institution_ids":["https://openalex.org/I4210159266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015602578","display_name":"Michel Antunes","orcid":"https://orcid.org/0000-0001-6115-5186"},"institutions":[{"id":"https://openalex.org/I186903577","display_name":"University of Luxembourg","ror":"https://ror.org/036x5ad56","country_code":"LU","type":"education","lineage":["https://openalex.org/I186903577"]}],"countries":["LU"],"is_corresponding":false,"raw_author_name":"Michel Antunes","raw_affiliation_strings":["Reliability and Trust (SnT), University of Luxembourg, Luxembourg","Interdisciplinary Centre for Security, Reliability and Trust (SnT), University of Luxembourg, Luxembourg"],"affiliations":[{"raw_affiliation_string":"Reliability and Trust (SnT), University of Luxembourg, Luxembourg","institution_ids":["https://openalex.org/I186903577"]},{"raw_affiliation_string":"Interdisciplinary Centre for Security, Reliability and Trust (SnT), University of Luxembourg, Luxembourg","institution_ids":["https://openalex.org/I186903577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003047938","display_name":"Daniel Snow","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daniel Snow","raw_affiliation_strings":["Mitsubishi Electric Research Laboratories (MERL), Cambridge, USA","Mitsubishi Electric Research Labs (MERL),Cambridge,USA"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Research Laboratories (MERL), Cambridge, USA","institution_ids":["https://openalex.org/I4210159266"]},{"raw_affiliation_string":"Mitsubishi Electric Research Labs (MERL),Cambridge,USA","institution_ids":["https://openalex.org/I4210159266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071967339","display_name":"Gim Hee Lee","orcid":"https://orcid.org/0000-0002-1583-0475"},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gim Hee Lee","raw_affiliation_strings":["Mitsubishi Electric Research Laboratories (MERL), Cambridge, USA","Mitsubishi Electric Research Labs (MERL),Cambridge,USA"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Research Laboratories (MERL), Cambridge, USA","institution_ids":["https://openalex.org/I4210159266"]},{"raw_affiliation_string":"Mitsubishi Electric Research Labs (MERL),Cambridge,USA","institution_ids":["https://openalex.org/I4210159266"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064302017","display_name":"Sudeep Pillai","orcid":null},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sudeep Pillai","raw_affiliation_strings":["Massachussetts Institute of Technology (MIT), Cambridge, USA","[Massachussetts Institute of Technology (MIT), Cambridge, USA]"],"affiliations":[{"raw_affiliation_string":"Massachussetts Institute of Technology (MIT), Cambridge, USA","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"[Massachussetts Institute of Technology (MIT), Cambridge, USA]","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101811303"],"corresponding_institution_ids":["https://openalex.org/I4210159266"],"apc_list":null,"apc_paid":null,"fwci":89.7814,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.99746616,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1238","last_page":"1246"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.6871787309646606},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6268628239631653},{"id":"https://openalex.org/keywords/3d-reconstruction","display_name":"3D reconstruction","score":0.6129942536354065},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6028050780296326},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5839363932609558},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.5816361308097839},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5636965036392212},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.5506781339645386},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.4998176097869873},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4857912063598633},{"id":"https://openalex.org/keywords/baseline","display_name":"Baseline (sea)","score":0.4798119068145752},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4539260268211365},{"id":"https://openalex.org/keywords/point-set-registration","display_name":"Point set registration","score":0.44301486015319824},{"id":"https://openalex.org/keywords/cross-ratio","display_name":"Cross-ratio","score":0.4373266398906708},{"id":"https://openalex.org/keywords/line-segment","display_name":"Line segment","score":0.42990708351135254},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4295854866504669},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3491380214691162},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2682909071445465},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.08533740043640137}],"concepts":[{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.6871787309646606},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6268628239631653},{"id":"https://openalex.org/C109950114","wikidata":"https://www.wikidata.org/wiki/Q4464732","display_name":"3D reconstruction","level":2,"score":0.6129942536354065},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6028050780296326},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5839363932609558},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.5816361308097839},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5636965036392212},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.5506781339645386},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4998176097869873},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4857912063598633},{"id":"https://openalex.org/C12725497","wikidata":"https://www.wikidata.org/wiki/Q810247","display_name":"Baseline (sea)","level":2,"score":0.4798119068145752},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4539260268211365},{"id":"https://openalex.org/C200336642","wikidata":"https://www.wikidata.org/wiki/Q15058706","display_name":"Point set registration","level":3,"score":0.44301486015319824},{"id":"https://openalex.org/C101586328","wikidata":"https://www.wikidata.org/wiki/Q899539","display_name":"Cross-ratio","level":2,"score":0.4373266398906708},{"id":"https://openalex.org/C182124507","wikidata":"https://www.wikidata.org/wiki/Q166154","display_name":"Line segment","level":2,"score":0.42990708351135254},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4295854866504669},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3491380214691162},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2682909071445465},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.08533740043640137},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/cvpr.2015.7298728","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cvpr.2015.7298728","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)","raw_type":"proceedings-article"},{"id":"pmh:oai:orbilu.uni.lu:10993/20806","is_oa":true,"landing_page_url":"http://orbilu.uni.lu/handle/10993/20806","pdf_url":null,"source":{"id":"https://openalex.org/S4306401815","display_name":"Open Repository and Bibliography (University of Luxembourg)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I186903577","host_organization_name":"University of Luxembourg","host_organization_lineage":["https://openalex.org/I186903577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2015); IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 7-06-2015 to 12-06-2015","raw_type":"peer reviewed"}],"best_oa_location":{"id":"pmh:oai:orbilu.uni.lu:10993/20806","is_oa":true,"landing_page_url":"http://orbilu.uni.lu/handle/10993/20806","pdf_url":null,"source":{"id":"https://openalex.org/S4306401815","display_name":"Open Repository and Bibliography (University of Luxembourg)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I186903577","host_organization_name":"University of Luxembourg","host_organization_lineage":["https://openalex.org/I186903577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-sa","license_id":"https://openalex.org/licenses/cc-by-nc-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2015); IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 7-06-2015 to 12-06-2015","raw_type":"peer reviewed"},"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.7900000214576721}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W612478963","https://openalex.org/W1485855073","https://openalex.org/W1526242170","https://openalex.org/W1570383443","https://openalex.org/W1923390179","https://openalex.org/W1970044719","https://openalex.org/W1990976732","https://openalex.org/W2001790138","https://openalex.org/W2014710139","https://openalex.org/W2019769120","https://openalex.org/W2031710259","https://openalex.org/W2044914660","https://openalex.org/W2059351806","https://openalex.org/W2099443716","https://openalex.org/W2105303354","https://openalex.org/W2109635530","https://openalex.org/W2111003594","https://openalex.org/W2111736590","https://openalex.org/W2117228865","https://openalex.org/W2121225280","https://openalex.org/W2121308169","https://openalex.org/W2123212074","https://openalex.org/W2129404737","https://openalex.org/W2132726652","https://openalex.org/W2135926837","https://openalex.org/W2136527382","https://openalex.org/W2137071769","https://openalex.org/W2138821028","https://openalex.org/W2139331573","https://openalex.org/W2148202683","https://openalex.org/W2150066425","https://openalex.org/W2151237806","https://openalex.org/W2151290401","https://openalex.org/W2156598602","https://openalex.org/W2156953558","https://openalex.org/W2165114467","https://openalex.org/W2168439642","https://openalex.org/W2539081130","https://openalex.org/W4388320451","https://openalex.org/W6618872416","https://openalex.org/W6631696161","https://openalex.org/W6647918550"],"related_works":["https://openalex.org/W10559721","https://openalex.org/W2360462433","https://openalex.org/W2027009566","https://openalex.org/W2137397854","https://openalex.org/W2058456984","https://openalex.org/W1969599301","https://openalex.org/W2315984161","https://openalex.org/W1182252532","https://openalex.org/W1556704309","https://openalex.org/W1921947585"],"abstract_inverted_index":{"We":[0,46,72,93,106],"propose":[1,47],"a":[2,48,95],"simple":[3],"and":[4,14,23,36,52,102,110],"useful":[5],"idea":[6],"based":[7],"on":[8],"cross-ratio":[9,74],"constraint":[10],"for":[11,33,99],"wide-baseline":[12],"matching":[13,35],"3D":[15,112],"reconstruction.":[16,113],"Most":[17],"existing":[18],"methods":[19],"exploit":[20],"feature":[21,69],"points":[22,55],"planes":[24],"from":[25],"images.":[26],"Lines":[27],"have":[28],"always":[29],"been":[30],"considered":[31],"notorious":[32],"both":[34,100],"reconstruction":[37],"due":[38],"to":[39,50,76,89],"the":[40],"lack":[41],"of":[42,62,81],"good":[43],"line":[44,91],"descriptors.":[45],"method":[49,96],"generate":[51],"match":[53],"new":[54,82],"using":[56,60,67],"virtual":[57],"lines":[58],"constructed":[59],"pairs":[61],"keypoints,":[63],"which":[64,85],"are":[65,86],"obtained":[66],"standard":[68],"point":[70,83],"detectors.":[71],"use":[73],"constraints":[75],"obtain":[77,90],"an":[78],"initial":[79],"set":[80],"matches,":[84],"subsequently":[87],"used":[88],"correspondences.":[92],"develop":[94],"that":[97],"works":[98],"calibrated":[101],"uncalibrated":[103],"camera":[104],"configurations.":[105],"show":[107],"compelling":[108],"line-matching":[109],"large-scale":[111]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}