{"id":"https://openalex.org/W2168898335","doi":"https://doi.org/10.1109/cvpr.2003.1211453","title":"Background subtraction based on cooccurrence of image variations","display_name":"Background subtraction based on cooccurrence of image variations","publication_year":2003,"publication_date":"2003-11-20","ids":{"openalex":"https://openalex.org/W2168898335","doi":"https://doi.org/10.1109/cvpr.2003.1211453","mag":"2168898335"},"language":"en","primary_location":{"id":"doi:10.1109/cvpr.2003.1211453","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cvpr.2003.1211453","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2003. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024950554","display_name":"M. Seki","orcid":"https://orcid.org/0000-0003-4207-1408"},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"M. Seki","raw_affiliation_strings":["Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Hyogo, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085209922","display_name":"Takahiro Wada","orcid":"https://orcid.org/0000-0002-4518-8903"},"institutions":[{"id":"https://openalex.org/I75198481","display_name":"Wakayama University","ror":"https://ror.org/05wr49d48","country_code":"JP","type":"education","lineage":["https://openalex.org/I75198481"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Wada","raw_affiliation_strings":["Faculty of Systems Engineering, Wakayama University, Wakayama, Japan","Faculty of systems Engineering, Wakayama University, Wakayama, Japan"],"affiliations":[{"raw_affiliation_string":"Faculty of Systems Engineering, Wakayama University, Wakayama, Japan","institution_ids":["https://openalex.org/I75198481"]},{"raw_affiliation_string":"Faculty of systems Engineering, Wakayama University, Wakayama, Japan","institution_ids":["https://openalex.org/I75198481"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056817532","display_name":"Hideto Fujiwara","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Fujiwara","raw_affiliation_strings":["Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Hyogo, Japan","[Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Hyogo, Japan]"],"affiliations":[{"raw_affiliation_string":"Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]},{"raw_affiliation_string":"[Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Hyogo, Japan]","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100620014","display_name":"Kazuhiko Sumi","orcid":"https://orcid.org/0000-0002-9165-5912"},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Sumi","raw_affiliation_strings":["Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Hyogo, Japan","[Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Hyogo, Japan]"],"affiliations":[{"raw_affiliation_string":"Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]},{"raw_affiliation_string":"[Advanced Technology R&D Center, Mitsubishi Electric Corporation Limited, Hyogo, Japan]","institution_ids":["https://openalex.org/I4210133125"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5024950554"],"corresponding_institution_ids":["https://openalex.org/I4210133125"],"apc_list":null,"apc_paid":null,"fwci":6.9398,"has_fulltext":false,"cited_by_count":196,"citation_normalized_percentile":{"value":0.97461595,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"2","issue":null,"first_page":"II","last_page":"65"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/background-subtraction","display_name":"Background subtraction","score":0.8507299423217773},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.8281077146530151},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7247235774993896},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7072910070419312},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6694338321685791},{"id":"https://openalex.org/keywords/background-image","display_name":"Background image","score":0.6629952788352966},{"id":"https://openalex.org/keywords/property","display_name":"Property (philosophy)","score":0.637504518032074},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6144667267799377},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.6119421720504761},{"id":"https://openalex.org/keywords/image-subtraction","display_name":"Image subtraction","score":0.5803174376487732},{"id":"https://openalex.org/keywords/subtraction","display_name":"Subtraction","score":0.563228964805603},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5222930908203125},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4703769087791443},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.3269980251789093},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22678950428962708},{"id":"https://openalex.org/keywords/binary-image","display_name":"Binary image","score":0.12244191765785217}],"concepts":[{"id":"https://openalex.org/C32653426","wikidata":"https://www.wikidata.org/wiki/Q3813641","display_name":"Background subtraction","level":3,"score":0.8507299423217773},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.8281077146530151},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7247235774993896},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7072910070419312},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6694338321685791},{"id":"https://openalex.org/C3019635856","wikidata":"https://www.wikidata.org/wiki/Q1619726","display_name":"Background image","level":3,"score":0.6629952788352966},{"id":"https://openalex.org/C189950617","wikidata":"https://www.wikidata.org/wiki/Q937228","display_name":"Property (philosophy)","level":2,"score":0.637504518032074},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6144667267799377},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.6119421720504761},{"id":"https://openalex.org/C37672646","wikidata":"https://www.wikidata.org/wiki/Q6002283","display_name":"Image subtraction","level":5,"score":0.5803174376487732},{"id":"https://openalex.org/C68060419","wikidata":"https://www.wikidata.org/wiki/Q40754","display_name":"Subtraction","level":2,"score":0.563228964805603},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5222930908203125},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4703769087791443},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3269980251789093},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22678950428962708},{"id":"https://openalex.org/C193828747","wikidata":"https://www.wikidata.org/wiki/Q864118","display_name":"Binary image","level":4,"score":0.12244191765785217},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cvpr.2003.1211453","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cvpr.2003.1211453","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2003. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1893891742","https://openalex.org/W2013855924","https://openalex.org/W2040873636","https://openalex.org/W2097350683","https://openalex.org/W2102095249","https://openalex.org/W2115213191","https://openalex.org/W2148290050","https://openalex.org/W2148309101","https://openalex.org/W6653966436","https://openalex.org/W6675329273","https://openalex.org/W6681627591"],"related_works":["https://openalex.org/W2013855924","https://openalex.org/W4251986860","https://openalex.org/W1975008161","https://openalex.org/W2002094820","https://openalex.org/W1934883969","https://openalex.org/W2375321927","https://openalex.org/W2381380858","https://openalex.org/W2711921055","https://openalex.org/W2010623741","https://openalex.org/W2022276948"],"abstract_inverted_index":{"This":[0,92],"paper":[1],"presents":[2],"a":[3],"novel":[4],"background":[5,32,41,99],"subtraction":[6],"method":[7],"for":[8,107],"detecting":[9],"foreground":[10],"objects":[11],"in":[12],"dynamic":[13],"scenes":[14],"involving":[15],"swaying":[16],"trees":[17],"and":[18],"fluttering":[19],"flags.":[20],"Most":[21],"methods":[22],"proposed":[23],"so":[24],"far":[25],"adjust":[26],"the":[27,31,37,44,59,65,76,111],"permissible":[28,53],"range":[29],"of":[30,40,113],"image":[33,79,83,100],"variations":[34,80],"according":[35],"to":[36],"training":[38],"samples":[39],"images.":[42],"Thus,":[43],"detection":[45,66],"sensitivity":[46,67],"decreases":[47],"at":[48,81],"those":[49],"pixels":[50],"having":[51],"wide":[52],"ranges.":[54],"If":[55],"we":[56,74],"can":[57,68],"narrow":[58],"ranges":[60],"by":[61],"analyzing":[62],"input":[63],"images,":[64],"be":[69],"improved.":[70],"For":[71],"this":[72],"narrowing,":[73],"employ":[75],"property":[77],"that":[78],"neighboring":[82],"blocks":[84],"have":[85],"strong":[86],"correlation,":[87],"also":[88],"known":[89],"as":[90],"\"cooccurrence\".":[91],"approach":[93],"is":[94],"essentially":[95],"different":[96],"from":[97],"chronological":[98],"updating":[101],"or":[102],"morphological":[103],"postprocessing.":[104],"Experimental":[105],"results":[106],"real":[108],"images":[109],"demonstrate":[110],"effectiveness":[112],"our":[114],"method.":[115]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":13},{"year":2016,"cited_by_count":14},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":10},{"year":2013,"cited_by_count":14},{"year":2012,"cited_by_count":23}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}