{"id":"https://openalex.org/W2543954433","doi":"https://doi.org/10.1109/comcomap.2014.7017168","title":"High-temperature electrode faulted diagnosis for copper electrolytic cell","display_name":"High-temperature electrode faulted diagnosis for copper electrolytic cell","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2543954433","doi":"https://doi.org/10.1109/comcomap.2014.7017168","mag":"2543954433"},"language":"en","primary_location":{"id":"doi:10.1109/comcomap.2014.7017168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/comcomap.2014.7017168","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Computers, Communications and IT Applications Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100607416","display_name":"Yiding Wang","orcid":"https://orcid.org/0000-0001-7289-8751"},"institutions":[{"id":"https://openalex.org/I1456306","display_name":"North China University of Technology","ror":"https://ror.org/01nky7652","country_code":"CN","type":"education","lineage":["https://openalex.org/I1456306"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yiding Wang","raw_affiliation_strings":["College of Information Engineering, North China University of technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"College of Information Engineering, North China University of technology, Beijing, China","institution_ids":["https://openalex.org/I1456306"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002749135","display_name":"Di Zhang","orcid":"https://orcid.org/0000-0001-9395-9672"},"institutions":[{"id":"https://openalex.org/I1456306","display_name":"North China University of Technology","ror":"https://ror.org/01nky7652","country_code":"CN","type":"education","lineage":["https://openalex.org/I1456306"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Di Zhang","raw_affiliation_strings":["College of Information Engineering, North China University of technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"College of Information Engineering, North China University of technology, Beijing, China","institution_ids":["https://openalex.org/I1456306"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100419432","display_name":"Xiaoyu Zhang","orcid":"https://orcid.org/0000-0003-1577-5573"},"institutions":[{"id":"https://openalex.org/I1456306","display_name":"North China University of Technology","ror":"https://ror.org/01nky7652","country_code":"CN","type":"education","lineage":["https://openalex.org/I1456306"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyu Zhang","raw_affiliation_strings":["College of Information Engineering, North China University of technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"College of Information Engineering, North China University of technology, Beijing, China","institution_ids":["https://openalex.org/I1456306"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043144207","display_name":"Wenqi Wu","orcid":"https://orcid.org/0000-0002-5343-6508"},"institutions":[{"id":"https://openalex.org/I1456306","display_name":"North China University of Technology","ror":"https://ror.org/01nky7652","country_code":"CN","type":"education","lineage":["https://openalex.org/I1456306"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenqi Wu","raw_affiliation_strings":["College of Information Engineering, North China University of technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"College of Information Engineering, North China University of technology, Beijing, China","institution_ids":["https://openalex.org/I1456306"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100607416"],"corresponding_institution_ids":["https://openalex.org/I1456306"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.39654636,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"47","issue":null,"first_page":"46","last_page":"49"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9539999961853027,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/copper","display_name":"Copper","score":0.8081557750701904},{"id":"https://openalex.org/keywords/cathode","display_name":"Cathode","score":0.7376906871795654},{"id":"https://openalex.org/keywords/anode","display_name":"Anode","score":0.7357620000839233},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.723026692867279},{"id":"https://openalex.org/keywords/electrolyte","display_name":"Electrolyte","score":0.6998677253723145},{"id":"https://openalex.org/keywords/electrolytic-cell","display_name":"Electrolytic cell","score":0.696297824382782},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5421200394630432},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.4948670268058777},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.4596104621887207},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3916240632534027},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28717556595802307},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.23112154006958008},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21767756342887878},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.14975005388259888},{"id":"https://openalex.org/keywords/electrolysis","display_name":"Electrolysis","score":0.14539146423339844}],"concepts":[{"id":"https://openalex.org/C544778455","wikidata":"https://www.wikidata.org/wiki/Q753","display_name":"Copper","level":2,"score":0.8081557750701904},{"id":"https://openalex.org/C49110097","wikidata":"https://www.wikidata.org/wiki/Q175233","display_name":"Cathode","level":2,"score":0.7376906871795654},{"id":"https://openalex.org/C89395315","wikidata":"https://www.wikidata.org/wiki/Q181232","display_name":"Anode","level":3,"score":0.7357620000839233},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.723026692867279},{"id":"https://openalex.org/C68801617","wikidata":"https://www.wikidata.org/wiki/Q162908","display_name":"Electrolyte","level":3,"score":0.6998677253723145},{"id":"https://openalex.org/C136674465","wikidata":"https://www.wikidata.org/wiki/Q2608426","display_name":"Electrolytic cell","level":5,"score":0.696297824382782},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5421200394630432},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.4948670268058777},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.4596104621887207},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3916240632534027},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28717556595802307},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23112154006958008},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21767756342887878},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.14975005388259888},{"id":"https://openalex.org/C163127949","wikidata":"https://www.wikidata.org/wiki/Q64403","display_name":"Electrolysis","level":4,"score":0.14539146423339844},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/comcomap.2014.7017168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/comcomap.2014.7017168","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Computers, Communications and IT Applications Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W595452801","https://openalex.org/W2073541700","https://openalex.org/W2092987471","https://openalex.org/W2133059825","https://openalex.org/W2134407961","https://openalex.org/W2144591610","https://openalex.org/W2150801971","https://openalex.org/W2367444371","https://openalex.org/W2391682979","https://openalex.org/W2533214323","https://openalex.org/W2849050258","https://openalex.org/W4248931071","https://openalex.org/W6680096826"],"related_works":["https://openalex.org/W2051018604","https://openalex.org/W2366503488","https://openalex.org/W2356393493","https://openalex.org/W2078786963","https://openalex.org/W1570297225","https://openalex.org/W2359324202","https://openalex.org/W117714591","https://openalex.org/W2700308045","https://openalex.org/W1566390707","https://openalex.org/W2322697547"],"abstract_inverted_index":{"In":[0],"the":[1,15,22,25,44,53,65,68,71,81,85,101,106],"production":[2,26,86],"of":[3,27,48,67,83,87],"copper":[4,98],"electrolytic,":[5],"short":[6],"circuit":[7,59],"frequently":[8],"takes":[9],"place":[10],"between":[11],"anode":[12],"and":[13,52,55,79,100],"cathode,":[14],"heat":[16],"loss":[17],"from":[18],"which":[19],"will":[20],"result":[21],"reducing":[23],"for":[24],"copper.":[28,89],"To":[29],"solve":[30],"this":[31,33],"problem,":[32],"paper":[34],"presents":[35],"a":[36,76,93],"high-temperature":[37],"electrode":[38],"faulted":[39],"diagnosis":[40],"method":[41],"base":[42],"on":[43],"new-type":[45],"integrated":[46],"filtering":[47],"thermal":[49],"infrared":[50],"images":[51],"division":[54],"location":[56],"processing.":[57],"Short":[58],"can":[60],"be":[61],"found":[62],"by":[63],"analyzing":[64],"temperature":[66],"plates":[69],"in":[70,96],"electrolytic":[72,88,97],"cell":[73],"timely":[74],"with":[75,105],"suitable":[77],"algorithm":[78],"realize":[80],"purpose":[82],"raising":[84],"We":[90],"have":[91],"made":[92],"practical":[94],"application":[95],"factory":[99],"conclusion":[102],"is":[103],"accordance":[104],"desired":[107],"effects.":[108]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}