{"id":"https://openalex.org/W1490578062","doi":"https://doi.org/10.1109/cicc.1999.777260","title":"A low-triggering circuitry for dual-direction ESD protection","display_name":"A low-triggering circuitry for dual-direction ESD protection","publication_year":2003,"publication_date":"2003-01-20","ids":{"openalex":"https://openalex.org/W1490578062","doi":"https://doi.org/10.1109/cicc.1999.777260","mag":"1490578062"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.1999.777260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.1999.777260","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072125647","display_name":"A.Z. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I180949307","display_name":"Illinois Institute of Technology","ror":"https://ror.org/037t3ry66","country_code":"US","type":"education","lineage":["https://openalex.org/I180949307"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.Z. Wang","raw_affiliation_strings":["Department of Electrical & Computer Engineering, Illinois Institute of Technology, National Semiconductor Corporation, Chicago, IL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Illinois Institute of Technology, National Semiconductor Corporation, Chicago, IL, USA","institution_ids":["https://openalex.org/I180949307"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056514205","display_name":"C.H. Tsay","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C.H. Tsay","raw_affiliation_strings":["National Semiconductor Corporation, Santa Clara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Semiconductor Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4308,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.5210162,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"139","last_page":"142"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/snapback","display_name":"Snapback","score":0.9734697341918945},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.9461773633956909},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.5935542583465576},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5410901308059692},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5278537273406982},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.47419148683547974},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.41432714462280273},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3876987099647522},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38282665610313416},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3357505798339844},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3216456174850464}],"concepts":[{"id":"https://openalex.org/C2779888857","wikidata":"https://www.wikidata.org/wiki/Q18378810","display_name":"Snapback","level":4,"score":0.9734697341918945},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.9461773633956909},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.5935542583465576},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5410901308059692},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5278537273406982},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47419148683547974},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.41432714462280273},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3876987099647522},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38282665610313416},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3357505798339844},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3216456174850464},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.1999.777260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.1999.777260","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7799999713897705,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1543631479","https://openalex.org/W2127633065","https://openalex.org/W2297150173"],"related_works":["https://openalex.org/W2075382567","https://openalex.org/W4223435591","https://openalex.org/W1490578062","https://openalex.org/W2019344161","https://openalex.org/W1496293429","https://openalex.org/W2046430182","https://openalex.org/W1936266116","https://openalex.org/W2586740853","https://openalex.org/W2169920509","https://openalex.org/W2520615759"],"abstract_inverted_index":{"A":[0],"novel":[1],"low-triggering,":[2],"dual-direction":[3],"on-chip":[4],"Electrostatic":[5],"Discharge":[6],"(ESD)":[7],"protection":[8],"circuitry":[9],"is":[10,56],"designed":[11],"to":[12],"protect":[13],"integrated":[14],"circuits":[15],"(ICs)":[16],"against":[17],"ESD":[18,53],"surges":[19],"in":[20],"two":[21],"opposite":[22],"directions.":[23],"The":[24,63],"compact":[25],"circuit":[26],"features":[27],"low":[28,43],"triggering":[29],"(7.5":[30],"V),":[31],"short":[32],"response":[33],"time":[34],"(<1":[35],"ns),":[36],"symmetric":[37],"deep":[38],"snapback":[39],"I-V":[40],"characteristics,":[41],"and":[42,55],"on-resistance":[44],"(/spl":[45],"sim//spl":[46],"Omega/).":[47],"It":[48],"passed":[49],"14":[50],"kV":[51],"HEM":[52],"test":[54],"very":[57],"area":[58],"efficient":[59],"(80":[60],"V//spl":[61],"mu/m).":[62],"design":[64],"was":[65],"predicted":[66],"by":[67],"simulation":[68],"that":[69],"fits":[70],"measurement.":[71]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}