{"id":"https://openalex.org/W2584875107","doi":"https://doi.org/10.1109/bigdata.2016.7841072","title":"Modeling, validation and verification of cell-scaffold contact measurements over terabyte-sized 3D image collection","display_name":"Modeling, validation and verification of cell-scaffold contact measurements over terabyte-sized 3D image collection","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2584875107","doi":"https://doi.org/10.1109/bigdata.2016.7841072","mag":"2584875107"},"language":"en","primary_location":{"id":"doi:10.1109/bigdata.2016.7841072","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bigdata.2016.7841072","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Conference on Big Data (Big Data)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://stars.library.ucf.edu/scopus2015/4435","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015678162","display_name":"Peter Bajcsy","orcid":"https://orcid.org/0000-0002-6968-2615"},"institutions":[{"id":"https://openalex.org/I4210126846","display_name":"Information Technology Laboratory","ror":"https://ror.org/0440c3437","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210126846"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Peter Bajcsy","raw_affiliation_strings":["Information Technology Laboratory"],"affiliations":[{"raw_affiliation_string":"Information Technology Laboratory","institution_ids":["https://openalex.org/I4210126846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068151799","display_name":"Stephen J. Florczyk","orcid":"https://orcid.org/0000-0001-7151-7857"},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stephen J. Florczyk","raw_affiliation_strings":["Department of Materials Science & Engineering, University of Central Florida, Orlando, FL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Materials Science & Engineering, University of Central Florida, Orlando, FL, USA","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005943002","display_name":"Soweon Yoon","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126846","display_name":"Information Technology Laboratory","ror":"https://ror.org/0440c3437","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210126846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Soweon Yoon","raw_affiliation_strings":["Information Technology Laboratory"],"affiliations":[{"raw_affiliation_string":"Information Technology Laboratory","institution_ids":["https://openalex.org/I4210126846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040050737","display_name":"Mylene Simon","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126846","display_name":"Information Technology Laboratory","ror":"https://ror.org/0440c3437","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210126846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mylene Simon","raw_affiliation_strings":["Information Technology Laboratory"],"affiliations":[{"raw_affiliation_string":"Information Technology Laboratory","institution_ids":["https://openalex.org/I4210126846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003799889","display_name":"Mary Brady","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126846","display_name":"Information Technology Laboratory","ror":"https://ror.org/0440c3437","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210126846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mary Brady","raw_affiliation_strings":["Information Technology Laboratory"],"affiliations":[{"raw_affiliation_string":"Information Technology Laboratory","institution_ids":["https://openalex.org/I4210126846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077880633","display_name":"Ram D. Sriram","orcid":"https://orcid.org/0000-0001-8602-4748"},"institutions":[{"id":"https://openalex.org/I4210126846","display_name":"Information Technology Laboratory","ror":"https://ror.org/0440c3437","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210126846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ram Sriram","raw_affiliation_strings":["Information Technology Laboratory"],"affiliations":[{"raw_affiliation_string":"Information Technology Laboratory","institution_ids":["https://openalex.org/I4210126846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011465914","display_name":"Nathan Hotaling","orcid":"https://orcid.org/0000-0001-8423-6464"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210147263","display_name":"Material Measurement Laboratory","ror":"https://ror.org/04a0y3b96","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210147263"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nathan Hotaling","raw_affiliation_strings":["Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210147263","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042417846","display_name":"Nicholas J. Schaub","orcid":"https://orcid.org/0000-0001-6581-7191"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210147263","display_name":"Material Measurement Laboratory","ror":"https://ror.org/04a0y3b96","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210147263"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nicholas Schaub","raw_affiliation_strings":["Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210147263","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012934002","display_name":"Carl G. Simon","orcid":"https://orcid.org/0000-0001-5209-3577"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210147263","display_name":"Material Measurement Laboratory","ror":"https://ror.org/04a0y3b96","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210147263"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carl G. Simon","raw_affiliation_strings":["Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210147263","https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102115485","display_name":"Piotr M. Szczypi\u0144ski","orcid":"https://orcid.org/0000-0002-9956-0862"},"institutions":[{"id":"https://openalex.org/I188884621","display_name":"Lodz University of Technology","ror":"https://ror.org/00s8fpf52","country_code":"PL","type":"education","lineage":["https://openalex.org/I188884621"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Piotr M. Szczypinski","raw_affiliation_strings":["Insititute of Electronics, Lodz University of Technology, Lodz, Poland"],"affiliations":[{"raw_affiliation_string":"Insititute of Electronics, Lodz University of Technology, Lodz, Poland","institution_ids":["https://openalex.org/I188884621"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5015678162"],"corresponding_institution_ids":["https://openalex.org/I4210126846"],"apc_list":null,"apc_paid":null,"fwci":0.4233,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.73761448,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"3951","last_page":"3953"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12923","display_name":"Digital Image Processing Techniques","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/terabyte","display_name":"Terabyte","score":0.7031893134117126},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6879543662071228},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.5558743476867676},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5263251662254333},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5036506056785583},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.47159895300865173},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.4620010554790497},{"id":"https://openalex.org/keywords/stack","display_name":"Stack (abstract data type)","score":0.42739927768707275},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.3253200054168701},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08995935320854187}],"concepts":[{"id":"https://openalex.org/C199683683","wikidata":"https://www.wikidata.org/wiki/Q8799","display_name":"Terabyte","level":2,"score":0.7031893134117126},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6879543662071228},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.5558743476867676},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5263251662254333},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5036506056785583},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.47159895300865173},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.4620010554790497},{"id":"https://openalex.org/C9395851","wikidata":"https://www.wikidata.org/wiki/Q177929","display_name":"Stack (abstract data type)","level":2,"score":0.42739927768707275},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.3253200054168701},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08995935320854187},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/bigdata.2016.7841072","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bigdata.2016.7841072","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Conference on Big Data (Big Data)","raw_type":"proceedings-article"},{"id":"pmh:oai:stars.library.ucf.edu:scopus2015-5434","is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/scopus2015/4435","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus Export 2015-2019","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:stars.library.ucf.edu:scopus2015-5434","is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/scopus2015/4435","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus Export 2015-2019","raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W1913718246"],"related_works":["https://openalex.org/W1976914335","https://openalex.org/W2066858118","https://openalex.org/W2134017072","https://openalex.org/W2915208987","https://openalex.org/W1940452713","https://openalex.org/W2152256925","https://openalex.org/W1994777790","https://openalex.org/W2058150833","https://openalex.org/W2005567565","https://openalex.org/W1522196789"],"abstract_inverted_index":{"This":[0],"poster":[1],"presents":[2],"the":[3,32,37,45,88],"problem":[4],"of":[5,20,25,36,47,78,98],"3D":[6,16,57,99],"contact":[7,17,54],"measurements":[8],"from":[9],"two":[10],"co-registered":[11,69],"volumetric":[12],"images":[13],"(z-stacks).":[14],"The":[15,56],"measurement":[18,58],"consists":[19],"(a)":[21],"segmenting":[22],"an":[23],"object":[24],"interest":[26],"in":[27],"each":[28],"z-stack,":[29],"(b)":[30],"computing":[31],"relative":[33],"spatial":[34],"positions":[35],"detected":[38],"objects":[39],"to":[40,60,64,86],"detect":[41],"contacts,":[42],"(c)":[43],"validating":[44],"accuracy":[46],"segmentation,":[48],"and":[49,76,91,95],"(d)":[50],"visually":[51],"verifying":[52],"correct":[53],"detection.":[55],"has":[59],"overcome":[61],"challenges":[62],"related":[63],"(1)":[65],"intensity":[66],"bleed-through":[67],"across":[68],"volumes,":[70],"(2)":[71],"insufficient":[72],"knowledge":[73],"about":[74],"statistics":[75],"geometry":[77],"objects,":[79],"(3)":[80],"large":[81],"RAM":[82],"requirements":[83],"(~3GB":[84],"just":[85],"load":[87],"input":[89],"data)":[90],"data":[92],"volume":[93],"(>1TB),":[94],"(4)":[96],"complexity":[97],"visual":[100],"inspection.":[101]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}