{"id":"https://openalex.org/W2123752390","doi":"https://doi.org/10.1109/ats.2002.1181683","title":"Effects of amplitude modulation in jitter tolerance measurements of communication devices","display_name":"Effects of amplitude modulation in jitter tolerance measurements of communication devices","publication_year":2003,"publication_date":"2003-06-26","ids":{"openalex":"https://openalex.org/W2123752390","doi":"https://doi.org/10.1109/ats.2002.1181683","mag":"2123752390"},"language":"en","primary_location":{"id":"doi:10.1109/ats.2002.1181683","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2002.1181683","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000723708","display_name":"M. Ishida","orcid":"https://orcid.org/0000-0003-1388-1284"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Ishida","raw_affiliation_strings":["Advantest Laboratories Limited, Sendai, Miyagi, Japan","Advantest Labs., Ltd., Miyagi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Laboratories Limited, Sendai, Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Labs., Ltd., Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010763159","display_name":"Takahiro Yamaguchi","orcid":"https://orcid.org/0000-0003-0325-8878"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T.J. Yamaguchi","raw_affiliation_strings":["Advantest Laboratories Limited, Sendai, Miyagi, Japan","Advantest Labs., Ltd., Miyagi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Laboratories Limited, Sendai, Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Labs., Ltd., Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112265787","display_name":"M. Soma","orcid":null},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Soma","raw_affiliation_strings":["Department of Electrical Engineering, University of Washington, Seattle, WA, USA","University of Washington"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA, USA","institution_ids":["https://openalex.org/I201448701"]},{"raw_affiliation_string":"University of Washington","institution_ids":["https://openalex.org/I201448701"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042878450","display_name":"H. Musha","orcid":null},"institutions":[{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]},{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP","SG"],"is_corresponding":false,"raw_author_name":"H. Musha","raw_affiliation_strings":["Advantest Corporation, Gunma, Japan","ADVANTEST Corporation,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Gunma, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"ADVANTEST Corporation,","institution_ids":["https://openalex.org/I177844149"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4308,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.61291133,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"45","last_page":"48"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9524999856948853,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.949400007724762,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9857670068740845},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.6933159828186035},{"id":"https://openalex.org/keywords/amplitude-modulation","display_name":"Amplitude modulation","score":0.6224003434181213},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.5602777600288391},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5545830726623535},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5226076245307922},{"id":"https://openalex.org/keywords/frequency-modulation","display_name":"Frequency modulation","score":0.4431172311306},{"id":"https://openalex.org/keywords/pulse-amplitude-modulation","display_name":"Pulse-amplitude modulation","score":0.4325549006462097},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21806302666664124},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.18798455595970154},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.1822085678577423},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17067071795463562},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13765037059783936},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.10983219742774963},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.07370761036872864}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9857670068740845},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.6933159828186035},{"id":"https://openalex.org/C201905106","wikidata":"https://www.wikidata.org/wiki/Q183755","display_name":"Amplitude modulation","level":4,"score":0.6224003434181213},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.5602777600288391},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5545830726623535},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5226076245307922},{"id":"https://openalex.org/C11930861","wikidata":"https://www.wikidata.org/wiki/Q181417","display_name":"Frequency modulation","level":3,"score":0.4431172311306},{"id":"https://openalex.org/C20518276","wikidata":"https://www.wikidata.org/wiki/Q186130","display_name":"Pulse-amplitude modulation","level":4,"score":0.4325549006462097},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21806302666664124},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.18798455595970154},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.1822085678577423},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17067071795463562},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13765037059783936},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.10983219742774963},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.07370761036872864},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ats.2002.1181683","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2002.1181683","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2169790941"],"related_works":["https://openalex.org/W2360841575","https://openalex.org/W2093157008","https://openalex.org/W2068642629","https://openalex.org/W2070091937","https://openalex.org/W2049863527","https://openalex.org/W2060366623","https://openalex.org/W2143773860","https://openalex.org/W2012415775","https://openalex.org/W2004723848","https://openalex.org/W4386937355"],"abstract_inverted_index":{"This":[0],"paper":[1,28],"presents":[2],"an":[3],"experimental":[4],"study":[5],"of":[6,19,40],"random":[7,34],"jitter":[8,24,35],"modulation":[9,22],"in":[10,23],"a":[11],"commercial":[12],"serializer-deserializer":[13],"device":[14],"to":[15,36],"demonstrate":[16],"the":[17],"effects":[18],"possible":[20],"amplitude":[21],"tolerance":[25],"measurements.":[26],"The":[27],"recommends":[29],"alternative":[30],"methods":[31],"for":[32],"injecting":[33],"avoid":[37],"this":[38],"source":[39],"measurement":[41],"error.":[42]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}