{"id":"https://openalex.org/W1981016066","doi":"https://doi.org/10.1109/asscc.2014.7008899","title":"An 87×49 mutual capacitance touch sensing IC enabling 0.5 mm-diameter stylus signal detection at 240 Hz-reporting-rate with palm rejection","display_name":"An 87×49 mutual capacitance touch sensing IC enabling 0.5 mm-diameter stylus signal detection at 240 Hz-reporting-rate with palm rejection","publication_year":2014,"publication_date":"2014-11-01","ids":{"openalex":"https://openalex.org/W1981016066","doi":"https://doi.org/10.1109/asscc.2014.7008899","mag":"1981016066"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2014.7008899","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2014.7008899","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101963990","display_name":"Shinichi Yoshida","orcid":"https://orcid.org/0000-0002-9990-5015"},"institutions":[{"id":"https://openalex.org/I1317171322","display_name":"National Archives and Records Administration","ror":"https://ror.org/032214n64","country_code":"US","type":"archive","lineage":["https://openalex.org/I1317171322"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Shin-ichi Yoshida","raw_affiliation_strings":["Sharp Corporation, Tenri, Nara, Japan","Sharp Corporation, Tenri, Nara, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan","institution_ids":[]},{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan#TAB#","institution_ids":["https://openalex.org/I1317171322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002895010","display_name":"Mutsumi Hamaguchi","orcid":null},"institutions":[{"id":"https://openalex.org/I1317171322","display_name":"National Archives and Records Administration","ror":"https://ror.org/032214n64","country_code":"US","type":"archive","lineage":["https://openalex.org/I1317171322"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mutsumi Hamaguchi","raw_affiliation_strings":["Sharp Corporation, Tenri, Nara, Japan","Sharp Corporation, Tenri, Nara, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan","institution_ids":[]},{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan#TAB#","institution_ids":["https://openalex.org/I1317171322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108377674","display_name":"Takahiro Morishita","orcid":null},"institutions":[{"id":"https://openalex.org/I1317171322","display_name":"National Archives and Records Administration","ror":"https://ror.org/032214n64","country_code":"US","type":"archive","lineage":["https://openalex.org/I1317171322"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Takahiro Morishita","raw_affiliation_strings":["Sharp Corporation, Tenri, Nara, Japan","Sharp Corporation, Tenri, Nara, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan","institution_ids":[]},{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan#TAB#","institution_ids":["https://openalex.org/I1317171322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020907785","display_name":"Shinji Shinjo","orcid":null},"institutions":[{"id":"https://openalex.org/I1317171322","display_name":"National Archives and Records Administration","ror":"https://ror.org/032214n64","country_code":"US","type":"archive","lineage":["https://openalex.org/I1317171322"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shinji Shinjo","raw_affiliation_strings":["Sharp Corporation, Tenri, Nara, Japan","Sharp Corporation, Tenri, Nara, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan","institution_ids":[]},{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan#TAB#","institution_ids":["https://openalex.org/I1317171322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007961227","display_name":"Akira Nagao","orcid":null},"institutions":[{"id":"https://openalex.org/I1317171322","display_name":"National Archives and Records Administration","ror":"https://ror.org/032214n64","country_code":"US","type":"archive","lineage":["https://openalex.org/I1317171322"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Akira Nagao","raw_affiliation_strings":["Sharp Corporation, Tenri, Nara, Japan","Sharp Corporation, Tenri, Nara, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan","institution_ids":[]},{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan#TAB#","institution_ids":["https://openalex.org/I1317171322"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067490489","display_name":"Masayuki Miyamoto","orcid":"https://orcid.org/0009-0009-5450-6123"},"institutions":[{"id":"https://openalex.org/I1317171322","display_name":"National Archives and Records Administration","ror":"https://ror.org/032214n64","country_code":"US","type":"archive","lineage":["https://openalex.org/I1317171322"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Masayuki Miyamoto","raw_affiliation_strings":["Sharp Corporation, Tenri, Nara, Japan","Sharp Corporation, Tenri, Nara, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan","institution_ids":[]},{"raw_affiliation_string":"Sharp Corporation, Tenri, Nara, Japan#TAB#","institution_ids":["https://openalex.org/I1317171322"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101963990"],"corresponding_institution_ids":["https://openalex.org/I1317171322"],"apc_list":null,"apc_paid":null,"fwci":0.2093,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.56657074,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"217","last_page":"220"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10338","display_name":"Advanced Sensor and Energy Harvesting Materials","score":0.9817000031471252,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9743000268936157,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stylus","display_name":"Stylus","score":0.933586835861206},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.7540736198425293},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5898743867874146},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5416117310523987},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38518720865249634},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.37485238909721375},{"id":"https://openalex.org/keywords/biomedical-engineering","display_name":"Biomedical engineering","score":0.356935977935791},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19756236672401428},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.1671386957168579},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15233775973320007},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.11245456337928772}],"concepts":[{"id":"https://openalex.org/C164086593","wikidata":"https://www.wikidata.org/wiki/Q1227035","display_name":"Stylus","level":2,"score":0.933586835861206},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7540736198425293},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5898743867874146},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5416117310523987},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38518720865249634},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.37485238909721375},{"id":"https://openalex.org/C136229726","wikidata":"https://www.wikidata.org/wiki/Q327092","display_name":"Biomedical engineering","level":1,"score":0.356935977935791},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19756236672401428},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.1671386957168579},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15233775973320007},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.11245456337928772},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asscc.2014.7008899","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2014.7008899","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7799999713897705,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1975830975","https://openalex.org/W2023982254","https://openalex.org/W2067835874","https://openalex.org/W2153020878","https://openalex.org/W6656513799"],"related_works":["https://openalex.org/W1514950410","https://openalex.org/W4310506326","https://openalex.org/W2047065129","https://openalex.org/W2401480642","https://openalex.org/W3022681545","https://openalex.org/W2484086337","https://openalex.org/W2072361192","https://openalex.org/W2499398221","https://openalex.org/W2365121631","https://openalex.org/W2076571966"],"abstract_inverted_index":{"A":[0,109],"touch":[1,26,69,88,127],"sensing":[2,128],"system":[3],"capable":[4],"of":[5,24,102,173,191],"stylus":[6,46,72,104,150,161],"input":[7,73],"should":[8],"have":[9],"\u201cpalm":[10,37],"rejection\u201d":[11],"function":[12],"which":[13,92,130],"allows":[14],"the":[15,22,25,44,52,65,68,82,87,96,100,103,107,160,163,166,170,181,192,214,219],"user":[16],"to":[17,35,42,114,159,185,189,199,204],"place":[18],"one's":[19],"palm":[20,66,97,205,208],"on":[21,106,218],"surface":[23],"sensor":[27,70],"while":[28,47],"writing":[29],"with":[30,95],"a":[31,121,147,152,174,207],"stylus.":[32],"In":[33,196],"order":[34,197],"realize":[36],"rejection\u201d,":[38],"it":[39],"is":[40,56,80,118,131,157,211],"necessary":[41],"detect":[43],"small":[45,60],"neglecting":[48],"large":[49],"signal":[50,74,105,216],"from":[51],"palm.":[53,164],"However":[54],"this":[55,116],"not":[57,198],"sufficient":[58],"because":[59,81],"electrical":[61],"noise":[62,84,156],"injected":[63,83,158],"through":[64],"into":[67],"impedes":[71],"in":[75,120,133,213],"real":[76],"use.":[77],"This":[78],"issue":[79,117],"propagates":[85],"onto":[86],"sensor's":[89],"sense":[90],"channels":[91],"are":[93,183],"capacitively-coupled":[94],"and":[98,111,162,169],"degrades":[99],"SNR":[101,142],"channels.":[108],"simple":[110],"effective":[112],"technique":[113],"eliminate":[115],"implemented":[119,212],"newly":[122],"developed":[123],"87\u00d749":[124],"mutual":[125],"capacitance":[126],"IC":[129,182],"fabricated":[132],"an":[134,141],"85":[135],"nm":[136],"CMOS":[137],"technology.":[138],"It":[139],"achieves":[140],"over":[143],"33":[144],"dB":[145],"for":[146,180],"0.5":[148],"mm-diameter":[149],"when":[151],"10":[153],"Vp-p":[154],"sinusoidal":[155],"Both":[165],"die":[167],"area":[168],"power":[171],"consumption":[172],"unit":[175],"charge-to-voltage":[176],"converter":[177],"(CVC)":[178],"designed":[179],"reduced":[184],"approximately":[186],"50%":[187],"compared":[188],"those":[190],"previous":[193],"implementation":[194],"[4].":[195],"report":[200],"unwanted":[201],"touches":[202],"due":[203],"signals,":[206],"detection":[209],"filter":[210],"digital":[215],"processor":[217],"IC.":[220]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}