{"id":"https://openalex.org/W1996101291","doi":"https://doi.org/10.1109/ares.2010.60","title":"An Adaptive Redundancy Oriented Method to Tolerate Soft Errors in SRAM-Based FPGAs Using Unused Resources","display_name":"An Adaptive Redundancy Oriented Method to Tolerate Soft Errors in SRAM-Based FPGAs Using Unused Resources","publication_year":2010,"publication_date":"2010-02-01","ids":{"openalex":"https://openalex.org/W1996101291","doi":"https://doi.org/10.1109/ares.2010.60","mag":"1996101291"},"language":"en","primary_location":{"id":"doi:10.1109/ares.2010.60","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ares.2010.60","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 International Conference on Availability, Reliability and Security","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048889878","display_name":"Somayeh Bahramnejad","orcid":null},"institutions":[{"id":"https://openalex.org/I158248296","display_name":"Amirkabir University of Technology","ror":"https://ror.org/04gzbav43","country_code":"IR","type":"education","lineage":["https://openalex.org/I158248296"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Somayeh Bahramnejad","raw_affiliation_strings":["Department of Computer Engineering and Information Technology, Amirkabir University of Technology\uc2a0, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering and Information Technology, Amirkabir University of Technology\uc2a0, Tehran, Iran","institution_ids":["https://openalex.org/I158248296"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000749075","display_name":"Hamid R. Zarandi","orcid":"https://orcid.org/0000-0003-1385-4171"},"institutions":[{"id":"https://openalex.org/I158248296","display_name":"Amirkabir University of Technology","ror":"https://ror.org/04gzbav43","country_code":"IR","type":"education","lineage":["https://openalex.org/I158248296"]},{"id":"https://openalex.org/I4210146419","display_name":"Institute for Research in Fundamental Sciences","ror":"https://ror.org/04xreqs31","country_code":"IR","type":"facility","lineage":["https://openalex.org/I4210146419"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Hamid Reza Zarandi","raw_affiliation_strings":["Department of Computer Engineering and Information Technology, Amirkabir University of Technology\uc2a0, Tehran, Iran","School of Computer Science, Institute for Research in Fundamental Sciences, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering and Information Technology, Amirkabir University of Technology\uc2a0, Tehran, Iran","institution_ids":["https://openalex.org/I158248296"]},{"raw_affiliation_string":"School of Computer Science, Institute for Research in Fundamental Sciences, Tehran, Iran","institution_ids":["https://openalex.org/I4210146419"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5048889878"],"corresponding_institution_ids":["https://openalex.org/I158248296"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.07543597,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"4","issue":null,"first_page":"119","last_page":"124"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.9040104150772095},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8609119653701782},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7973966598510742},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7531125545501709},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7037954330444336},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.638653039932251},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4788665473461151},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.44594091176986694},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4434545040130615},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43345656991004944},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.41718384623527527},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3945346474647522},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.24389752745628357},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.16903573274612427},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15332040190696716},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1485421359539032},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0658230185508728}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.9040104150772095},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8609119653701782},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7973966598510742},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7531125545501709},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7037954330444336},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.638653039932251},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4788665473461151},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.44594091176986694},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4434545040130615},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43345656991004944},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.41718384623527527},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3945346474647522},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.24389752745628357},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.16903573274612427},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15332040190696716},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1485421359539032},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0658230185508728}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ares.2010.60","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ares.2010.60","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 International Conference on Availability, Reliability and Security","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1527974875","https://openalex.org/W1591148251","https://openalex.org/W1970885193","https://openalex.org/W2094806828","https://openalex.org/W2097046051","https://openalex.org/W2111756578","https://openalex.org/W2114151714","https://openalex.org/W2116817444","https://openalex.org/W2126240789","https://openalex.org/W2131044255","https://openalex.org/W2135743241","https://openalex.org/W2137235679","https://openalex.org/W2139637699","https://openalex.org/W2153607112","https://openalex.org/W2158102622","https://openalex.org/W2168956288","https://openalex.org/W2171573833","https://openalex.org/W2172024812","https://openalex.org/W2952495414","https://openalex.org/W3149083303","https://openalex.org/W4234659532","https://openalex.org/W6679345621","https://openalex.org/W6680692090","https://openalex.org/W6682957776"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W1500230652","https://openalex.org/W2066033226","https://openalex.org/W2363504003","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2088929465","https://openalex.org/W2612883256","https://openalex.org/W2000379092"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"present":[4],"an":[5],"adaptive":[6],"SEU-tolerance":[7],"method":[8,24],"based":[9,31,62],"on":[10,32,63,87],"redundancy":[11,30,59,86],"for":[12,28],"implementing":[13],"circuits":[14],"in":[15,75],"SRAM-based":[16,76],"FPGAs":[17,77],"to":[18,105],"tolerate":[19],"soft":[20],"error":[21],"effects.":[22],"This":[23],"uses":[25],"unused":[26],"resources":[27],"partial":[29,85],"a":[33,44],"property":[34],"of":[35,43,50,72,84],"nets":[36],"called":[37],"System":[38],"Failure":[39],"Rate":[40],"(SFR).":[41],"SFR":[42,102],"given":[45],"net":[46,55],"is":[47,56,60,100],"the":[48,54,82],"probability":[49],"system":[51,69],"failure":[52,70],"when":[53],"faulty.":[57],"The":[58,91],"performed":[61],"available":[64],"resources,":[65],"adaptively,":[66],"so":[67],"that":[68,94],"rate":[71],"circuit":[73],"implemented":[74],"decreases.":[78],"We":[79],"have":[80],"investigated":[81],"effect":[83],"several":[88],"MCNC":[89],"benchmarks.":[90],"results":[92],"show":[93],"if":[95],"maximum":[96],"tolerable":[97],"overall":[98],"overhead":[99],"20%,":[101],"increases":[103],"up":[104],"13%.":[106]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}