{"id":"https://openalex.org/W4360997264","doi":"https://doi.org/10.1109/aiipcc57291.2022.00049","title":"The development of the portable leakage detector data acquisition device","display_name":"The development of the portable leakage detector data acquisition device","publication_year":2022,"publication_date":"2022-08-01","ids":{"openalex":"https://openalex.org/W4360997264","doi":"https://doi.org/10.1109/aiipcc57291.2022.00049"},"language":"en","primary_location":{"id":"doi:10.1109/aiipcc57291.2022.00049","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/aiipcc57291.2022.00049","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 International Conference on Artificial Intelligence, Information Processing and Cloud Computing (AIIPCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087737889","display_name":"Shuoyang Gao","orcid":null},"institutions":[{"id":"https://openalex.org/I83776822","display_name":"Shandong Institute of Business and Technology","ror":"https://ror.org/03rrkrc24","country_code":"CN","type":"education","lineage":["https://openalex.org/I83776822"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuoyang Gao","raw_affiliation_strings":["School of Information and Electronic Engineering, Shandong Technology and Business University,Yantai,China","School of Information and Electronic Engineering, Shandong Technology and Business University, Yantai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information and Electronic Engineering, Shandong Technology and Business University,Yantai,China","institution_ids":["https://openalex.org/I83776822"]},{"raw_affiliation_string":"School of Information and Electronic Engineering, Shandong Technology and Business University, Yantai, China","institution_ids":["https://openalex.org/I83776822"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004087663","display_name":"Changxin Nai","orcid":"https://orcid.org/0009-0000-9136-8895"},"institutions":[{"id":"https://openalex.org/I83776822","display_name":"Shandong Institute of Business and Technology","ror":"https://ror.org/03rrkrc24","country_code":"CN","type":"education","lineage":["https://openalex.org/I83776822"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changxin Nai","raw_affiliation_strings":["Shandong Technology and Business University,Yantai,China","Shandong Technology and Business University, Yantai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shandong Technology and Business University,Yantai,China","institution_ids":["https://openalex.org/I83776822"]},{"raw_affiliation_string":"Shandong Technology and Business University, Yantai, China","institution_ids":["https://openalex.org/I83776822"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066911862","display_name":"Jing\u2010Cai Liu","orcid":"https://orcid.org/0000-0001-8917-4231"},"institutions":[{"id":"https://openalex.org/I4210156332","display_name":"Chinese Research Academy of Environmental Sciences","ror":"https://ror.org/05t8xvx87","country_code":"CN","type":"nonprofit","lineage":["https://openalex.org/I4210156332"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingcai Liu","raw_affiliation_strings":["Chinese Research Academy of Environmental Sciences,Beijing,China","Chinese Research Academy of Environmental Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Research Academy of Environmental Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210156332"]},{"raw_affiliation_string":"Chinese Research Academy of Environmental Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210156332"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000505358","display_name":"Hongjian Bian","orcid":"https://orcid.org/0009-0004-8066-4700"},"institutions":[{"id":"https://openalex.org/I4210106852","display_name":"Environmental Protection Engineering (Greece)","ror":"https://ror.org/01jj7aa83","country_code":"GR","type":"company","lineage":["https://openalex.org/I4210106852"]},{"id":"https://openalex.org/I4210117097","display_name":"Yonker Environmental Protection (China)","ror":"https://ror.org/029t9vk58","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210117097"]},{"id":"https://openalex.org/I4210157719","display_name":"Yancheng Institute of Technology","ror":"https://ror.org/04y8njc86","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210157719"]}],"countries":["CN","GR"],"is_corresponding":false,"raw_author_name":"Hongjian Bian","raw_affiliation_strings":["Yancheng Xinyu Huifeng Environmental Protection Technology Co., Ltd.,Yancheng,China","Yancheng Xinyu Huifeng Environmental Protection Technology Co., Ltd., Yancheng, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yancheng Xinyu Huifeng Environmental Protection Technology Co., Ltd.,Yancheng,China","institution_ids":["https://openalex.org/I4210106852","https://openalex.org/I4210157719"]},{"raw_affiliation_string":"Yancheng Xinyu Huifeng Environmental Protection Technology Co., Ltd., Yancheng, China","institution_ids":["https://openalex.org/I4210117097"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.52134146,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"29","issue":null,"first_page":"192","last_page":"197"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9782000184059143,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9782000184059143,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9656000137329102,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9560999870300293,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcomputer","display_name":"Microcomputer","score":0.7854342460632324},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.7328252792358398},{"id":"https://openalex.org/keywords/liquid-crystal-display","display_name":"Liquid-crystal display","score":0.6593745350837708},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6489920616149902},{"id":"https://openalex.org/keywords/usb","display_name":"USB","score":0.6439911723136902},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.6313965320587158},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.592313826084137},{"id":"https://openalex.org/keywords/signal-conditioning","display_name":"Signal conditioning","score":0.5486777424812317},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5413212180137634},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4398307800292969},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33436718583106995},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32150161266326904},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24938011169433594},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.126725971698761},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08317625522613525}],"concepts":[{"id":"https://openalex.org/C132090242","wikidata":"https://www.wikidata.org/wiki/Q32738","display_name":"Microcomputer","level":3,"score":0.7854342460632324},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.7328252792358398},{"id":"https://openalex.org/C128019096","wikidata":"https://www.wikidata.org/wiki/Q83341","display_name":"Liquid-crystal display","level":2,"score":0.6593745350837708},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6489920616149902},{"id":"https://openalex.org/C507366226","wikidata":"https://www.wikidata.org/wiki/Q42378","display_name":"USB","level":3,"score":0.6439911723136902},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.6313965320587158},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.592313826084137},{"id":"https://openalex.org/C2780412824","wikidata":"https://www.wikidata.org/wiki/Q3686420","display_name":"Signal conditioning","level":3,"score":0.5486777424812317},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5413212180137634},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4398307800292969},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33436718583106995},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32150161266326904},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24938011169433594},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.126725971698761},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08317625522613525},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aiipcc57291.2022.00049","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/aiipcc57291.2022.00049","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 International Conference on Artificial Intelligence, Information Processing and Cloud Computing (AIIPCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4756512922","display_name":null,"funder_award_id":"51708529","funder_id":"https://openalex.org/F4320320997","funder_display_name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa do Estado de S\u00e3o Paulo"}],"funders":[{"id":"https://openalex.org/F4320320997","display_name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa do Estado de S\u00e3o Paulo","ror":"https://ror.org/02ddkpn78"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2022523308","https://openalex.org/W2260296325","https://openalex.org/W2892143329","https://openalex.org/W3008011676","https://openalex.org/W3033634620","https://openalex.org/W3091138492","https://openalex.org/W4210940775","https://openalex.org/W4254988539"],"related_works":["https://openalex.org/W2372811349","https://openalex.org/W238404166","https://openalex.org/W2041965172","https://openalex.org/W2080265190","https://openalex.org/W1980818318","https://openalex.org/W1995315079","https://openalex.org/W2499406489","https://openalex.org/W1976070411","https://openalex.org/W2369012846","https://openalex.org/W2047438179"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"the":[3,25,38,42,49,53,57,61,65,77,82,90,101,107,114,117,128,143,164,171,176],"portable":[4],"leakage":[5,58,118],"detector":[6],"data":[7,67,93],"acquisition":[8,39],"device":[9,17,124,144,167],"based":[10,99],"on":[11,48,100],"DSPIC33F":[12],"single-chip":[13],"microcomputer,":[14],"by":[15,32,60,68,94,127,147,158],"dipole":[16],"to":[18,36,55,81,134],"collect":[19],"effective":[20],"ground":[21],"potential":[22,109],"difference":[23],"signal,":[24],"signal":[26],"conditioning":[27],"circuit":[28],"high-speed":[29],"A/D":[30],"conversion,":[31],"single":[33,69],"chip":[34,70],"microcomputer":[35,71],"calculate":[37],"of":[40,86,92,103,116,142,175],"data,":[41,105],"measurement":[43],"results":[44,54,161],"will":[45],"be":[46],"displayed":[47],"LCD":[50],"screen,":[51],"according":[52,80],"judge":[56],"location":[59,115],"artificial":[62],"way.":[63],"And":[64],"calculated":[66],"and":[72,150,153],"sampling":[73],"time":[74],"store":[75],"in":[76],"external":[78],"RAM":[79],"unit,":[83],"for":[84],"completion":[85],"a":[87],"certain":[88],"region,":[89],"collection":[91],"USB":[95],"transfer":[96],"principal":[97],"computer,":[98],"processing":[102],"historical":[104],"draw":[106],"electric":[108],"distribution":[110],"area":[111],"detection,":[112],"pinpoint":[113],"point,":[119],"avoid":[120],"false":[121],"negatives.":[122],"The":[123,140,160],"is":[125,145],"controlled":[126],"virtual":[129],"instrument":[130],"platform":[131],"LabView":[132],"program":[133],"flexibly":[135],"realize":[136],"different":[137],"experimental":[138],"schemes.":[139],"method":[141],"verified":[146],"theoretical":[148],"model":[149,156],"field":[151],"example,":[152],"compared":[154],"with":[155],"built":[157],"res3dmod.":[159],"show":[162],"that":[163],"convenient":[165],"detection":[166],"can":[168],"well":[169],"reflect":[170],"abnormal":[172],"point":[173],"situation":[174],"landfill.":[177]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}