{"id":"https://openalex.org/W4413157417","doi":"https://doi.org/10.1109/access.2025.3597894","title":"Modeling Practical Capacitive Structures for Electronic and Dielectric Property Extraction and Analysis","display_name":"Modeling Practical Capacitive Structures for Electronic and Dielectric Property Extraction and Analysis","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4413157417","doi":"https://doi.org/10.1109/access.2025.3597894"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3597894","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3597894","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["arxiv","crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3597894","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022072736","display_name":"James G. Champlain","orcid":null},"institutions":[{"id":"https://openalex.org/I1288214837","display_name":"United States Naval Research Laboratory","ror":"https://ror.org/04d23a975","country_code":"US","type":"facility","lineage":["https://openalex.org/I1288214837","https://openalex.org/I1330347796","https://openalex.org/I175003984","https://openalex.org/I3130687028"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James G. Champlain","raw_affiliation_strings":["Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA"],"raw_orcid":"https://orcid.org/0009-0000-1124-8050","affiliations":[{"raw_affiliation_string":"Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA","institution_ids":["https://openalex.org/I1288214837"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079837691","display_name":"Vikrant J. Gokhale","orcid":"https://orcid.org/0000-0002-2053-7054"},"institutions":[{"id":"https://openalex.org/I1288214837","display_name":"United States Naval Research Laboratory","ror":"https://ror.org/04d23a975","country_code":"US","type":"facility","lineage":["https://openalex.org/I1288214837","https://openalex.org/I1330347796","https://openalex.org/I175003984","https://openalex.org/I3130687028"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vikrant J. Gokhale","raw_affiliation_strings":["Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA"],"raw_orcid":"https://orcid.org/0000-0002-2053-7054","affiliations":[{"raw_affiliation_string":"Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA","institution_ids":["https://openalex.org/I1288214837"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068683852","display_name":"Matthew T. Hardy","orcid":"https://orcid.org/0000-0002-8016-6347"},"institutions":[{"id":"https://openalex.org/I1288214837","display_name":"United States Naval Research Laboratory","ror":"https://ror.org/04d23a975","country_code":"US","type":"facility","lineage":["https://openalex.org/I1288214837","https://openalex.org/I1330347796","https://openalex.org/I175003984","https://openalex.org/I3130687028"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew T. Hardy","raw_affiliation_strings":["Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA","institution_ids":["https://openalex.org/I1288214837"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007593374","display_name":"Eric N. Jin","orcid":"https://orcid.org/0000-0003-1365-2123"},"institutions":[{"id":"https://openalex.org/I1288214837","display_name":"United States Naval Research Laboratory","ror":"https://ror.org/04d23a975","country_code":"US","type":"facility","lineage":["https://openalex.org/I1288214837","https://openalex.org/I1330347796","https://openalex.org/I175003984","https://openalex.org/I3130687028"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eric N. Jin","raw_affiliation_strings":["Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA"],"raw_orcid":"https://orcid.org/0000-0003-1365-2123","affiliations":[{"raw_affiliation_string":"Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA","institution_ids":["https://openalex.org/I1288214837"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.9614,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.78122971,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"13","issue":null,"first_page":"145627","last_page":"145648"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13126","display_name":"Scientific Research and Discoveries","score":0.8036999702453613,"subfield":{"id":"https://openalex.org/subfields/3109","display_name":"Statistical and Nonlinear Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13126","display_name":"Scientific Research and Discoveries","score":0.8036999702453613,"subfield":{"id":"https://openalex.org/subfields/3109","display_name":"Statistical and Nonlinear Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.6897000074386597,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.7176269888877869},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.7051492929458618},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.5662984848022461},{"id":"https://openalex.org/keywords/property","display_name":"Property (philosophy)","score":0.5415859222412109},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5073820948600769},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40719619393348694},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3499734699726105},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.27003544569015503},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13476288318634033}],"concepts":[{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.7176269888877869},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.7051492929458618},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.5662984848022461},{"id":"https://openalex.org/C189950617","wikidata":"https://www.wikidata.org/wiki/Q937228","display_name":"Property (philosophy)","level":2,"score":0.5415859222412109},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5073820948600769},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40719619393348694},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3499734699726105},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.27003544569015503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13476288318634033},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2025.3597894","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3597894","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:arXiv.org:2503.20961","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2503.20961","pdf_url":"https://arxiv.org/pdf/2503.20961","source":{"id":"https://openalex.org/S4393918464","display_name":"ArXiv.org","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"pmh:oai:doaj.org/article:ffadfef03e0740139a62f7d958a7997c","is_oa":true,"landing_page_url":"https://doaj.org/article/ffadfef03e0740139a62f7d958a7997c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 145627-145648 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3597894","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3597894","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"},{"id":"https://openalex.org/F4320337628","display_name":"U.S. Naval Research Laboratory","ror":"https://ror.org/04d23a975"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1970072165","https://openalex.org/W1993720091","https://openalex.org/W2004945863","https://openalex.org/W2026039351","https://openalex.org/W2026471726","https://openalex.org/W2045030160","https://openalex.org/W2112995440","https://openalex.org/W2180885545","https://openalex.org/W2765860503","https://openalex.org/W2908048938","https://openalex.org/W3094977730","https://openalex.org/W3212036173","https://openalex.org/W4223461639","https://openalex.org/W4247589372","https://openalex.org/W4291700334","https://openalex.org/W4396234959"],"related_works":["https://openalex.org/W3102847316","https://openalex.org/W3172386668","https://openalex.org/W3011006018","https://openalex.org/W2981692717","https://openalex.org/W4386571252","https://openalex.org/W3046512518","https://openalex.org/W3009925489","https://openalex.org/W4205540626","https://openalex.org/W2035297892","https://openalex.org/W2211812010"],"abstract_inverted_index":{"A":[0],"method":[1],"for":[2],"modeling":[3],"the":[4,31,77],"full":[5],"steady-state":[6],"and":[7,19,44,48,58,66,73,80,87,103],"small-signal":[8],"behavior":[9,32,83,107],"of":[10,33,76,84,91,108],"practical":[11,35,56,109],"capacitive":[12],"structures,":[13,36,110],"such":[14],"as":[15],"metal-insulator-metal":[16],"capacitors,":[17],"diodes,":[18],"transistors,":[20],"is":[21,119],"presented.":[22],"Simple":[23],"lumped":[24],"element":[25],"models":[26],"fail":[27],"to":[28,62,114],"properly":[29,54],"represent":[30],"most":[34],"resulting":[37],"in":[38,51],"incorrect":[39],"electronic":[40,72],"material":[41],"property":[42,117],"extraction":[43],"evaluation.":[45],"The":[46,89],"methodology":[47],"model":[49],"presented":[50],"this":[52],"paper":[53],"characterizes":[55],"structures":[57,86],"can":[59],"be":[60],"employed":[61],"more":[63],"accurately":[64],"understand":[65],"evaluate":[67],"experimental":[68],"results,":[69],"extract":[70],"various":[71],"dielectric":[74,92,101],"properties":[75,93],"constituent":[78],"materials,":[79],"predict":[81],"possible":[82],"new":[85],"materials.":[88],"impact":[90],"(e.g.,":[94],"real":[95],"versus":[96],"complex":[97],"permittivity,":[98],"conductance,":[99],"Cole-Cole":[100],"response)":[102],"geometry":[104],"on":[105],"observed":[106],"especially":[111],"with":[112],"regard":[113],"extracting":[115],"correct":[116],"values,":[118],"discussed.":[120]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-06-16T09:24:06.705377","created_date":"2025-08-17T00:00:00"}