{"id":"https://openalex.org/W4413120843","doi":"https://doi.org/10.1109/access.2025.3597079","title":"Advanced Feature Analysis of Eddy Current Testing Signals for Rail Surface Defect Characterization","display_name":"Advanced Feature Analysis of Eddy Current Testing Signals for Rail Surface Defect Characterization","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4413120843","doi":"https://doi.org/10.1109/access.2025.3597079"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3597079","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3597079","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3597079","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057754998","display_name":"Michele Quercio","orcid":"https://orcid.org/0000-0001-8086-6979"},"institutions":[{"id":"https://openalex.org/I119003972","display_name":"Roma Tre University","ror":"https://ror.org/05vf0dg29","country_code":"IT","type":"education","lineage":["https://openalex.org/I119003972"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Michele Quercio","raw_affiliation_strings":["Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Rome, Italy","Department of Industrial, Electronic and Mechanical Engineering, University of Roma Tre, Roma, Italy"],"raw_orcid":"https://orcid.org/0000-0001-8086-6979","affiliations":[{"raw_affiliation_string":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Rome, Italy","institution_ids":["https://openalex.org/I119003972"]},{"raw_affiliation_string":"Department of Industrial, Electronic and Mechanical Engineering, University of Roma Tre, Roma, Italy","institution_ids":["https://openalex.org/I119003972"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5092619392","display_name":"Luca Santoro","orcid":"https://orcid.org/0000-0003-3135-4920"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Santoro","raw_affiliation_strings":["Department of Mechanical and Aerospace Engineering, Politecnico di Torino, Turin, Italy","Department of Mechanical and Aerospace Engineering, Politecnico di Torino, Torino, Italy"],"raw_orcid":"https://orcid.org/0000-0003-3135-4920","affiliations":[{"raw_affiliation_string":"Department of Mechanical and Aerospace Engineering, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Mechanical and Aerospace Engineering, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076126032","display_name":"Raffaella Sesana","orcid":"https://orcid.org/0000-0002-2810-6291"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Raffaella Sesana","raw_affiliation_strings":["Department of Mechanical and Aerospace Engineering, Politecnico di Torino, Turin, Italy","Department of Mechanical and Aerospace Engineering, Politecnico di Torino, Torino, Italy"],"raw_orcid":"https://orcid.org/0000-0002-2810-6291","affiliations":[{"raw_affiliation_string":"Department of Mechanical and Aerospace Engineering, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Mechanical and Aerospace Engineering, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016535096","display_name":"Francesco Riganti Fulginei","orcid":"https://orcid.org/0000-0001-8824-3776"},"institutions":[{"id":"https://openalex.org/I119003972","display_name":"Roma Tre University","ror":"https://ror.org/05vf0dg29","country_code":"IT","type":"education","lineage":["https://openalex.org/I119003972"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Francesco Riganti Fulginei","raw_affiliation_strings":["Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Rome, Italy","Department of Industrial, Electronic and Mechanical Engineering, University of Roma Tre, Roma, Italy"],"raw_orcid":"https://orcid.org/0000-0001-8824-3776","affiliations":[{"raw_affiliation_string":"Department of Industrial, Electronic and Mechanical Engineering, Roma Tre University, Rome, Italy","institution_ids":["https://openalex.org/I119003972"]},{"raw_affiliation_string":"Department of Industrial, Electronic and Mechanical Engineering, University of Roma Tre, Roma, Italy","institution_ids":["https://openalex.org/I119003972"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5057754998"],"corresponding_institution_ids":["https://openalex.org/I119003972"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.2684,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.7965685,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"13","issue":null,"first_page":"141156","last_page":"141169"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.6684462428092957},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.613271176815033},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5801035165786743},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5239760279655457},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46583905816078186},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.45507872104644775},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.43312332034111023},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.37244993448257446},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.312632292509079},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2441091537475586},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20962461829185486},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16952037811279297},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.07898947596549988},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.07452961802482605}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.6684462428092957},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.613271176815033},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5801035165786743},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5239760279655457},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46583905816078186},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.45507872104644775},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.43312332034111023},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.37244993448257446},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.312632292509079},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2441091537475586},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20962461829185486},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16952037811279297},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.07898947596549988},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.07452961802482605},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2025.3597079","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3597079","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:58e9bb3956434df8906fa00112435b88","is_oa":true,"landing_page_url":"https://doaj.org/article/58e9bb3956434df8906fa00112435b88","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 141156-141169 (2025)","raw_type":"article"},{"id":"pmh:oai:iris.uniroma3.it:11590/517877","is_oa":true,"landing_page_url":"https://hdl.handle.net/11590/517877","pdf_url":null,"source":{"id":"https://openalex.org/S4377196120","display_name":"Iris (Roma Tre University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I119003972","host_organization_name":"Roma Tre University","host_organization_lineage":["https://openalex.org/I119003972"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3597079","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3597079","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1500049967","https://openalex.org/W2002701249","https://openalex.org/W2013199981","https://openalex.org/W2028929495","https://openalex.org/W2030980155","https://openalex.org/W2115773640","https://openalex.org/W2541489823","https://openalex.org/W2760471468","https://openalex.org/W2762806770","https://openalex.org/W2927285966","https://openalex.org/W2943044189","https://openalex.org/W2944198556","https://openalex.org/W3124511454","https://openalex.org/W3132434200","https://openalex.org/W3133701504","https://openalex.org/W3217495139","https://openalex.org/W4210400879","https://openalex.org/W4313643468","https://openalex.org/W4360592055","https://openalex.org/W4372286355","https://openalex.org/W4385619500","https://openalex.org/W4385624198","https://openalex.org/W4385701918","https://openalex.org/W4386934175","https://openalex.org/W4388288726","https://openalex.org/W4390244843","https://openalex.org/W4390452900","https://openalex.org/W4390664793","https://openalex.org/W4390678821","https://openalex.org/W4391344326","https://openalex.org/W4394961337","https://openalex.org/W4397001336","https://openalex.org/W4399564903","https://openalex.org/W4400503353","https://openalex.org/W4401114075","https://openalex.org/W4403211675","https://openalex.org/W4404564283","https://openalex.org/W4405422521","https://openalex.org/W6945069320"],"related_works":["https://openalex.org/W2744634501","https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W2551942315","https://openalex.org/W4296871629","https://openalex.org/W2333795440","https://openalex.org/W2325202533","https://openalex.org/W2029993380","https://openalex.org/W2357774020","https://openalex.org/W2761369883"],"abstract_inverted_index":{"The":[0],"maintenance":[1],"of":[2,6,50,79,127],"the":[3,27,102,107,125],"railways":[4],"is":[5,74],"paramount":[7],"importance":[8],"for":[9,142],"safe":[10],"and":[11,44,48,66,81,132,138],"reliable":[12],"transport.":[13],"Eddy":[14],"Current":[15],"Testing":[16],"(ECT)":[17],"provides":[18],"high-resolution":[19],"time-series":[20],"signals":[21],"that":[22,101],"capture":[23],"subtle":[24],"anomalies":[25],"on":[26,33,87],"rail":[28,91],"surface.":[29],"This":[30],"paper":[31],"expands":[32],"previous":[34],"analyses":[35],"by":[36],"combining":[37],"classical":[38],"time-frequency":[39],"methods":[40],"(short-time":[41],"Fourier":[42],"transform":[43,104],"continuous":[45],"wavelet":[46,59],"transform)":[47],"estimation":[49],"fractal":[51],"dimensions":[52],"with":[53,93],"advanced":[54,133],"feature":[55],"extraction":[56],"approaches,":[57],"including":[58],"sub-band":[60],"decomposition,":[61],"Hilbert\u2013Huang":[62,103],"transform,":[63],"peak":[64,116],"analysis":[65],"entropy":[67],"metrics.":[68],"Subsequently,":[69],"a":[70,88],"Random":[71],"Forest":[72],"classifier":[73],"applied":[75],"to":[76,135],"each":[77],"set":[78],"characteristics,":[80],"we":[82],"report":[83],"comparative":[84],"accuracy":[85,109],"results":[86,123],"dataset":[89],"comprising":[90],"segments":[92],"joints,":[94],"welds,":[95],"or":[96],"squats.":[97],"Experimental":[98],"findings":[99],"reveal":[100],"features":[105],"yield":[106],"highest":[108],"(93.28%),":[110],"while":[111],"simpler":[112],"features,":[113],"such":[114],"as":[115],"counts,":[117],"are":[118],"less":[119],"discriminative":[120],"(46.93%).":[121],"These":[122],"underscore":[124],"effectiveness":[126],"using":[128],"multiple":[129],"signal-decomposition":[130],"strategies":[131],"analytics":[134],"robustly":[136],"detect":[137],"categorize":[139],"surface":[140],"defects":[141],"better":[143],"rail-maintenance":[144],"decisions.":[145]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}