{"id":"https://openalex.org/W4400770913","doi":"https://doi.org/10.1109/access.2024.3430329","title":"Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed Defect Detection Dataset in PCBs","display_name":"Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed Defect Detection Dataset in PCBs","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4400770913","doi":"https://doi.org/10.1109/access.2024.3430329"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3430329","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3430329","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3430329","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5099842865","display_name":"Vinod Kumar Ancha","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131147","display_name":"SRM University","ror":"https://ror.org/037skf023","country_code":"IN","type":"education","lineage":["https://openalex.org/I145286018","https://openalex.org/I4210131147"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vinod Kumar Ancha","raw_affiliation_strings":["Department of Electronics and Communication Engineering, SRM University AP, Amaravati, Andhra Pradesh, India"],"raw_orcid":"https://orcid.org/0009-0003-2661-1408","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, SRM University AP, Amaravati, Andhra Pradesh, India","institution_ids":["https://openalex.org/I4210131147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052845202","display_name":"Fadi N. Sibai","orcid":"https://orcid.org/0000-0002-9677-8911"},"institutions":[{"id":"https://openalex.org/I179311214","display_name":"Gulf University for Science & Technology","ror":"https://ror.org/04d9rzd67","country_code":"KW","type":"education","lineage":["https://openalex.org/I179311214"]}],"countries":["KW"],"is_corresponding":false,"raw_author_name":"Fadi N. Sibai","raw_affiliation_strings":["GUST Engineering and Applied Innovation Research Center (GEAR), Gulf University for Science and Technology, Mishref, Kuwait"],"raw_orcid":"https://orcid.org/0000-0002-9677-8911","affiliations":[{"raw_affiliation_string":"GUST Engineering and Applied Innovation Research Center (GEAR), Gulf University for Science and Technology, Mishref, Kuwait","institution_ids":["https://openalex.org/I179311214"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014560064","display_name":"Venkateswarlu Gonuguntla","orcid":"https://orcid.org/0000-0002-6857-2254"},"institutions":[{"id":"https://openalex.org/I244572783","display_name":"Symbiosis International University","ror":"https://ror.org/005r2ww51","country_code":"IN","type":"education","lineage":["https://openalex.org/I244572783"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Venkateswarlu Gonuguntla","raw_affiliation_strings":["Symbiosis Centre for Medical Image Analysis, Symbiosis International (Deemed University), Pune, India"],"raw_orcid":"https://orcid.org/0000-0002-6857-2254","affiliations":[{"raw_affiliation_string":"Symbiosis Centre for Medical Image Analysis, Symbiosis International (Deemed University), Pune, India","institution_ids":["https://openalex.org/I244572783"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086107411","display_name":"Ramesh Vaddi","orcid":"https://orcid.org/0000-0003-3158-4013"},"institutions":[{"id":"https://openalex.org/I4210131147","display_name":"SRM University","ror":"https://ror.org/037skf023","country_code":"IN","type":"education","lineage":["https://openalex.org/I145286018","https://openalex.org/I4210131147"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ramesh Vaddi","raw_affiliation_strings":["Department of Electronics and Communication Engineering, SRM University AP, Amaravati, Andhra Pradesh, India"],"raw_orcid":"https://orcid.org/0000-0003-3158-4013","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, SRM University AP, Amaravati, Andhra Pradesh, India","institution_ids":["https://openalex.org/I4210131147"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":5.0308,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.96452061,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"12","issue":null,"first_page":"100983","last_page":"100990"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12535","display_name":"Machine Learning and Data Classification","score":0.9871000051498413,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.774552583694458},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.6140055060386658},{"id":"https://openalex.org/keywords/limiting","display_name":"Limiting","score":0.5309946537017822},{"id":"https://openalex.org/keywords/usability","display_name":"Usability","score":0.5275007486343384},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.434765487909317},{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.4281502664089203},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4275503158569336},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4077124297618866},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3481874465942383},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09246447682380676}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.774552583694458},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.6140055060386658},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.5309946537017822},{"id":"https://openalex.org/C170130773","wikidata":"https://www.wikidata.org/wiki/Q216378","display_name":"Usability","level":2,"score":0.5275007486343384},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.434765487909317},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.4281502664089203},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4275503158569336},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4077124297618866},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3481874465942383},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09246447682380676},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C107457646","wikidata":"https://www.wikidata.org/wiki/Q207434","display_name":"Human\u2013computer interaction","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3430329","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3430329","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:d31593ebc50443f1bd0b3a152e4dae30","is_oa":true,"landing_page_url":"https://doaj.org/article/d31593ebc50443f1bd0b3a152e4dae30","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 100983-100990 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3430329","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3430329","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Climate action","score":0.49000000953674316,"id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320330908","display_name":"Austrian Center for Medical Innovation and Technology","ror":"https://ror.org/00m5rzv47"},{"id":"https://openalex.org/F4320336238","display_name":"Guangzhou Science and Technology Innovation Center","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1521964188","https://openalex.org/W1861492603","https://openalex.org/W1986614398","https://openalex.org/W2165698076","https://openalex.org/W2193145675","https://openalex.org/W2565639579","https://openalex.org/W2906977256","https://openalex.org/W2908050327","https://openalex.org/W2912886105","https://openalex.org/W2941001797","https://openalex.org/W2963037989","https://openalex.org/W3042011474","https://openalex.org/W3106250896","https://openalex.org/W3137516550","https://openalex.org/W4200432283","https://openalex.org/W4224215610","https://openalex.org/W4226323522","https://openalex.org/W4297676427","https://openalex.org/W4320712931","https://openalex.org/W4386076325","https://openalex.org/W6631078929","https://openalex.org/W6758365457","https://openalex.org/W6849520326"],"related_works":["https://openalex.org/W2770234245","https://openalex.org/W96612179","https://openalex.org/W4229499248","https://openalex.org/W2429057255","https://openalex.org/W2187546663","https://openalex.org/W148745890","https://openalex.org/W2566006169","https://openalex.org/W4389670110","https://openalex.org/W2611942503","https://openalex.org/W1567818861"],"abstract_inverted_index":{"In":[0],"the":[1,12,81,107,136,155,158],"domain":[2],"of":[3,14,76,127,146,157],"printed":[4],"circuit":[5],"board":[6],"(PCB)":[7],"defect":[8,37,172],"detection":[9,24,99,125,144,166,173],"and":[10,16,33,87,168],"classification,":[11],"availability":[13],"diverse":[15,159],"comprehensive":[17,31],"datasets":[18,28],"is":[19],"fundamental":[20],"for":[21,56,91],"developing":[22],"effective":[23],"models.":[25],"However,":[26],"existing":[27],"often":[29],"lack":[30],"labeling":[32],"focus":[34],"on":[35,94,106,135],"specific":[36],"types,":[38],"limiting":[39],"their":[40],"applicability":[41],"to":[42,70,164],"real-world":[43],"scenarios.":[44,78],"To":[45],"address":[46],"this":[47],"gap,":[48],"we":[49],"introduce":[50],"a":[51,72,124,143],"new":[52],"dataset":[53,83,109,160],"named":[54],"\u2018dataset":[55],"Mixed":[57],"Defect":[58],"Detection":[59],"in":[60,170],"PCB\u2019":[61],"(MDD_PCB),":[62],"which":[63,162],"includes":[64],"intentionally":[65],"induced":[66],"mixed":[67],"PCB":[68,171],"defects":[69],"provide":[71],"more":[73],"realistic":[74],"representation":[75],"practical":[77,140],"We":[79],"evaluate":[80],"MDD_PCB":[82,108],"using":[84],"YOLO":[85],"models":[86],"implement":[88],"it":[89],"successfully":[90],"real-time":[92],"inference":[93],"Jetson":[95,137],"Nano,":[96],"achieving":[97],"enhanced":[98],"capabilities.":[100],"Our":[101],"optimized":[102],"YOLOv5n":[103],"model":[104],"trained":[105],"achieves":[110],"impressive":[111],"metrics":[112],"(accuracy":[113],"93%,":[114],"precision":[115],"95%,":[116,120],"recall":[117],"96%,":[118],"mAP":[119],"F1-score":[121],"94%)":[122],"with":[123,142],"speed":[126,145],"120.69":[128],"frames":[129,148],"per":[130,149],"second":[131,150],"(FPS).":[132,151],"Real-time":[133],"deployment":[134],"Nano":[138],"demonstrates":[139],"usability":[141],"30":[147],"These":[152],"results":[153],"underscore":[154],"significance":[156],"proposed,":[161],"contributes":[163],"robust":[165],"solutions":[167],"advances":[169],"methodologies.":[174]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":13},{"year":2024,"cited_by_count":6}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}