{"id":"https://openalex.org/W2131508353","doi":"https://doi.org/10.1109/35.769279","title":"Testing embedded memories in telecommunication systems","display_name":"Testing embedded memories in telecommunication systems","publication_year":1999,"publication_date":"1999-06-01","ids":{"openalex":"https://openalex.org/W2131508353","doi":"https://doi.org/10.1109/35.769279","mag":"2131508353"},"language":"en","primary_location":{"id":"doi:10.1109/35.769279","is_oa":false,"landing_page_url":"https://doi.org/10.1109/35.769279","pdf_url":null,"source":{"id":"https://openalex.org/S158797327","display_name":"IEEE Communications Magazine","issn_l":"0163-6804","issn":["0163-6804","1558-1896"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Communications Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://porto.polito.it/1404459/","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045235975","display_name":"S. Barbagallo","orcid":"https://orcid.org/0000-0001-7488-0037"},"institutions":[{"id":"https://openalex.org/I2799464224","display_name":"Italtel (Italy)","ror":"https://ror.org/012ae7p27","country_code":"IT","type":"company","lineage":["https://openalex.org/I2799464224"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Barbagallo","raw_affiliation_strings":["Italtel SpA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Italtel SpA","institution_ids":["https://openalex.org/I2799464224"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011504311","display_name":"M.L. Bodoni","orcid":null},"institutions":[{"id":"https://openalex.org/I2799464224","display_name":"Italtel (Italy)","ror":"https://ror.org/012ae7p27","country_code":"IT","type":"company","lineage":["https://openalex.org/I2799464224"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Lobetti Bodoni","raw_affiliation_strings":["Italtel SpA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Italtel SpA","institution_ids":["https://openalex.org/I2799464224"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030177680","display_name":"Alfredo Benso","orcid":"https://orcid.org/0000-0003-3433-7739"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Benso","raw_affiliation_strings":["Politecnico di Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091589252","display_name":"Silvia Chiusano","orcid":"https://orcid.org/0000-0002-5740-5004"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Chiusano","raw_affiliation_strings":["Politecnico di Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036258272","display_name":"P. Prinetto","orcid":"https://orcid.org/0000-0003-2400-8245"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Prinetto","raw_affiliation_strings":["Politecnico di Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3051,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.63835483,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"37","issue":"6","first_page":"84","last_page":"89"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7666699886322021},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7009557485580444},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6727458834648132},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5163953900337219},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.5055768489837646},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4822186231613159},{"id":"https://openalex.org/keywords/telecommunications-equipment","display_name":"Telecommunications equipment","score":0.4667656123638153},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.4518997371196747},{"id":"https://openalex.org/keywords/emphasis","display_name":"Emphasis (telecommunications)","score":0.4336376190185547},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3859666585922241},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1346036195755005}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7666699886322021},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7009557485580444},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6727458834648132},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5163953900337219},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.5055768489837646},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4822186231613159},{"id":"https://openalex.org/C206034944","wikidata":"https://www.wikidata.org/wiki/Q1780509","display_name":"Telecommunications equipment","level":2,"score":0.4667656123638153},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4518997371196747},{"id":"https://openalex.org/C177454536","wikidata":"https://www.wikidata.org/wiki/Q578290","display_name":"Emphasis (telecommunications)","level":2,"score":0.4336376190185547},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3859666585922241},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1346036195755005},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/35.769279","is_oa":false,"landing_page_url":"https://doi.org/10.1109/35.769279","pdf_url":null,"source":{"id":"https://openalex.org/S158797327","display_name":"IEEE Communications Magazine","issn_l":"0163-6804","issn":["0163-6804","1558-1896"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Communications Magazine","raw_type":"journal-article"},{"id":"pmh:oai:porto.polito.it:1404459","is_oa":true,"landing_page_url":"http://porto.polito.it/1404459/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402038","display_name":"PORTO Publications Open Repository TOrino (Politecnico di Torino)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I177477856","host_organization_name":"Politecnico di Torino","host_organization_lineage":["https://openalex.org/I177477856"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISSN:0163-6804","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:porto.polito.it:1404459","is_oa":true,"landing_page_url":"http://porto.polito.it/1404459/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402038","display_name":"PORTO Publications Open Repository TOrino (Politecnico di Torino)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I177477856","host_organization_name":"Politecnico di Torino","host_organization_lineage":["https://openalex.org/I177477856"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISSN:0163-6804","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W289624287","https://openalex.org/W1554885925","https://openalex.org/W1821730155","https://openalex.org/W1964073704","https://openalex.org/W1994887588","https://openalex.org/W2106935654","https://openalex.org/W2109007518","https://openalex.org/W2112902961","https://openalex.org/W2150786077"],"related_works":["https://openalex.org/W2153819599","https://openalex.org/W2255426644","https://openalex.org/W2055105357","https://openalex.org/W2072124641","https://openalex.org/W2167093538","https://openalex.org/W2018956713","https://openalex.org/W1971573522","https://openalex.org/W2081479354","https://openalex.org/W2166972143","https://openalex.org/W2113107605"],"abstract_inverted_index":{"Extensive":[0],"system":[1],"testing":[2,68],"is":[3],"mandatory":[4],"nowadays":[5],"to":[6,16,20,26,67],"achieve":[7],"high":[8,36,50],"product":[9],"quality.":[10,37],"Telecommunication":[11],"systems":[12],"are":[13,93],"particularly":[14],"sensitive":[15],"such":[17],"a":[18,49],"requirement;":[19],"maintain":[21],"market":[22],"competitiveness,":[23],"manufacturers":[24],"need":[25],"combine":[27],"reduced":[28],"costs,":[29],"shorter":[30],"life":[31],"cycles,":[32],"advanced":[33,90],"technologies,":[34],"and":[35,48,58,95],"Moreover,":[38],"strict":[39],"reliability":[40,84],"constraints":[41],"usually":[42],"impose":[43],"very":[44],"low":[45],"fault":[46,53],"latencies":[47],"degree":[51],"of":[52,86],"detection":[54],"for":[55],"both":[56],"permanent":[57],"transient":[59],"faults.":[60],"This":[61],"article":[62],"analyzes":[63],"major":[64],"problems":[65],"related":[66],"complex":[69],"telecommunication":[70],"systems,":[71],"with":[72],"particular":[73],"emphasis":[74],"on":[75],"their":[76],"memory":[77],"modules,":[78],"often":[79],"so":[80],"critical":[81],"from":[82],"the":[83],"point":[85],"view.":[87],"In":[88],"particular,":[89],"BIST-based":[91],"solutions":[92],"analyzed,":[94],"two":[96],"significant":[97],"industrial":[98],"case":[99],"studies":[100],"presented.":[101]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}