{"id":"https://openalex.org/W2747781185","doi":"https://doi.org/10.1109/wsc.2016.7822329","title":"Impact of time bound constraints and batching on metallization in an opto-semiconductor fab","display_name":"Impact of time bound constraints and batching on metallization in an opto-semiconductor fab","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2747781185","doi":"https://doi.org/10.1109/wsc.2016.7822329","mag":"2747781185"},"language":"en","primary_location":{"id":"doi:10.1109/wsc.2016.7822329","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wsc.2016.7822329","pdf_url":null,"source":{"id":"https://openalex.org/S4363607936","display_name":"2016 Winter Simulation Conference (WSC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Winter Simulation Conference (WSC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036583489","display_name":"Falk Stefan Pappert","orcid":null},"institutions":[{"id":"https://openalex.org/I40527276","display_name":"Universit\u00e4t der Bundeswehr M\u00fcnchen","ror":"https://ror.org/05kkv3f82","country_code":"DE","type":"education","lineage":["https://openalex.org/I1315109972","https://openalex.org/I40527276","https://openalex.org/I4387152969"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Falk Stefan Pappert","raw_affiliation_strings":["Department of Computer Science, Universit\u00e4t der Bundeswehr M\u00fcnchen, Neubiberg, GERMANY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Universit\u00e4t der Bundeswehr M\u00fcnchen, Neubiberg, GERMANY","institution_ids":["https://openalex.org/I40527276"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100375792","display_name":"Tao Zhang","orcid":"https://orcid.org/0000-0002-2980-6281"},"institutions":[{"id":"https://openalex.org/I40527276","display_name":"Universit\u00e4t der Bundeswehr M\u00fcnchen","ror":"https://ror.org/05kkv3f82","country_code":"DE","type":"education","lineage":["https://openalex.org/I1315109972","https://openalex.org/I40527276","https://openalex.org/I4387152969"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Tao Zhang","raw_affiliation_strings":["Department of Computer Science, Universit\u00e4t der Bundeswehr M\u00fcnchen, Neubiberg, GERMANY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Universit\u00e4t der Bundeswehr M\u00fcnchen, Neubiberg, GERMANY","institution_ids":["https://openalex.org/I40527276"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110728745","display_name":"Oliver Rose","orcid":null},"institutions":[{"id":"https://openalex.org/I40527276","display_name":"Universit\u00e4t der Bundeswehr M\u00fcnchen","ror":"https://ror.org/05kkv3f82","country_code":"DE","type":"education","lineage":["https://openalex.org/I1315109972","https://openalex.org/I40527276","https://openalex.org/I4387152969"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Oliver Rose","raw_affiliation_strings":["Department of Computer Science, Universit\u00e4t der Bundeswehr M\u00fcnchen, Neubiberg, GERMANY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Universit\u00e4t der Bundeswehr M\u00fcnchen, Neubiberg, GERMANY","institution_ids":["https://openalex.org/I40527276"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044213188","display_name":"Fabian Suhrke","orcid":null},"institutions":[{"id":"https://openalex.org/I177336056","display_name":"OSRAM (United States)","ror":"https://ror.org/045d0h266","country_code":"US","type":"company","lineage":["https://openalex.org/I177336056","https://openalex.org/I4210103613"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fabian Suhrke","raw_affiliation_strings":["Osram Opto Semiconductors GmbH, Regensburg, GERMANY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Osram Opto Semiconductors GmbH, Regensburg, GERMANY","institution_ids":["https://openalex.org/I177336056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068265876","display_name":"Jonas Mager","orcid":"https://orcid.org/0000-0002-0922-0777"},"institutions":[{"id":"https://openalex.org/I177336056","display_name":"OSRAM (United States)","ror":"https://ror.org/045d0h266","country_code":"US","type":"company","lineage":["https://openalex.org/I177336056","https://openalex.org/I4210103613"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jonas Mager","raw_affiliation_strings":["Osram Opto Semiconductors GmbH, Regensburg, GERMANY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Osram Opto Semiconductors GmbH, Regensburg, GERMANY","institution_ids":["https://openalex.org/I177336056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060569224","display_name":"Thomas Frey","orcid":null},"institutions":[{"id":"https://openalex.org/I177336056","display_name":"OSRAM (United States)","ror":"https://ror.org/045d0h266","country_code":"US","type":"company","lineage":["https://openalex.org/I177336056","https://openalex.org/I4210103613"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Thomas Frey","raw_affiliation_strings":["Osram Opto Semiconductors GmbH, Regensburg, GERMANY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Osram Opto Semiconductors GmbH, Regensburg, GERMANY","institution_ids":["https://openalex.org/I177336056"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3504,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.80380673,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"2947","last_page":"2957"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11814","display_name":"Advanced Manufacturing and Logistics Optimization","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12782","display_name":"Assembly Line Balancing Optimization","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.6726398468017578},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6295833587646484},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.6124237775802612},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5674479007720947},{"id":"https://openalex.org/keywords/time-horizon","display_name":"Time horizon","score":0.5652722716331482},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.5618835091590881},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.5615416765213013},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.5346433520317078},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5318408012390137},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.52559494972229},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.5119580030441284},{"id":"https://openalex.org/keywords/wafer-fabrication","display_name":"Wafer fabrication","score":0.5085180997848511},{"id":"https://openalex.org/keywords/production-control","display_name":"Production control","score":0.4590429663658142},{"id":"https://openalex.org/keywords/upper-and-lower-bounds","display_name":"Upper and lower bounds","score":0.43483203649520874},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.412229061126709},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3323000371456146},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.3234022259712219},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.29132139682769775},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20359262824058533},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.12395802140235901},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11548319458961487},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09730499982833862},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.09105810523033142}],"concepts":[{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.6726398468017578},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6295833587646484},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.6124237775802612},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5674479007720947},{"id":"https://openalex.org/C28761237","wikidata":"https://www.wikidata.org/wiki/Q7805321","display_name":"Time horizon","level":2,"score":0.5652722716331482},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5618835091590881},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.5615416765213013},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.5346433520317078},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5318408012390137},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.52559494972229},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.5119580030441284},{"id":"https://openalex.org/C35750839","wikidata":"https://www.wikidata.org/wiki/Q7959421","display_name":"Wafer fabrication","level":3,"score":0.5085180997848511},{"id":"https://openalex.org/C2780682718","wikidata":"https://www.wikidata.org/wiki/Q16321575","display_name":"Production control","level":3,"score":0.4590429663658142},{"id":"https://openalex.org/C77553402","wikidata":"https://www.wikidata.org/wiki/Q13222579","display_name":"Upper and lower bounds","level":2,"score":0.43483203649520874},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.412229061126709},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3323000371456146},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.3234022259712219},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.29132139682769775},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20359262824058533},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.12395802140235901},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11548319458961487},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09730499982833862},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.09105810523033142},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/wsc.2016.7822329","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wsc.2016.7822329","pdf_url":null,"source":{"id":"https://openalex.org/S4363607936","display_name":"2016 Winter Simulation Conference (WSC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Winter Simulation Conference (WSC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321613","display_name":"Technische Universit\u00e4t Dresden","ror":"https://ror.org/042aqky30"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1508394286","https://openalex.org/W2078533235","https://openalex.org/W2170726572","https://openalex.org/W4236300353","https://openalex.org/W4252284851","https://openalex.org/W4252318948"],"related_works":["https://openalex.org/W2146435486","https://openalex.org/W2170726572","https://openalex.org/W2006086900","https://openalex.org/W1546051781","https://openalex.org/W1594978932","https://openalex.org/W2125597601","https://openalex.org/W4235093757","https://openalex.org/W2018048930","https://openalex.org/W2128000717","https://openalex.org/W4365787180"],"abstract_inverted_index":{"Time":[0],"bound":[1],"sequences":[2],"are":[3,22],"constraints":[4,43,68],"deemed":[5],"necessary":[6],"to":[7,16,61,73,96,113,125],"ensure":[8],"product":[9],"quality":[10],"and":[11,69,99],"avoid":[12],"yield":[13],"loss":[14,94],"due":[15,95],"time":[17,42,97],"dependent":[18],"effects.":[19],"Although":[20],"they":[21,29],"commonly":[23],"applied":[24],"in":[25,44,123],"production":[26,67],"system":[27],"control":[28],"cause":[30],"severe":[31],"logistical":[32],"challenges.":[33],"In":[34],"this":[35],"paper,":[36],"we":[37,118],"evaluate":[38],"the":[39,63,84,88,92,100,111,126],"effects":[40,101],"of":[41,54,65,90,102],"combination":[45],"with":[46],"batching":[47,103],"on":[48,105],"a":[49,80],"real":[50],"metallization":[51],"work":[52,75],"center":[53,76],"an":[55],"opto-semiconductor":[56],"fab.":[57],"We":[58,78],"use":[59],"simulation":[60],"analyze":[62],"impact":[64],"these":[66,115],"point":[70],"out":[71],"potentials":[72],"increase":[74],"performance.":[77],"have":[79],"closer":[81],"look":[82],"at":[83],"required":[85],"planning":[86],"horizon,":[87],"influence":[89],"dedication,":[91],"capacity":[93],"bounds":[98],"strategies":[104],"wafer":[106],"cost.":[107],"Our":[108],"results":[109],"show":[110],"importance":[112],"tackle":[114],"issues.":[116],"Furthermore,":[117],"will":[119],"discuss":[120],"actions":[121],"taken":[122],"response":[124],"experiments.":[127]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}