{"id":"https://openalex.org/W3149058631","doi":"https://doi.org/10.1109/wsc.2007.4419798","title":"Sensitivity analysis on causal events of wip bubbles by a log-driven simulator","display_name":"Sensitivity analysis on causal events of wip bubbles by a log-driven simulator","publication_year":2007,"publication_date":"2007-12-01","ids":{"openalex":"https://openalex.org/W3149058631","doi":"https://doi.org/10.1109/wsc.2007.4419798","mag":"3149058631"},"language":"en","primary_location":{"id":"doi:10.1109/wsc.2007.4419798","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wsc.2007.4419798","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 Winter Simulation Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047310402","display_name":"Ryo Hirade","orcid":null},"institutions":[{"id":"https://openalex.org/I4210145865","display_name":"IBM Research - Tokyo","ror":"https://ror.org/04915qk43","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210145865"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryo Hirade","raw_affiliation_strings":["Tokyo Research Laboratory, IBM Research, Yamato, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokyo Research Laboratory, IBM Research, Yamato, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210145865"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028489255","display_name":"Rudy Raymond","orcid":"https://orcid.org/0000-0003-1005-6705"},"institutions":[{"id":"https://openalex.org/I4210145865","display_name":"IBM Research - Tokyo","ror":"https://ror.org/04915qk43","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210145865"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Rudy Raymond","raw_affiliation_strings":["Tokyo Research Laboratory, IBM Research, Yamato, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokyo Research Laboratory, IBM Research, Yamato, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210145865"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060261086","display_name":"Hiroyuki Okano","orcid":"https://orcid.org/0000-0001-8198-1354"},"institutions":[{"id":"https://openalex.org/I4210145865","display_name":"IBM Research - Tokyo","ror":"https://ror.org/04915qk43","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210145865"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Okano","raw_affiliation_strings":["Tokyo Research Laboratory, IBM Research, Yamato, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tokyo Research Laboratory, IBM Research, Yamato, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210145865"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210145865"],"apc_list":null,"apc_paid":null,"fwci":0.7807,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.77629554,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":null,"first_page":"1747","last_page":"1754"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11195","display_name":"Simulation Techniques and Applications","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10974","display_name":"Advanced Queuing Theory Analysis","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1404","display_name":"Management Information Systems"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/downtime","display_name":"Downtime","score":0.8637727499008179},{"id":"https://openalex.org/keywords/root-cause-analysis","display_name":"Root cause analysis","score":0.7126033902168274},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.6544488668441772},{"id":"https://openalex.org/keywords/discrete-event-simulation","display_name":"Discrete event simulation","score":0.6437099575996399},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5997933149337769},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5913861393928528},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5747299790382385},{"id":"https://openalex.org/keywords/wafer-fabrication","display_name":"Wafer fabrication","score":0.553774893283844},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.519187331199646},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5137901902198792},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.48705342411994934},{"id":"https://openalex.org/keywords/causality","display_name":"Causality (physics)","score":0.4767388105392456},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4743812680244446},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.44806092977523804},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4443601369857788},{"id":"https://openalex.org/keywords/aggregate","display_name":"Aggregate (composite)","score":0.41931724548339844},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3271283805370331},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3220675587654114},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.17242848873138428}],"concepts":[{"id":"https://openalex.org/C180591934","wikidata":"https://www.wikidata.org/wiki/Q1253369","display_name":"Downtime","level":2,"score":0.8637727499008179},{"id":"https://openalex.org/C130963320","wikidata":"https://www.wikidata.org/wiki/Q1401207","display_name":"Root cause analysis","level":2,"score":0.7126033902168274},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.6544488668441772},{"id":"https://openalex.org/C147203929","wikidata":"https://www.wikidata.org/wiki/Q574814","display_name":"Discrete event simulation","level":2,"score":0.6437099575996399},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5997933149337769},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5913861393928528},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5747299790382385},{"id":"https://openalex.org/C35750839","wikidata":"https://www.wikidata.org/wiki/Q7959421","display_name":"Wafer fabrication","level":3,"score":0.553774893283844},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.519187331199646},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5137901902198792},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.48705342411994934},{"id":"https://openalex.org/C64357122","wikidata":"https://www.wikidata.org/wiki/Q1149766","display_name":"Causality (physics)","level":2,"score":0.4767388105392456},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4743812680244446},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.44806092977523804},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4443601369857788},{"id":"https://openalex.org/C4679612","wikidata":"https://www.wikidata.org/wiki/Q866298","display_name":"Aggregate (composite)","level":2,"score":0.41931724548339844},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3271283805370331},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3220675587654114},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.17242848873138428},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/wsc.2007.4419798","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wsc.2007.4419798","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 Winter Simulation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","id":"https://metadata.un.org/sdg/8","score":0.6600000262260437}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W178554992","https://openalex.org/W1977539248","https://openalex.org/W2042168130","https://openalex.org/W2109341366","https://openalex.org/W2110656341","https://openalex.org/W2146435486","https://openalex.org/W3125369006","https://openalex.org/W3143570923"],"related_works":["https://openalex.org/W2030594396","https://openalex.org/W2754538212","https://openalex.org/W4200610016","https://openalex.org/W3045668461","https://openalex.org/W2490884653","https://openalex.org/W4255366506","https://openalex.org/W2559147525","https://openalex.org/W4382407621","https://openalex.org/W2799474201","https://openalex.org/W2885010905"],"abstract_inverted_index":{"Fluctuations":[0],"of":[1,7,24,38,55,67,100,104,118],"work-in-progress":[2],"(WIP)":[3],"levels":[4],"cause":[5,32,64],"variability":[6],"cycle":[8],"time":[9,90,102],"and":[10,116,134],"often":[11],"lead":[12],"to":[13,50,72,138],"productivity":[14],"losses":[15],"in":[16,82,92],"semiconductor":[17],"wafer":[18],"fabrication":[19],"plants.":[20],"To":[21],"identify":[22],"sources":[23],"such":[25,41],"variability,":[26],"we":[27],"are":[28,80],"developing":[29],"a":[30,114,119],"root":[31,63],"analysis":[33],"tool":[34],"with":[35],"history":[36],"logs":[37],"operational":[39,86],"events,":[40],"as":[42,48],"high":[43],"WIP":[44],"or":[45,131],"equipment":[46],"downtime,":[47],"inputs":[49],"automatically":[51],"find":[52],"the":[53,59,62,68,74,96,101],"chains":[54],"events":[56,76,87,97],"that":[57,79,88],"create":[58],"variability.":[60],"In":[61],"analysis,":[65],"one":[66],"key":[69],"steps":[70],"is":[71,136],"aggregate":[73],"observed":[75],"into":[77],"groups":[78],"likely":[81],"cause-effect":[83,93],"relationships.":[84],"For":[85],"involve":[89],"lags":[91],"relationships,":[94],"grouping":[95],"requires":[98],"identification":[99],"windows":[103],"causality":[105],"based":[106],"on":[107],"discrete":[108],"event":[109],"simulations.":[110],"This":[111],"paper":[112],"describes":[113],"design":[115],"implementation":[117],"simulator":[120,125],"for":[121],"this":[122],"purpose.":[123],"The":[124],"does":[126],"not":[127],"assume":[128],"any":[129],"statistical":[130],"mathematical":[132],"model,":[133],"thus":[135],"simple":[137],"maintain.":[139]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}