{"id":"https://openalex.org/W3140414954","doi":"https://doi.org/10.1109/wsc.2005.1574501","title":"Efficient Simulations for Capacity Analysis and Automated Material Handling System Design in Semiconductor Wafer Fabs","display_name":"Efficient Simulations for Capacity Analysis and Automated Material Handling System Design in Semiconductor Wafer Fabs","publication_year":2006,"publication_date":"2006-01-25","ids":{"openalex":"https://openalex.org/W3140414954","doi":"https://doi.org/10.1109/wsc.2005.1574501","mag":"3140414954"},"language":"en","primary_location":{"id":"doi:10.1109/wsc.2005.1574501","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wsc.2005.1574501","pdf_url":null,"source":{"id":"https://openalex.org/S4363608800","display_name":"Proceedings of the Winter Simulation Conference, 2005.","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Winter Simulation Conference, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014159473","display_name":"Jesus A. Jimenez","orcid":"https://orcid.org/0000-0001-6300-2714"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.A. Jimenez","raw_affiliation_strings":["Industrial Engineering Department, Arizona State University, Tempe, AZ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Engineering Department, Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111970541","display_name":"Gerald T. Mackulak","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Mackulak","raw_affiliation_strings":["Industrial Engineering Department, Arizona State University, Tempe, AZ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Engineering Department, Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019888542","display_name":"John Fowler","orcid":"https://orcid.org/0000-0002-7112-8031"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Fowler","raw_affiliation_strings":["Industrial Engineering Department, Arizona State University, Tempe, AZ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Engineering Department, Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.49210526,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"2157","last_page":"2161"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11814","display_name":"Advanced Manufacturing and Logistics Optimization","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11814","display_name":"Advanced Manufacturing and Logistics Optimization","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12782","display_name":"Assembly Line Balancing Optimization","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/material-handling","display_name":"Material handling","score":0.6906454563140869},{"id":"https://openalex.org/keywords/limiting","display_name":"Limiting","score":0.6691725254058838},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5297725200653076},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.515040397644043},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5146254301071167},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.48202621936798096},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46785834431648254},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.41497039794921875},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.4148680567741394},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.3897683620452881},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.38036373257637024},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.18346631526947021},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08196410536766052}],"concepts":[{"id":"https://openalex.org/C2983137510","wikidata":"https://www.wikidata.org/wiki/Q1413942","display_name":"Material handling","level":2,"score":0.6906454563140869},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.6691725254058838},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5297725200653076},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.515040397644043},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5146254301071167},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.48202621936798096},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46785834431648254},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.41497039794921875},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.4148680567741394},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.3897683620452881},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.38036373257637024},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.18346631526947021},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08196410536766052},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/wsc.2005.1574501","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wsc.2005.1574501","pdf_url":null,"source":{"id":"https://openalex.org/S4363608800","display_name":"Proceedings of the Winter Simulation Conference, 2005.","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Winter Simulation Conference, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2992897358","https://openalex.org/W2631724279","https://openalex.org/W2151650862","https://openalex.org/W2111778165","https://openalex.org/W4240972148","https://openalex.org/W2992444069","https://openalex.org/W2141394065","https://openalex.org/W3154519833","https://openalex.org/W1571475181","https://openalex.org/W4321014120"],"abstract_inverted_index":{"The":[0],"automated":[1],"material":[2],"handling":[3],"system":[4,91],"(AMHS)":[5],"must":[6],"be":[7,52],"designed":[8],"effectively":[9],"so":[10],"that":[11,64,79],"it":[12,65],"never":[13],"becomes":[14],"a":[15,26,33],"limiting":[16],"factor":[17],"for":[18,39],"the":[19,40,43,45,58,61,96,115,129,133,136],"capacity":[20,81],"of":[21,117,135,142],"300mm":[22],"wafer":[23],"fabs.":[24],"Ideally,":[25],"fully":[27,100],"integrated":[28,101],"fab":[29],"simulation":[30],"model":[31,34],"(i.e.":[32],"containing":[35],"detailed":[36,85,106],"modeling":[37],"constructs":[38],"production":[41],"operations,":[42],"tools,":[44],"AMHS,":[46],"and":[47,72,132],"tool":[48],"AMHS":[49,86,119],"interactions)":[50],"should":[51],"used":[53],"in":[54,93],"order":[55],"to":[56,70,95],"design":[57,120],"AMHS.":[59],"However,":[60],"problem":[62],"is":[63,144],"takes":[66],"too":[67],"much":[68],"time":[69],"simulate":[71],"analyze":[73],"these":[74,104],"models.":[75,102],"Experimentation":[76],"has":[77],"demonstrated":[78],"certain":[80],"models":[82,107],"with":[83],"less":[84,105],"representations":[87],"can":[88,111],"generate":[89],"accurate":[90],"predictions":[92,138],"comparison":[94],"values":[97],"produced":[98],"by":[99],"Because":[103],"run":[108],"faster,":[109],"we":[110],"thus":[112],"assess":[113],"efficiently":[114],"effects":[116],"an":[118],"configuration":[121],"on":[122],"equipment":[123],"capacity.":[124],"A":[125],"case":[126],"study":[127],"comparing":[128],"computational":[130],"efficiency":[131],"quality":[134],"performance":[137],"at":[139],"different":[140],"levels":[141],"detail":[143],"presented":[145]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}