{"id":"https://openalex.org/W2595187547","doi":"https://doi.org/10.1109/wisnet.2017.7878747","title":"Six-port reflectometer with tunable parameters ensuring measurement accuracy enhancement","display_name":"Six-port reflectometer with tunable parameters ensuring measurement accuracy enhancement","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2595187547","doi":"https://doi.org/10.1109/wisnet.2017.7878747","mag":"2595187547"},"language":"en","primary_location":{"id":"doi:10.1109/wisnet.2017.7878747","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wisnet.2017.7878747","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043548407","display_name":"Kamil Staszek","orcid":"https://orcid.org/0000-0002-3866-8466"},"institutions":[{"id":"https://openalex.org/I686019","display_name":"AGH University of Krakow","ror":"https://ror.org/00bas1c41","country_code":"PL","type":"education","lineage":["https://openalex.org/I686019"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Kamil Staszek","raw_affiliation_strings":["AGH University of Science and Technology, Cracow, Poland"],"affiliations":[{"raw_affiliation_string":"AGH University of Science and Technology, Cracow, Poland","institution_ids":["https://openalex.org/I686019"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055366975","display_name":"Jakub Sorocki","orcid":"https://orcid.org/0000-0002-6216-7581"},"institutions":[{"id":"https://openalex.org/I686019","display_name":"AGH University of Krakow","ror":"https://ror.org/00bas1c41","country_code":"PL","type":"education","lineage":["https://openalex.org/I686019"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Jakub Sorocki","raw_affiliation_strings":["AGH University of Science and Technology, Cracow, Poland"],"affiliations":[{"raw_affiliation_string":"AGH University of Science and Technology, Cracow, Poland","institution_ids":["https://openalex.org/I686019"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089968100","display_name":"Krzysztof Wincza","orcid":"https://orcid.org/0000-0002-4471-7842"},"institutions":[{"id":"https://openalex.org/I686019","display_name":"AGH University of Krakow","ror":"https://ror.org/00bas1c41","country_code":"PL","type":"education","lineage":["https://openalex.org/I686019"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Krzysztof Wincza","raw_affiliation_strings":["AGH University of Science and Technology, Cracow, Poland"],"affiliations":[{"raw_affiliation_string":"AGH University of Science and Technology, Cracow, Poland","institution_ids":["https://openalex.org/I686019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000129570","display_name":"S\u0142awomir Gruszczy\u0144ski","orcid":"https://orcid.org/0000-0002-0370-8640"},"institutions":[{"id":"https://openalex.org/I686019","display_name":"AGH University of Krakow","ror":"https://ror.org/00bas1c41","country_code":"PL","type":"education","lineage":["https://openalex.org/I686019"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Slawomir Gruszczynski","raw_affiliation_strings":["AGH University of Science and Technology, Cracow, Poland"],"affiliations":[{"raw_affiliation_string":"AGH University of Science and Technology, Cracow, Poland","institution_ids":["https://openalex.org/I686019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5043548407"],"corresponding_institution_ids":["https://openalex.org/I686019"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.01733997,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"2017","issue":null,"first_page":"26","last_page":"29"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.97079998254776,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reflection-coefficient","display_name":"Reflection coefficient","score":0.7811778783798218},{"id":"https://openalex.org/keywords/port","display_name":"Port (circuit theory)","score":0.7219794988632202},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.7105154991149902},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.6755934357643127},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.517551839351654},{"id":"https://openalex.org/keywords/optical-time-domain-reflectometer","display_name":"Optical time-domain reflectometer","score":0.4881182610988617},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.4755016267299652},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.45981723070144653},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4361231327056885},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41948699951171875},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.41146141290664673},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4091249108314514},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3649417757987976},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21862897276878357},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13751059770584106},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11625441908836365},{"id":"https://openalex.org/keywords/optical-fiber","display_name":"Optical fiber","score":0.09611836075782776},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08861958980560303},{"id":"https://openalex.org/keywords/fiber-optic-sensor","display_name":"Fiber optic sensor","score":0.07889312505722046}],"concepts":[{"id":"https://openalex.org/C41700454","wikidata":"https://www.wikidata.org/wiki/Q1852282","display_name":"Reflection coefficient","level":2,"score":0.7811778783798218},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.7219794988632202},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.7105154991149902},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.6755934357643127},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.517551839351654},{"id":"https://openalex.org/C187327482","wikidata":"https://www.wikidata.org/wiki/Q580729","display_name":"Optical time-domain reflectometer","level":5,"score":0.4881182610988617},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.4755016267299652},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.45981723070144653},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4361231327056885},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41948699951171875},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.41146141290664673},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4091249108314514},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3649417757987976},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21862897276878357},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13751059770584106},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11625441908836365},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.09611836075782776},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08861958980560303},{"id":"https://openalex.org/C21651689","wikidata":"https://www.wikidata.org/wiki/Q1397427","display_name":"Fiber optic sensor","level":3,"score":0.07889312505722046},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C113102252","wikidata":"https://www.wikidata.org/wiki/Q5591869","display_name":"Graded-index fiber","level":4,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/wisnet.2017.7878747","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wisnet.2017.7878747","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet)","raw_type":"proceedings-article"},{"id":"mag:2752987944","is_oa":false,"landing_page_url":"http://jglobal.jst.go.jp/en/public/20090422/201702255518441566","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8199999928474426,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320324664","display_name":"Akademia G\u00f3rniczo-Hutnicza im. Stanislawa Staszica","ror":"https://ror.org/00bas1c41"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1981135015","https://openalex.org/W2016011856","https://openalex.org/W2021328416","https://openalex.org/W2156850473","https://openalex.org/W2290231534","https://openalex.org/W3215064317"],"related_works":["https://openalex.org/W2326770010","https://openalex.org/W3049121420","https://openalex.org/W2508712609","https://openalex.org/W4255647936","https://openalex.org/W2374263760","https://openalex.org/W299526084","https://openalex.org/W3018675808","https://openalex.org/W1486069742","https://openalex.org/W2461589354","https://openalex.org/W4293868501"],"abstract_inverted_index":{"A":[0],"six-port":[1,24,52],"reflectometer":[2],"having":[3],"tunable":[4],"parameters,":[5],"which":[6],"can":[7],"be":[8],"adjusted":[9],"to":[10],"minimize":[11],"the":[12,39,47,50],"reflection":[13,35],"coefficient":[14],"measurement":[15,56],"uncertainty,":[16],"is":[17],"proposed":[18],"in":[19,38],"this":[20],"letter.":[21],"The":[22,32],"presented":[23],"has":[25],"been":[26],"theoretically":[27],"analyzed,":[28],"designed":[29],"and":[30],"fabricated.":[31],"measurements":[33],"of":[34,49],"coefficients":[36],"performed":[37],"frequency":[40],"range":[41],"2.2":[42],"-":[43],"2.6":[44],"GHz":[45],"with":[46],"use":[48],"developed":[51],"prove":[53],"its":[54],"enhanced":[55],"accuracy.":[57]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}